An IDDQ BIST approach to characterize phase-locked loop parameters

In this work, a new IDDQ built-in self-test (BIST) solution is proposed to provide accurate on-chip current measurements for phase-locked loops (PLLs) found in deep-submicron system-on-chip (SoC) products. The proposed method characterizes PLL loop parameters to increase test quality with minimum ad...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Maltabas, S., Ekekon, O. K., Kulovic, K., Meixner, A., Margala, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	AMS BIST Built-in self-test Clocks Current measurement IDDQ testing Jitter Phase locked loops PLL testability Resistors System-on-chip
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