Interlaboratory Study of Eddy-Current Measurement of Excess-Carrier Recombination Lifetime

Excess-carrier recombination lifetime is a key parameter in silicon solar cell design and production. With the vast international use and recent standardization (SEMI PV13) of eddy-current wafer and brick silicon lifetime test instruments, it is important to quantify the inter- and intralaboratory r...

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Veröffentlicht in:	IEEE journal of photovoltaics 2014-01, Vol.4 (1), p.525-531
Hauptverfasser:	Blum, Adrienne L., Swirhun, James S., Sinton, Ronald A., Fei Yan, Herasimenka, Stanislau, Roth, Thomas, Lauer, Kevin, Haunschild, Jonas, Lim, Bianca, Bothe, Karsten, Hameiri, Ziv, Seipel, Bjoern, Rentian Xiong, Dhamrin, Marwan, Murphy, John D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Atmospheric measurements Charge carrier lifetime eddy currents Electrical resistance measurement Instruments Laboratories Particle measurements photoconductivity silicon Transient analysis
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