Sensitivity analysis of X-ray detectors based on BFE and MEH-PPV organic sensor

In this work we fabricated flexible cells of organic devices in which layers of poly [9,9'-dioctyl-fluorene-2,7-diyl]-copoly[diphenyl-p-tolyl-amine-4,4'-diyl] (BFE) and poly[lmethoxy-4-(2-ethylhexyloxy)-phenylenevinylene] (MEH-PPV) were deposited on Indium Tin Oxide (ITO) coated Polyethyle...

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Bibliographische Detailangaben

Hauptverfasser:	Raouf, Mina, Hassani, Amir, Borumand, Farhad A., Advand, Marzyeh
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Artificial intelligence Atomic layer deposition Atomic measurements BFE Current measurement Indium tin oxide MEH-PPV Organic Sensors Performance evaluation Sensitivity Sensors X-Ray Detectors
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