Characterization of whole plant leaf area properties using laser scanner point clouds

Whole plant leaf area properties were extracted from contrasting laser scanner point clouds of herbaceous plants and compared to information obtained by 3D magnetic digitization. Total leaf area and its spatial distribution were strongly related to the total number of scanned points and its spatial...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Gaetan, L., Serge, C., Annie, E., Didier, C., Frederic, B.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 253
container_issue
container_start_page 250
container_title
container_volume
creator Gaetan, L.
Serge, C.
Annie, E.
Didier, C.
Frederic, B.
description Whole plant leaf area properties were extracted from contrasting laser scanner point clouds of herbaceous plants and compared to information obtained by 3D magnetic digitization. Total leaf area and its spatial distribution were strongly related to the total number of scanned points and its spatial distribution. The calculations of normal directions allowed, to some extent, to infer the distribution of plant surfaces elevation angles. Together with the definition of an accurate plant boundary envelope, these data allowed the calculation of light interception as accurately as magnetic digitization by using simpler turbid medium plant representations.
doi_str_mv 10.1109/PMA.2012.6524842
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6524842</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6524842</ieee_id><sourcerecordid>6524842</sourcerecordid><originalsourceid>FETCH-LOGICAL-i217t-b5349292ef7fd865f33220ba27a6218cb0c181a50f2334c5aef502168ccb4e353</originalsourceid><addsrcrecordid>eNo9kE1LAzEURSMiqLV7wU3-wNSXl0kysyzFL6jowq7Lm_TFRsaZIZki-usdsLg6XLjnLq4Q1woWSkF9-_q8XCAoXFiDZVXiibhUpXUawIE5_Q_WmXMxz_kDACbPVk5diM1qT4n8yCn-0Bj7TvZBfu37luXQUjfKlilISkxySP3AaYyc5SHH7l22lDnJ7KnrJg59nOq-7Q-7fCXOArWZ50fOxOb-7m31WKxfHp5Wy3URUbmxaIwua6yRgwu7ypqgNSI0hI4sqso34FWlyEBArUtviIMBVLbyvilZGz0TN3-7kZm3Q4qflL63xxv0L2cwUTg</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Characterization of whole plant leaf area properties using laser scanner point clouds</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Gaetan, L. ; Serge, C. ; Annie, E. ; Didier, C. ; Frederic, B.</creator><creatorcontrib>Gaetan, L. ; Serge, C. ; Annie, E. ; Didier, C. ; Frederic, B.</creatorcontrib><description>Whole plant leaf area properties were extracted from contrasting laser scanner point clouds of herbaceous plants and compared to information obtained by 3D magnetic digitization. Total leaf area and its spatial distribution were strongly related to the total number of scanned points and its spatial distribution. The calculations of normal directions allowed, to some extent, to infer the distribution of plant surfaces elevation angles. Together with the definition of an accurate plant boundary envelope, these data allowed the calculation of light interception as accurately as magnetic digitization by using simpler turbid medium plant representations.</description><identifier>ISBN: 1467300675</identifier><identifier>ISBN: 9781467300674</identifier><identifier>EISBN: 1467300705</identifier><identifier>EISBN: 1467300691</identifier><identifier>EISBN: 9781467300698</identifier><identifier>EISBN: 9781467300704</identifier><identifier>DOI: 10.1109/PMA.2012.6524842</identifier><language>eng</language><publisher>IEEE</publisher><subject>3D envelope-based reconstructions ; LAD ; laser scanner ; leaf angles ; leaf area ; Phenotyping</subject><ispartof>2012 IEEE 4th International Symposium on Plant Growth Modeling, Simulation, Visualization and Applications, 2012, p.250-253</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6524842$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6524842$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gaetan, L.</creatorcontrib><creatorcontrib>Serge, C.</creatorcontrib><creatorcontrib>Annie, E.</creatorcontrib><creatorcontrib>Didier, C.</creatorcontrib><creatorcontrib>Frederic, B.</creatorcontrib><title>Characterization of whole plant leaf area properties using laser scanner point clouds</title><title>2012 IEEE 4th International Symposium on Plant Growth Modeling, Simulation, Visualization and Applications</title><addtitle>PMA</addtitle><description>Whole plant leaf area properties were extracted from contrasting laser scanner point clouds of herbaceous plants and compared to information obtained by 3D magnetic digitization. Total leaf area and its spatial distribution were strongly related to the total number of scanned points and its spatial distribution. The calculations of normal directions allowed, to some extent, to infer the distribution of plant surfaces elevation angles. Together with the definition of an accurate plant boundary envelope, these data allowed the calculation of light interception as accurately as magnetic digitization by using simpler turbid medium plant representations.