Features of wafer - Mo joining by sintering of silver paste for large area silicon devices
Conjunction of silicon crystals with surface over 10 cm 2 with molybdenum discs by means of silver paste sintering is being discussed. It is shown that to ensure strength of joint and low thermomechanical stress selection of dependencies of pressure and temperature on time is very important. It is n...
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creator | Chernikov, A. A. Stavtsev, A. V. Surma, A. M. |
description | Conjunction of silicon crystals with surface over 10 cm 2 with molybdenum discs by means of silver paste sintering is being discussed. It is shown that to ensure strength of joint and low thermomechanical stress selection of dependencies of pressure and temperature on time is very important. It is necessary to ensure thermal stability of multilayer metal process on jointed surfaces. Experimental elements are characterized by reduced thermal resistance and high cycle stability. |
doi_str_mv | 10.1109/EPE.2013.6631822 |
format | Conference Proceeding |
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A. ; Stavtsev, A. V. ; Surma, A. M.</creator><creatorcontrib>Chernikov, A. A. ; Stavtsev, A. V. ; Surma, A. M.</creatorcontrib><description>Conjunction of silicon crystals with surface over 10 cm 2 with molybdenum discs by means of silver paste sintering is being discussed. It is shown that to ensure strength of joint and low thermomechanical stress selection of dependencies of pressure and temperature on time is very important. It is necessary to ensure thermal stability of multilayer metal process on jointed surfaces. Experimental elements are characterized by reduced thermal resistance and high cycle stability.</description><identifier>EISBN: 9781479901166</identifier><identifier>EISBN: 1479901164</identifier><identifier>DOI: 10.1109/EPE.2013.6631822</identifier><language>eng</language><publisher>IEEE</publisher><subject>Crystals ; Heating ; High power discrete device ; Joints ; Packaging ; Power cycling ; Reliability ; Silicon ; Silver ; Stress ; Surface treatment</subject><ispartof>2013 15th European Conference on Power Electronics and Applications (EPE), 2013, p.1-7</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6631822$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,27923,54918</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6631822$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chernikov, A. A.</creatorcontrib><creatorcontrib>Stavtsev, A. V.</creatorcontrib><creatorcontrib>Surma, A. M.</creatorcontrib><title>Features of wafer - Mo joining by sintering of silver paste for large area silicon devices</title><title>2013 15th European Conference on Power Electronics and Applications (EPE)</title><addtitle>EPE</addtitle><description>Conjunction of silicon crystals with surface over 10 cm 2 with molybdenum discs by means of silver paste sintering is being discussed. It is shown that to ensure strength of joint and low thermomechanical stress selection of dependencies of pressure and temperature on time is very important. It is necessary to ensure thermal stability of multilayer metal process on jointed surfaces. Experimental elements are characterized by reduced thermal resistance and high cycle stability.</description><subject>Crystals</subject><subject>Heating</subject><subject>High power discrete device</subject><subject>Joints</subject><subject>Packaging</subject><subject>Power cycling</subject><subject>Reliability</subject><subject>Silicon</subject><subject>Silver</subject><subject>Stress</subject><subject>Surface treatment</subject><isbn>9781479901166</isbn><isbn>1479901164</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2013</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkD1PwzAYhM2ABCrZkVj8BxL8_TGiKgWkVjB0Yqls53XlKiSVHYr670lFp9PdPbrhEHqkpKGU2Of2s20YobxRilPD2A2qrDZUaGsJpUrdoaqUAyGEak2lEPfoawVu-slQ8Bjxr4uQcY03Iz6MaUjDHvszLmmYIF_MjJTUn2bm6MoEOI4Z9y7vAbsM7tKlMA64g1MKUB7QbXR9geqqC7RdtdvlW73-eH1fvqzrZMlUO85FF0yw0WrllTFOGRm4tKpTikaQQRPNBKNSeWDMkBi95N4y54WaQ75AT_-zCQB2x5y-XT7vrgfwP1teT_U</recordid><startdate>201309</startdate><enddate>201309</enddate><creator>Chernikov, A. A.</creator><creator>Stavtsev, A. V.</creator><creator>Surma, A. M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201309</creationdate><title>Features of wafer - Mo joining by sintering of silver paste for large area silicon devices</title><author>Chernikov, A. A. ; Stavtsev, A. V. ; Surma, A. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-a334dc8c9f976b688a685c3596d661fe5c707242156be2280ffb53b92ab461563</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Crystals</topic><topic>Heating</topic><topic>High power discrete device</topic><topic>Joints</topic><topic>Packaging</topic><topic>Power cycling</topic><topic>Reliability</topic><topic>Silicon</topic><topic>Silver</topic><topic>Stress</topic><topic>Surface treatment</topic><toplevel>online_resources</toplevel><creatorcontrib>Chernikov, A. A.</creatorcontrib><creatorcontrib>Stavtsev, A. V.</creatorcontrib><creatorcontrib>Surma, A. M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chernikov, A. A.</au><au>Stavtsev, A. V.</au><au>Surma, A. M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Features of wafer - Mo joining by sintering of silver paste for large area silicon devices</atitle><btitle>2013 15th European Conference on Power Electronics and Applications (EPE)</btitle><stitle>EPE</stitle><date>2013-09</date><risdate>2013</risdate><spage>1</spage><epage>7</epage><pages>1-7</pages><eisbn>9781479901166</eisbn><eisbn>1479901164</eisbn><abstract>Conjunction of silicon crystals with surface over 10 cm 2 with molybdenum discs by means of silver paste sintering is being discussed. It is shown that to ensure strength of joint and low thermomechanical stress selection of dependencies of pressure and temperature on time is very important. It is necessary to ensure thermal stability of multilayer metal process on jointed surfaces. Experimental elements are characterized by reduced thermal resistance and high cycle stability.</abstract><pub>IEEE</pub><doi>10.1109/EPE.2013.6631822</doi><tpages>7</tpages></addata></record> |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Crystals Heating High power discrete device Joints Packaging Power cycling Reliability Silicon Silver Stress Surface treatment |
title | Features of wafer - Mo joining by sintering of silver paste for large area silicon devices |
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