Error-prediction analyses in 1X, 2X and 3Xnm NAND flash memories for system-level reliability improvement of solid-state drives (SSDs)

The system-level reliability of solid-state drives (SSDs) is investigated with 1X, 2X and 3Xnm NAND flash memories. The reliability degradation of NAND with scaling is an serious issue. Advanced ECC with signal processing such as error-prediction low-density parity-check (EP-LDPC) and error recovery...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Tanakamaru, S., Doi, M., Takeuchi, K.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Bit error rate Computer architecture ECC Erbium Error correction codes error-correcting code Flash memories LDPC low-density parity-check NAND flash memory Parity check codes Reliability
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!