Comparison of Analytical Estimation and 3-D Measurement of All Strands Location in CIC Conductor
It has been observed that the measured critical currents of cable-in-conduit-conductors (CICC) in some experiments are smaller than the expected ones. One of the reasons is the occurrence of unbalanced current at steady state caused by uneven contact resistances between strands. Because the contact...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2013-06, Vol.23 (3), p.8400904-8400904 |
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| creator | Miyagi, D. Nakazawa, S. Arai, D. Morimura, T. Tsuda, M. Hamajima, T. Yagai, T. Koizumi, N. Nunoya, Y. Takahata, K. Obana, T. |
| description | It has been observed that the measured critical currents of cable-in-conduit-conductors (CICC) in some experiments are smaller than the expected ones. One of the reasons is the occurrence of unbalanced current at steady state caused by uneven contact resistances between strands. Because the contact resistance between strands is dependent on the contact length, the number of contacts and the loop length between strands, we need information about all strands' locations in the CICC. Therefore, we developed an evaluation method that describes the locations of every strand in the CICC in consideration of the twist disorder based on manufacture processes and elastic potential energy. Moreover, we compared the contact number and length between strands obtained by our calculated strands' positions with measured ones. We found that both results are in good agreement and clarified the validity of our calculation method of all strands' positions in the CICC. |
| doi_str_mv | 10.1109/TASC.2013.2246754 |
| format | Article |
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One of the reasons is the occurrence of unbalanced current at steady state caused by uneven contact resistances between strands. Because the contact resistance between strands is dependent on the contact length, the number of contacts and the loop length between strands, we need information about all strands' locations in the CICC. Therefore, we developed an evaluation method that describes the locations of every strand in the CICC in consideration of the twist disorder based on manufacture processes and elastic potential energy. Moreover, we compared the contact number and length between strands obtained by our calculated strands' positions with measured ones. We found that both results are in good agreement and clarified the validity of our calculation method of all strands' positions in the CICC.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2013.2246754</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Cable-in-conduit conductor (CICC) ; Conductors ; contact length ; elastic energy ; Electric connection. Cables. Wiring ; Electrical engineering. Electrical power engineering ; Electronics ; Exact sciences and technology ; Frequency measurement ; Imaging devices ; Manufacturing processes ; Position measurement ; Potential energy ; Power cables ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; strands' positions ; twist deformation ; Various equipment and components ; Wires</subject><ispartof>IEEE transactions on applied superconductivity, 2013-06, Vol.23 (3), p.8400904-8400904</ispartof><rights>2014 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2013</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c389t-fa60f8a9b0b309052acc7bc0c469c6aa289fdd8a39ff6230be117d65d9a0d6953</citedby><cites>FETCH-LOGICAL-c389t-fa60f8a9b0b309052acc7bc0c469c6aa289fdd8a39ff6230be117d65d9a0d6953</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6461070$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,796,23930,23931,25140,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6461070$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=27529840$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Miyagi, D.</creatorcontrib><creatorcontrib>Nakazawa, S.</creatorcontrib><creatorcontrib>Arai, D.</creatorcontrib><creatorcontrib>Morimura, T.</creatorcontrib><creatorcontrib>Tsuda, M.</creatorcontrib><creatorcontrib>Hamajima, T.</creatorcontrib><creatorcontrib>Yagai, T.</creatorcontrib><creatorcontrib>Koizumi, N.</creatorcontrib><creatorcontrib>Nunoya, Y.</creatorcontrib><creatorcontrib>Takahata, K.</creatorcontrib><creatorcontrib>Obana, T.</creatorcontrib><title>Comparison of Analytical Estimation and 3-D Measurement of All Strands Location in CIC Conductor</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>It has been observed that the measured critical currents of cable-in-conduit-conductors (CICC) in some experiments are smaller than the expected ones. One of the reasons is the occurrence of unbalanced current at steady state caused by uneven contact resistances between strands. Because the contact resistance between strands is dependent on the contact length, the number of contacts and the loop length between strands, we need information about all strands' locations in the CICC. Therefore, we developed an evaluation method that describes the locations of every strand in the CICC in consideration of the twist disorder based on manufacture processes and elastic potential energy. Moreover, we compared the contact number and length between strands obtained by our calculated strands' positions with measured ones. We found that both results are in good agreement and clarified the validity of our calculation method of all strands' positions in the CICC.