State-aware single event analysis for sequential logic

Single Event Effects in sequential logic cells represent the current target for analysis and improvement efforts in both industry and academia. We propose a state-aware analysis methodology that improves the accuracy of Soft Error Rate data for individual sequential instances based on the circuit an...

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Bibliographische Detailangaben

Hauptverfasser:	Alexandrescu, Dan, Costenaro, Enrico, Evans, Adrian
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Clocks Engineering Sciences Inverters Latches Libraries Micro and nanotechnologies Microelectronics Single event upsets Testing Transistors
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