Fundamental frequency and mission profile wearout of IGBT in DFIG converters for windpower

In this paper the influence of fundamental frequency and mission profile power cycles on estimated lifetime of the power semiconductors in the rotor side converter of a DFIG will be investigated. The aim of this paper is to get a feeling which impact the large cycles due to the variation of wind spe...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Weiss, David, Eckel, Hans-Gunter
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Doubly fed induction generator IGBT Insulated gate bipolar transistors Junctions Mission profile Ocean temperature Rotors Semiconductor diodes Stress Thermal stress Wind energy Wind speed
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