Characterization of short-duration voltage events
For proper analysis and mitigation of short duration voltage variations, such as sag (dip), swell and interruption, their characterization in terms of magnitude and duration is essential. The short duration voltage events are quantified by calculating the RMS voltage. Although, there are several met...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 654 |
|---|---|
| container_issue | |
| container_start_page | 650 |
| container_title | |
| container_volume | |
| creator | Zaro, F. R. Abido, M. A. Ameenuddin, S. Elamin, I. M. |
| description | For proper analysis and mitigation of short duration voltage variations, such as sag (dip), swell and interruption, their characterization in terms of magnitude and duration is essential. The short duration voltage events are quantified by calculating the RMS voltage. Although, there are several methods to calculate the RMS values, no method that can be standardized. This paper aims firstly to investigate the parameters that influence greatly RMS voltage calculations. Secondly, the quadrature method for calculating RMS voltage is utilized for power quality events detection. The quadrature method has been examined on several voltage events, such as sag, swell and interruption voltages. The results of the utilized method have been compared with those of conventional methods. The results demonstrate the superiority, accuracy, and robustness of the quadrature method for all cases considered. |
| doi_str_mv | 10.1109/PECon.2012.6450294 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6450294</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6450294</ieee_id><sourcerecordid>6450294</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-eb627155645869140dfe2c506ed96f6afe250eacc186212b567c648130343943</originalsourceid><addsrcrecordid>eNo1j91Kw0AUhFdEUGteQG_yAonn7M_Z3UsJ9QcKetH7sk1ObKQmsrsW9OkNtF4N38AMM0LcItSI4O_fls001hJQ1qQNSK_PxDVqssoAOn0uCm_dP1t9KYqUPgBgDpOz9kpgswsxtJnj8BvyMI3l1JdpN8Vcdd_x6BymfQ7vXPKBx5xuxEUf9omLky7E-nG5bp6r1evTS_Owqga0Jle8JWnRmHmWI48aup5la4C489RTmMkAh7ZFRxLl1pBtSTtUoLTyWi3E3bF2YObNVxw-Q_zZnE6qPzD4RJ4</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Characterization of short-duration voltage events</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Zaro, F. R. ; Abido, M. A. ; Ameenuddin, S. ; Elamin, I. M.</creator><creatorcontrib>Zaro, F. R. ; Abido, M. A. ; Ameenuddin, S. ; Elamin, I. M.</creatorcontrib><description>For proper analysis and mitigation of short duration voltage variations, such as sag (dip), swell and interruption, their characterization in terms of magnitude and duration is essential. The short duration voltage events are quantified by calculating the RMS voltage. Although, there are several methods to calculate the RMS values, no method that can be standardized. This paper aims firstly to investigate the parameters that influence greatly RMS voltage calculations. Secondly, the quadrature method for calculating RMS voltage is utilized for power quality events detection. The quadrature method has been examined on several voltage events, such as sag, swell and interruption voltages. The results of the utilized method have been compared with those of conventional methods. The results demonstrate the superiority, accuracy, and robustness of the quadrature method for all cases considered.</description><identifier>ISBN: 9781467350174</identifier><identifier>ISBN: 1467350176</identifier><identifier>EISBN: 1467350184</identifier><identifier>EISBN: 9781467350181</identifier><identifier>EISBN: 9781467350198</identifier><identifier>EISBN: 1467350192</identifier><identifier>DOI: 10.1109/PECon.2012.6450294</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conferences ; Interrupters ; N sample method ; Power quality ; Power quality events ; quadrature method ; RMS values ; Robustness ; short-duration voltage variations ; Voltage fluctuations</subject><ispartof>2012 IEEE International Conference on Power and Energy (PECon), 2012, p.650-654</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6450294$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6450294$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zaro, F. R.</creatorcontrib><creatorcontrib>Abido, M. A.</creatorcontrib><creatorcontrib>Ameenuddin, S.</creatorcontrib><creatorcontrib>Elamin, I. M.</creatorcontrib><title>Characterization of short-duration voltage events</title><title>2012 IEEE International Conference on Power and Energy (PECon)</title><addtitle>PECon</addtitle><description>For proper analysis and mitigation of short duration voltage variations, such as sag (dip), swell and interruption, their characterization in terms of magnitude and duration is essential. The short duration voltage events are quantified by calculating the RMS voltage. Although, there are several methods to calculate the RMS values, no method that can be standardized. This paper aims firstly to investigate the parameters that influence greatly RMS voltage calculations. Secondly, the quadrature method for calculating RMS voltage is utilized for power quality events detection. The quadrature method has been examined on several voltage events, such as sag, swell and interruption voltages. The results of the utilized method have been compared with those of conventional methods. The results demonstrate the superiority, accuracy, and robustness of the quadrature method for all cases considered.