FTIR, EPMA, Auger, and XPS analysis of impurity precipitates in CdS films
Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum d...
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| creator | Webb, J.D. Rose, D.H. Niles, D.W. Swartzlander, A. Al-Jassim, M.M. |
| description | Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdS films. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 10/sup 2/ micron-scale precipitates. |
| doi_str_mv | 10.1109/PVSC.1997.654112 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>proquest_6IE</sourceid><recordid>TN_cdi_ieee_primary_654112</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>654112</ieee_id><sourcerecordid>26586147</sourcerecordid><originalsourceid>FETCH-LOGICAL-g313t-cb224f228600c233d1004115fcf520e2e6ef70f6d6d61cc0c42cf6bffb996cce3</originalsourceid><addsrcrecordid>eNotkM9LwzAcxQMqOOfu4ilePK3zm6RN2uMomw4mDjfFW-nSb2akv2zSw_57C5X34F0-PB6PkDsGC8Ygedp97tMFSxK1kFHIGL8gs0TFMFgIJRW7JBNgEoJYKHZNbpz7AeAgJJuQzfqweZ_T1e51OafL_oTdnOZ1Qb92-yHz8uyso42htmr7zvozbTvUtrU-9-iorWla7KmxZeVuyZXJS4ez_5ySj_XqkL4E27fnTbrcBifBhA_0kfPQcB5LAM2FKBjAsDky2kQckKNEo8DIYhDTGnTItZFHY45JIrVGMSUPY2_jvM2cth71t27qGrXPBPCIRQPzODJt1_z26HxWWaexLPMam95lXEaxZKEawPsRtIiYtZ2t8u6cjS-KP0KtY2k</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>26586147</pqid></control><display><type>conference_proceeding</type><title>FTIR, EPMA, Auger, and XPS analysis of impurity precipitates in CdS films</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Webb, J.D. ; Rose, D.H. ; Niles, D.W. ; Swartzlander, A. ; Al-Jassim, M.M.</creator><creatorcontrib>Webb, J.D. ; Rose, D.H. ; Niles, D.W. ; Swartzlander, A. ; Al-Jassim, M.M.</creatorcontrib><description>Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdS films. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 10/sup 2/ micron-scale precipitates.</description><identifier>ISSN: 0160-8371</identifier><identifier>ISBN: 9780780337671</identifier><identifier>ISBN: 0780337670</identifier><identifier>DOI: 10.1109/PVSC.1997.654112</identifier><language>eng</language><publisher>United States: IEEE</publisher><subject>Cadmium compounds ; CADMIUM SULFIDES ; CADMIUM TELLURIDE SOLAR CELLS ; CHEMICAL COATING ; Chemicals ; Copper ; COPPER SELENIDE SOLAR CELLS ; Fabrication ; Gallium compounds ; GALLIUM SELENIDES ; IMPURITIES ; Indium ; INDIUM SELENIDE SOLAR CELLS ; Mass spectroscopy ; MATERIALS SCIENCE ; MICROSTRUCTURE ; Photovoltaic systems ; PHYSICAL VAPOR DEPOSITION ; SOLAR ABSORBERS ; SOLAR ENERGY ; Solar power generation</subject><ispartof>Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997, 1997, p.399-402</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/654112$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,778,782,787,788,883,2054,27908,54903</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/654112$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttps://www.osti.gov/biblio/302515$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Webb, J.D.</creatorcontrib><creatorcontrib>Rose, D.H.</creatorcontrib><creatorcontrib>Niles, D.W.</creatorcontrib><creatorcontrib>Swartzlander, A.</creatorcontrib><creatorcontrib>Al-Jassim, M.M.</creatorcontrib><title>FTIR, EPMA, Auger, and XPS analysis of impurity precipitates in CdS films</title><title>Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997</title><addtitle>PVSC</addtitle><description>Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdS films. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 10/sup 2/ micron-scale precipitates.</description><subject>Cadmium compounds</subject><subject>CADMIUM SULFIDES</subject><subject>CADMIUM TELLURIDE SOLAR CELLS</subject><subject>CHEMICAL COATING</subject><subject>Chemicals</subject><subject>Copper</subject><subject>COPPER SELENIDE SOLAR CELLS</subject><subject>Fabrication</subject><subject>Gallium compounds</subject><subject>GALLIUM SELENIDES</subject><subject>IMPURITIES</subject><subject>Indium</subject><subject>INDIUM SELENIDE SOLAR CELLS</subject><subject>Mass spectroscopy</subject><subject>MATERIALS SCIENCE</subject><subject>MICROSTRUCTURE</subject><subject>Photovoltaic systems</subject><subject>PHYSICAL VAPOR DEPOSITION</subject><subject>SOLAR ABSORBERS</subject><subject>SOLAR ENERGY</subject><subject>Solar power generation</subject><issn>0160-8371</issn><isbn>9780780337671</isbn><isbn>0780337670</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1997</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkM9LwzAcxQMqOOfu4ilePK3zm6RN2uMomw4mDjfFW-nSb2akv2zSw_57C5X34F0-PB6PkDsGC8Ygedp97tMFSxK1kFHIGL8gs0TFMFgIJRW7JBNgEoJYKHZNbpz7AeAgJJuQzfqweZ_T1e51OafL_oTdnOZ1Qb92-yHz8uyso42htmr7zvozbTvUtrU-9-iorWla7KmxZeVuyZXJS4ez_5ySj_XqkL4E27fnTbrcBifBhA_0kfPQcB5LAM2FKBjAsDky2kQckKNEo8DIYhDTGnTItZFHY45JIrVGMSUPY2_jvM2cth71t27qGrXPBPCIRQPzODJt1_z26HxWWaexLPMam95lXEaxZKEawPsRtIiYtZ2t8u6cjS-KP0KtY2k</recordid><startdate>19970101</startdate><enddate>19970101</enddate><creator>Webb, J.D.