Effective refractive index method for frustrated total reflection: application to measurement of flying height
In order to measure the spacing between an actual magnetic disk and a slider, we developed a flying height sensor based on frustrated total reflection (FTR). When optically measuring the flying height of a slider, the phase shift on reflection at the magnetic disk is a significant problem. In this p...
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| Veröffentlicht in: | IEEE transactions on magnetics 1998-03, Vol.34 (2), p.568-574 |
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| container_end_page | 574 |
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| container_issue | 2 |
| container_start_page | 568 |
| container_title | IEEE transactions on magnetics |
| container_volume | 34 |
| creator | Mori, S. Sugawara, H. Tokisue, H. Kohira, H. |
| description | In order to measure the spacing between an actual magnetic disk and a slider, we developed a flying height sensor based on frustrated total reflection (FTR). When optically measuring the flying height of a slider, the phase shift on reflection at the magnetic disk is a significant problem. In this paper, we describe the theoretical treatment of the problem, introduce the modified effective refractive index method, and measure the effective refractive index of an actual magnetic disk. The flying height on a magnetic disk was also measured using the obtained effective refractive index. The result was compared with flying height measurements measured by the traditional interference method. They agreed with each other, with an error of less than 2.5 nm. |
| doi_str_mv | 10.1109/20.661493 |
| format | Article |
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When optically measuring the flying height of a slider, the phase shift on reflection at the magnetic disk is a significant problem. In this paper, we describe the theoretical treatment of the problem, introduce the modified effective refractive index method, and measure the effective refractive index of an actual magnetic disk. The flying height on a magnetic disk was also measured using the obtained effective refractive index. The result was compared with flying height measurements measured by the traditional interference method. They agreed with each other, with an error of less than 2.5 nm.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/20.661493</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Interference ; Magnetic devices ; Magnetic sensors ; Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc ; Optical reflection ; Optical refraction ; Optical sensors ; Optical surface waves ; Optical variables control ; Reflectivity ; Refractive index ; Semiconductor electronics. Microelectronics. Optoelectronics. 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When optically measuring the flying height of a slider, the phase shift on reflection at the magnetic disk is a significant problem. In this paper, we describe the theoretical treatment of the problem, introduce the modified effective refractive index method, and measure the effective refractive index of an actual magnetic disk. The flying height on a magnetic disk was also measured using the obtained effective refractive index. The result was compared with flying height measurements measured by the traditional interference method. They agreed with each other, with an error of less than 2.5 nm.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Interference</subject><subject>Magnetic devices</subject><subject>Magnetic sensors</subject><subject>Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc</subject><subject>Optical reflection</subject><subject>Optical refraction</subject><subject>Optical sensors</subject><subject>Optical surface waves</subject><subject>Optical variables control</subject><subject>Reflectivity</subject><subject>Refractive index</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Thickness measurement</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1LAzEQxYMoWKsHr55yEMHD1kl2N7vxJqV-QMGLnpc0O7GR_TJJxf73ZtnS08wwv_fgPUKuGSwYA_nAYSEEy2R6QmZMZiwBEPKUzABYmchMZOfkwvvveGY5gxnpVsagDvYXqUPj1LTarsY_2mLY9jU1vaPG7XxwKmBNQx9UM8LNqOu7R6qGobFajUf8RpnyO4ctdoH2hppmb7svukX7tQ2X5MyoxuPVYc7J5_PqY_marN9f3pZP60SnIEISoyhtNlmuy5yLWoi03mQGeC1Tk0PBUQpeyloqk4JJOdMIMs03OTCDBQedzsnd5Du4_meHPlSt9RqbRnXY73zFS17wIucRvJ9A7XrvY6pqcLZVbl8xqMZGKw7V1Ghkbw-mymvVxLY6bf1RwFlRiqyI2M2EWUQ8fg8e_28nfvs</recordid><startdate>19980301</startdate><enddate>19980301</enddate><creator>Mori, S.</creator><creator>Sugawara, H.</creator><creator>Tokisue, H.</creator><creator>Kohira, H.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19980301</creationdate><title>Effective refractive index method for frustrated total reflection: application to measurement of flying height</title><author>Mori, S. ; Sugawara, H. ; Tokisue, H. ; Kohira, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c306t-110acfb45c8526d663db4f02d93f5072e96289d9af30f321ce0935b501fe720c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Interference</topic><topic>Magnetic devices</topic><topic>Magnetic sensors</topic><topic>Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc</topic><topic>Optical reflection</topic><topic>Optical refraction</topic><topic>Optical sensors</topic><topic>Optical surface waves</topic><topic>Optical variables control</topic><topic>Reflectivity</topic><topic>Refractive index</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Thickness measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Mori, S.</creatorcontrib><creatorcontrib>Sugawara, H.</creatorcontrib><creatorcontrib>Tokisue, H.</creatorcontrib><creatorcontrib>Kohira, H.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mori, S.</au><au>Sugawara, H.</au><au>Tokisue, H.</au><au>Kohira, H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effective refractive index method for frustrated total reflection: application to measurement of flying height</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1998-03-01</date><risdate>1998</risdate><volume>34</volume><issue>2</issue><spage>568</spage><epage>574</epage><pages>568-574</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>In order to measure the spacing between an actual magnetic disk and a slider, we developed a flying height sensor based on frustrated total reflection (FTR). When optically measuring the flying height of a slider, the phase shift on reflection at the magnetic disk is a significant problem. In this paper, we describe the theoretical treatment of the problem, introduce the modified effective refractive index method, and measure the effective refractive index of an actual magnetic disk. The flying height on a magnetic disk was also measured using the obtained effective refractive index. The result was compared with flying height measurements measured by the traditional interference method. They agreed with each other, with an error of less than 2.5 nm.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/20.661493</doi><tpages>7</tpages></addata></record> |
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| issn | 0018-9464 1941-0069 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Electronics Exact sciences and technology Interference Magnetic devices Magnetic sensors Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.) domain-motion devices, etc Optical reflection Optical refraction Optical sensors Optical surface waves Optical variables control Reflectivity Refractive index Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Thickness measurement |
| title | Effective refractive index method for frustrated total reflection: application to measurement of flying height |
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