</description><subject>Applied sciences</subject><subject>Cable-in-conduit conductor (CICC)</subject><subject>Conductors</subject><subject>contact length</subject><subject>elastic energy</subject><subject>Electric connection. Cables. Wiring</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Frequency measurement</subject><subject>Imaging devices</subject><subject>Manufacturing processes</subject><subject>Position measurement</subject><subject>Potential energy</subject><subject>Power cables</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>strands' positions</subject><subject>twist deformation</subject><subject>Various equipment and components</subject><subject>Wires</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE1Lw0AQhoMoWKs_QLwsiMfU2c_sHkusWqh4aD3HzWYXUtJs3U0O_nu3tvQ0A-8zA--TZfcYZhiDet7M1-WMAKYzQpgoOLvIJphzmROO-WXageNcEkKvs5sYtwCYScYn2Xfpd3sd2uh75B2a97r7HVqjO7SIQ7vTQ5sC3TeI5i_ow-o4Bruz_fAPdx1aDyGlEa28ObJtj8pliUrfN6MZfLjNrpzuor07zWn29brYlO_56vNtWc5XuaFSDbnTApzUqoaaggJOtDFFbcAwoYzQmkjlmkZqqpwThEJtMS4awRuloRGK02n2ePy7D_5ntHGotn4MqU6sMCWMFVJgnCh8pEzwMQbrqn1ILcNvhaE6iKwOIquDyOokMt08nT7rmMS4VNi08XxICk6UZJC4hyPXWmvPsWACQwH0D4dEezQ</recordid><startdate>20130601</startdate><enddate>20130601</enddate><creator>Miyagi, D.</creator><creator>Nakazawa, S.</creator><creator>Arai, D.</creator><creator>Morimura, T.</creator><creator>Tsuda, M.</creator><creator>Hamajima, T.</creator><creator>Yagai, T.</creator><creator>Koizumi, N.</creator><creator>Nunoya, Y.</creator><creator>Takahata, K.</creator><creator>Obana, T.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Wiring</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Frequency measurement</topic><topic>Imaging devices</topic><topic>Manufacturing processes</topic><topic>Position measurement</topic><topic>Potential energy</topic><topic>Power cables</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>strands' positions</topic><topic>twist deformation</topic><topic>Various equipment and components</topic><topic>Wires</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Miyagi, D.</creatorcontrib><creatorcontrib>Nakazawa, S.</creatorcontrib><creatorcontrib>Arai, D.</creatorcontrib><creatorcontrib>Morimura, T.</creatorcontrib><creatorcontrib>Tsuda, M.</creatorcontrib><creatorcontrib>Hamajima, T.</creatorcontrib><creatorcontrib>Yagai, T.</creatorcontrib><creatorcontrib>Koizumi, N.</creatorcontrib><creatorcontrib>Nunoya, Y.</creatorcontrib><creatorcontrib>Takahata, K.</creatorcontrib><creatorcontrib>Obana, T.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Miyagi, D.</au><au>Nakazawa, S.</au><au>Arai, D.</au><au>Morimura, T.</au><au>Tsuda, M.</au><au>Hamajima, T.</au><au>Yagai, T.</au><au>Koizumi, N.</au><au>Nunoya, Y.</au><au>Takahata, K.</au><au>Obana, T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comparison of Analytical Estimation and 3-D Measurement of All Strands Location in CIC Conductor</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>2013-06-01</date><risdate>2013</risdate><volume>23</volume><issue>3</issue><spage>8400904</spage><epage>8400904</epage><pages>8400904-8400904</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>It has been observed that the measured critical currents of cable-in-conduit-conductors (CICC) in some experiments are smaller than the expected ones. One of the reasons is the occurrence of unbalanced current at steady state caused by uneven contact resistances between strands. Because the contact resistance between strands is dependent on the contact length, the number of contacts and the loop length between strands, we need information about all strands' locations in the CICC. Therefore, we developed an evaluation method that describes the locations of every strand in the CICC in consideration of the twist disorder based on manufacture processes and elastic potential energy. Moreover, we compared the contact number and length between strands obtained by our calculated strands' positions with measured ones. We found that both results are in good agreement and clarified the validity of our calculation method of all strands' positions in the CICC.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TASC.2013.2246754</doi><tpages>1</tpages></addata></record> |
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| subjects | Applied sciences Cable-in-conduit conductor (CICC) Conductors contact length elastic energy Electric connection. Cables. Wiring Electrical engineering. Electrical power engineering Electronics Exact sciences and technology Frequency measurement Imaging devices Manufacturing processes Position measurement Potential energy Power cables Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices strands' positions twist deformation Various equipment and components Wires |
| title | Comparison of Analytical Estimation and 3-D Measurement of All Strands Location in CIC Conductor |
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