A bulk built-in sensor for detection of fault attacks

This work presents a novel scheme of built-in current sensor (BICS) for detecting transient fault-based attacks of short and long duration as well as from different simultaneous sources. The new sensor is a single mechanism connected to PMOS and NMOS bulks of the monitored logic. The proposed protec...

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Bibliographische Detailangaben
Hauptverfasser:	Possamai Bastos, R., Sill Torres, F., Dutertre, J-M, Flottes, M-L, Di Natale, G., Rouzeyre, B.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Built-in current sensors Circuit faults CMOS integrated circuits concurrent detection Engineering Sciences fault attacks fault tolerance Micro and nanotechnologies Microelectronics Monitoring MOS devices Security soft errors Transient analysis transient faults Transistors
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