</creator><creator>Rose, D.H.</creator><creator>Niles, D.W.</creator><creator>Swartzlander, A.</creator><creator>Al-Jassim, M.M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ (United States)</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>19970101</creationdate><title>FTIR, EPMA, Auger, and XPS analysis of impurity precipitates in CdS films</title><author>Webb, J.D. ; Rose, D.H. ; Niles, D.W. ; Swartzlander, A. ; Al-Jassim, M.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-g313t-cb224f228600c233d1004115fcf520e2e6ef70f6d6d61cc0c42cf6bffb996cce3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Cadmium compounds</topic><topic>CADMIUM SULFIDES</topic><topic>CADMIUM TELLURIDE SOLAR CELLS</topic><topic>CHEMICAL COATING</topic><topic>Chemicals</topic><topic>Copper</topic><topic>COPPER SELENIDE SOLAR CELLS</topic><topic>Fabrication</topic><topic>Gallium compounds</topic><topic>GALLIUM SELENIDES</topic><topic>IMPURITIES</topic><topic>Indium</topic><topic>INDIUM SELENIDE SOLAR CELLS</topic><topic>Mass spectroscopy</topic><topic>MATERIALS SCIENCE</topic><topic>MICROSTRUCTURE</topic><topic>Photovoltaic systems</topic><topic>PHYSICAL VAPOR DEPOSITION</topic><topic>SOLAR ABSORBERS</topic><topic>SOLAR ENERGY</topic><topic>Solar power generation</topic><toplevel>online_resources</toplevel><creatorcontrib>Webb, J.D.</creatorcontrib><creatorcontrib>Rose, D.H.</creatorcontrib><creatorcontrib>Niles, D.W.</creatorcontrib><creatorcontrib>Swartzlander, A.</creatorcontrib><creatorcontrib>Al-Jassim, M.M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Webb, J.D.</au><au>Rose, D.H.</au><au>Niles, D.W.</au><au>Swartzlander, A.</au><au>Al-Jassim, M.M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>FTIR, EPMA, Auger, and XPS analysis of impurity precipitates in CdS films</atitle><btitle>Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997</btitle><stitle>PVSC</stitle><date>1997-01-01</date><risdate>1997</risdate><spage>399</spage><epage>402</epage><pages>399-402</pages><issn>0160-8371</issn><isbn>9780780337671</isbn><isbn>0780337670</isbn><abstract>Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdS films. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 10/sup 2/ micron-scale precipitates.</abstract><cop>United States</cop><pub>IEEE</pub><doi>10.1109/PVSC.1997.654112</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0160-8371 |
| ispartof | Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997, 1997, p.399-402 |
| issn | 0160-8371 |
| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Cadmium compounds CADMIUM SULFIDES CADMIUM TELLURIDE SOLAR CELLS CHEMICAL COATING Chemicals Copper COPPER SELENIDE SOLAR CELLS Fabrication Gallium compounds GALLIUM SELENIDES IMPURITIES Indium INDIUM SELENIDE SOLAR CELLS Mass spectroscopy MATERIALS SCIENCE MICROSTRUCTURE Photovoltaic systems PHYSICAL VAPOR DEPOSITION SOLAR ABSORBERS SOLAR ENERGY Solar power generation |
| title | FTIR, EPMA, Auger, and XPS analysis of impurity precipitates in CdS films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T18%3A07%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=FTIR,%20EPMA,%20Auger,%20and%20XPS%20analysis%20of%20impurity%20precipitates%20in%20CdS%20films&rft.btitle=Conference%20Record%20of%20the%20Twenty%20Sixth%20IEEE%20Photovoltaic%20Specialists%20Conference%20-%201997&rft.au=Webb,%20J.D.&rft.date=1997-01-01&rft.spage=399&rft.epage=402&rft.pages=399-402&rft.issn=0160-8371&rft.isbn=9780780337671&rft.isbn_list=0780337670&rft_id=info:doi/10.1109/PVSC.1997.654112&rft_dat=%3Cproquest_6IE%3E26586147%3C/proquest_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=26586147&rft_id=info:pmid/&rft_ieee_id=654112&rfr_iscdi=true |