Reliability analysis in model-driven development of embedded systems

Numerous techniques for modeling reliability aspects are applicable in research and industry. However, reliability models are often specialized artifacts; they are created once by specialists and then tend to remain unmaintained, yielding outdated and inaccurate models after short periods of time. T...

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Bibliographische Detailangaben
Hauptverfasser: Velasco, D. S., Kuhn, T., Kemmann, S.
Format: Tagungsbericht
Sprache:eng
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