</description><subject>3D envelope-based reconstructions</subject><subject>LAD</subject><subject>laser scanner</subject><subject>leaf angles</subject><subject>leaf area</subject><subject>Phenotyping</subject><isbn>1467300675</isbn><isbn>9781467300674</isbn><isbn>1467300705</isbn><isbn>1467300691</isbn><isbn>9781467300698</isbn><isbn>9781467300704</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9kE1LAzEURSMiqLV7wU3-wNSXl0kysyzFL6jowq7Lm_TFRsaZIZki-usdsLg6XLjnLq4Q1woWSkF9-_q8XCAoXFiDZVXiibhUpXUawIE5_Q_WmXMxz_kDACbPVk5diM1qT4n8yCn-0Bj7TvZBfu37luXQUjfKlilISkxySP3AaYyc5SHH7l22lDnJ7KnrJg59nOq-7Q-7fCXOArWZ50fOxOb-7m31WKxfHp5Wy3URUbmxaIwua6yRgwu7ypqgNSI0hI4sqso34FWlyEBArUtviIMBVLbyvilZGz0TN3-7kZm3Q4qflL63xxv0L2cwUTg</recordid><startdate>201210</startdate><enddate>201210</enddate><creator>Gaetan, L.</creator><creator>Serge, C.</creator><creator>Annie, E.</creator><creator>Didier, C.</creator><creator>Frederic, B.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201210</creationdate><title>Characterization of whole plant leaf area properties using laser scanner point clouds</title><author>Gaetan, L. ; Serge, C. ; Annie, E. ; Didier, C. ; Frederic, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i217t-b5349292ef7fd865f33220ba27a6218cb0c181a50f2334c5aef502168ccb4e353</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>3D envelope-based reconstructions</topic><topic>LAD</topic><topic>laser scanner</topic><topic>leaf angles</topic><topic>leaf area</topic><topic>Phenotyping</topic><toplevel>online_resources</toplevel><creatorcontrib>Gaetan, L.</creatorcontrib><creatorcontrib>Serge, C.</creatorcontrib><creatorcontrib>Annie, E.</creatorcontrib><creatorcontrib>Didier, C.</creatorcontrib><creatorcontrib>Frederic, B.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library Online</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gaetan, L.</au><au>Serge, C.</au><au>Annie, E.</au><au>Didier, C.</au><au>Frederic, B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Characterization of whole plant leaf area properties using laser scanner point clouds</atitle><btitle>2012 IEEE 4th International Symposium on Plant Growth Modeling, Simulation, Visualization and Applications</btitle><stitle>PMA</stitle><date>2012-10</date><risdate>2012</risdate><spage>250</spage><epage>253</epage><pages>250-253</pages><isbn>1467300675</isbn><isbn>9781467300674</isbn><eisbn>1467300705</eisbn><eisbn>1467300691</eisbn><eisbn>9781467300698</eisbn><eisbn>9781467300704</eisbn><abstract>Whole plant leaf area properties were extracted from contrasting laser scanner point clouds of herbaceous plants and compared to information obtained by 3D magnetic digitization. Total leaf area and its spatial distribution were strongly related to the total number of scanned points and its spatial distribution. The calculations of normal directions allowed, to some extent, to infer the distribution of plant surfaces elevation angles. Together with the definition of an accurate plant boundary envelope, these data allowed the calculation of light interception as accurately as magnetic digitization by using simpler turbid medium plant representations.</abstract><pub>IEEE</pub><doi>10.1109/PMA.2012.6524842</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 1467300675
ispartof 2012 IEEE 4th International Symposium on Plant Growth Modeling, Simulation, Visualization and Applications, 2012, p.250-253
issn
language eng
recordid cdi_ieee_primary_6524842
source IEEE Electronic Library (IEL) Conference Proceedings
subjects 3D envelope-based reconstructions
LAD
laser scanner
leaf angles
leaf area
Phenotyping
title Characterization of whole plant leaf area properties using laser scanner point clouds
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T05%3A12%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Characterization%20of%20whole%20plant%20leaf%20area%20properties%20using%20laser%20scanner%20point%20clouds&rft.btitle=2012%20IEEE%204th%20International%20Symposium%20on%20Plant%20Growth%20Modeling,%20Simulation,%20Visualization%20and%20Applications&rft.au=Gaetan,%20L.&rft.date=2012-10&rft.spage=250&rft.epage=253&rft.pages=250-253&rft.isbn=1467300675&rft.isbn_list=9781467300674&rft_id=info:doi/10.1109/PMA.2012.6524842&rft_dat=%3Cieee_6IE%3E6524842%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1467300705&rft.eisbn_list=1467300691&rft.eisbn_list=9781467300698&rft.eisbn_list=9781467300704&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6524842&rfr_iscdi=true