Hierarchical RTL-based combinatorial SER estimation

With increased device integration and a gradual trend toward higher operating frequencies, the effect of radiation induced transients in combinatorial logic (SETs) can no longer be ignored. Electrical, logical and temporal masking prevent the majority of SETs from becoming functional failures. Curre...

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Bibliographische Detailangaben

Hauptverfasser:	Evans, Adrian, Alexandrescu, Dan, Costenaro, Enrico, Liang Chen
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Adders Circuit faults Engineering Sciences Integrated circuit modeling Libraries Logic gates Micro and nanotechnologies Microelectronics Sensitivity Vectors
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