</description><subject>Conferences</subject><subject>Interrupters</subject><subject>N sample method</subject><subject>Power quality</subject><subject>Power quality events</subject><subject>quadrature method</subject><subject>RMS values</subject><subject>Robustness</subject><subject>short-duration voltage variations</subject><subject>Voltage fluctuations</subject><isbn>9781467350174</isbn><isbn>1467350176</isbn><isbn>1467350184</isbn><isbn>9781467350181</isbn><isbn>9781467350198</isbn><isbn>1467350192</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1j91Kw0AUhFdEUGteQG_yAonn7M_Z3UsJ9QcKetH7sk1ObKQmsrsW9OkNtF4N38AMM0LcItSI4O_fls001hJQ1qQNSK_PxDVqssoAOn0uCm_dP1t9KYqUPgBgDpOz9kpgswsxtJnj8BvyMI3l1JdpN8Vcdd_x6BymfQ7vXPKBx5xuxEUf9omLky7E-nG5bp6r1evTS_Owqga0Jle8JWnRmHmWI48aup5la4C489RTmMkAh7ZFRxLl1pBtSTtUoLTyWi3E3bF2YObNVxw-Q_zZnE6qPzD4RJ4</recordid><startdate>201212</startdate><enddate>201212</enddate><creator>Zaro, F. R.</creator><creator>Abido, M. A.</creator><creator>Ameenuddin, S.</creator><creator>Elamin, I. M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201212</creationdate><title>Characterization of short-duration voltage events</title><author>Zaro, F. R. ; Abido, M. A. ; Ameenuddin, S. ; Elamin, I. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-eb627155645869140dfe2c506ed96f6afe250eacc186212b567c648130343943</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Conferences</topic><topic>Interrupters</topic><topic>N sample method</topic><topic>Power quality</topic><topic>Power quality events</topic><topic>quadrature method</topic><topic>RMS values</topic><topic>Robustness</topic><topic>short-duration voltage variations</topic><topic>Voltage fluctuations</topic><toplevel>online_resources</toplevel><creatorcontrib>Zaro, F. R.</creatorcontrib><creatorcontrib>Abido, M. A.</creatorcontrib><creatorcontrib>Ameenuddin, S.</creatorcontrib><creatorcontrib>Elamin, I. M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zaro, F. R.</au><au>Abido, M. A.</au><au>Ameenuddin, S.</au><au>Elamin, I. M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Characterization of short-duration voltage events</atitle><btitle>2012 IEEE International Conference on Power and Energy (PECon)</btitle><stitle>PECon</stitle><date>2012-12</date><risdate>2012</risdate><spage>650</spage><epage>654</epage><pages>650-654</pages><isbn>9781467350174</isbn><isbn>1467350176</isbn><eisbn>1467350184</eisbn><eisbn>9781467350181</eisbn><eisbn>9781467350198</eisbn><eisbn>1467350192</eisbn><abstract>For proper analysis and mitigation of short duration voltage variations, such as sag (dip), swell and interruption, their characterization in terms of magnitude and duration is essential. The short duration voltage events are quantified by calculating the RMS voltage. Although, there are several methods to calculate the RMS values, no method that can be standardized. This paper aims firstly to investigate the parameters that influence greatly RMS voltage calculations. Secondly, the quadrature method for calculating RMS voltage is utilized for power quality events detection. The quadrature method has been examined on several voltage events, such as sag, swell and interruption voltages. The results of the utilized method have been compared with those of conventional methods. The results demonstrate the superiority, accuracy, and robustness of the quadrature method for all cases considered.</abstract><pub>IEEE</pub><doi>10.1109/PECon.2012.6450294</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISBN: 9781467350174 |
| ispartof | 2012 IEEE International Conference on Power and Energy (PECon), 2012, p.650-654 |
| issn | |
| language | eng |
| recordid | cdi_ieee_primary_6450294 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Conferences Interrupters N sample method Power quality Power quality events quadrature method RMS values Robustness short-duration voltage variations Voltage fluctuations |
| title | Characterization of short-duration voltage events |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T06%3A05%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Characterization%20of%20short-duration%20voltage%20events&rft.btitle=2012%20IEEE%20International%20Conference%20on%20Power%20and%20Energy%20(PECon)&rft.au=Zaro,%20F.%20R.&rft.date=2012-12&rft.spage=650&rft.epage=654&rft.pages=650-654&rft.isbn=9781467350174&rft.isbn_list=1467350176&rft_id=info:doi/10.1109/PECon.2012.6450294&rft_dat=%3Cieee_6IE%3E6450294%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1467350184&rft.eisbn_list=9781467350181&rft.eisbn_list=9781467350198&rft.eisbn_list=1467350192&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6450294&rfr_iscdi=true |