A 32-Gbps 4×4 passive cross-point switch in 45-nm SOI CMOS

This paper presents a passive 4x4 cross-point switch in 45-nm SOI CMOS technology for LVDS systems with near-zero power consumption. The CMOS switch dimensions and layout structures are optimized using fullwave electromagnetic simulations for the highest 3-dB bandwidth in order to maximize the data-...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Donghyup Shin, Rebeiz, Gabriel M.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This paper presents a passive 4x4 cross-point switch in 45-nm SOI CMOS technology for LVDS systems with near-zero power consumption. The CMOS switch dimensions and layout structures are optimized using fullwave electromagnetic simulations for the highest 3-dB bandwidth in order to maximize the data-rate for digital signal transmission. Also, a novel series switch is used between the cells to enhance the bandwidth. The 4×4 switch matrix results in a measured 3-dB bandwidth of ~ 20 - 25 GHz (depending on the path) and an isolation > 40 dB at 26.5 GHz. The group delay variation is
ISSN:1529-2517
2375-0995
DOI:10.1109/RFIC.2013.6569575