Insulation aging measured by shearing modulus
A NEW METHOD is described for determining the effect of thermal aging on the shearing modulus of flexible sheet insulations by nondestructive tests using a torsion pendulum technique. The test sample consists of a 12-inch length of the material under test, clamped between two pairs of inertia bars o...
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| Veröffentlicht in: | Electrical engineering (New York, N.Y.) N.Y.), 1955-11, Vol.74 (11), p.993-993 |
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| container_end_page | 993 |
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| container_issue | 11 |
| container_start_page | 993 |
| container_title | Electrical engineering (New York, N.Y.) |
| container_volume | 74 |
| creator | Whitman, L. C. Scheideler, A. L. |
| description | A NEW METHOD is described for determining the effect of thermal aging on the shearing modulus of flexible sheet insulations by nondestructive tests using a torsion pendulum technique. The test sample consists of a 12-inch length of the material under test, clamped between two pairs of inertia bars of different weight and inertia. |
| doi_str_mv | 10.1109/EE.1955.6439641 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_ieee_primary_6439641</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6439641</ieee_id><sourcerecordid>10_1109_EE_1955_6439641</sourcerecordid><originalsourceid>FETCH-LOGICAL-c601-b9637d2f337c1f66e5c83efac24c1cb7f8839bfddc3023ede869cfbb641a379c3</originalsourceid><addsrcrecordid>eNo9j8tOwzAQRS0EEqGwZsEmP-DUzjh-LFEVoFIlNt1bfoxLUJqgmCz697S0sLrS3DmjOYQ8clZxzsyybStumqaSAowU_IoUNShJlWbimhSMmYYabtQtucv5kzFgQouC0PWQ5959d-NQul037Mo9ujxPGEt_KPMHuul3OMa5n_M9uUmuz_hwyQXZvrTb1RvdvL-uV88bGiTj1BsJKtYJQAWepMQmaMDkQi0CD14lrcH4FGMAVgNG1NKE5P3xawfKBFiQ5flsmMacJ0z2a-r2bjpYzuxJ1ratPcnai-yReDoTHSL-b_-1P8pUUHU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Insulation aging measured by shearing modulus</title><source>IEEE Electronic Library (IEL)</source><creator>Whitman, L. C. ; Scheideler, A. L.</creator><creatorcontrib>Whitman, L. C. ; Scheideler, A. L.</creatorcontrib><description>A NEW METHOD is described for determining the effect of thermal aging on the shearing modulus of flexible sheet insulations by nondestructive tests using a torsion pendulum technique. The test sample consists of a 12-inch length of the material under test, clamped between two pairs of inertia bars of different weight and inertia.</description><identifier>ISSN: 0095-9197</identifier><identifier>EISSN: 2376-7804</identifier><identifier>DOI: 10.1109/EE.1955.6439641</identifier><language>eng</language><publisher>American Institute of Electrical Engineers</publisher><subject>Aging ; Bars ; Insulation ; Materials ; Shearing ; Stress ; Strips</subject><ispartof>Electrical engineering (New York, N.Y.), 1955-11, Vol.74 (11), p.993-993</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6439641$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6439641$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Whitman, L. C.</creatorcontrib><creatorcontrib>Scheideler, A. L.</creatorcontrib><title>Insulation aging measured by shearing modulus</title><title>Electrical engineering (New York, N.Y.)</title><addtitle>EE</addtitle><description>A NEW METHOD is described for determining the effect of thermal aging on the shearing modulus of flexible sheet insulations by nondestructive tests using a torsion pendulum technique. The test sample consists of a 12-inch length of the material under test, clamped between two pairs of inertia bars of different weight and inertia.</description><subject>Aging</subject><subject>Bars</subject><subject>Insulation</subject><subject>Materials</subject><subject>Shearing</subject><subject>Stress</subject><subject>Strips</subject><issn>0095-9197</issn><issn>2376-7804</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1955</creationdate><recordtype>article</recordtype><recordid>eNo9j8tOwzAQRS0EEqGwZsEmP-DUzjh-LFEVoFIlNt1bfoxLUJqgmCz697S0sLrS3DmjOYQ8clZxzsyybStumqaSAowU_IoUNShJlWbimhSMmYYabtQtucv5kzFgQouC0PWQ5959d-NQul037Mo9ujxPGEt_KPMHuul3OMa5n_M9uUmuz_hwyQXZvrTb1RvdvL-uV88bGiTj1BsJKtYJQAWepMQmaMDkQi0CD14lrcH4FGMAVgNG1NKE5P3xawfKBFiQ5flsmMacJ0z2a-r2bjpYzuxJ1ratPcnai-yReDoTHSL-b_-1P8pUUHU</recordid><startdate>195511</startdate><enddate>195511</enddate><creator>Whitman, L. C.</creator><creator>Scheideler, A. L.</creator><general>American Institute of Electrical Engineers</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>195511</creationdate><title>Insulation aging measured by shearing modulus</title><author>Whitman, L. C. ; Scheideler, A. L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c601-b9637d2f337c1f66e5c83efac24c1cb7f8839bfddc3023ede869cfbb641a379c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1955</creationdate><topic>Aging</topic><topic>Bars</topic><topic>Insulation</topic><topic>Materials</topic><topic>Shearing</topic><topic>Stress</topic><topic>Strips</topic><toplevel>online_resources</toplevel><creatorcontrib>Whitman, L. C.</creatorcontrib><creatorcontrib>Scheideler, A. L.</creatorcontrib><collection>CrossRef</collection><jtitle>Electrical engineering (New York, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Whitman, L. C.</au><au>Scheideler, A. L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Insulation aging measured by shearing modulus</atitle><jtitle>Electrical engineering (New York, N.Y.)</jtitle><stitle>EE</stitle><date>1955-11</date><risdate>1955</risdate><volume>74</volume><issue>11</issue><spage>993</spage><epage>993</epage><pages>993-993</pages><issn>0095-9197</issn><eissn>2376-7804</eissn><abstract>A NEW METHOD is described for determining the effect of thermal aging on the shearing modulus of flexible sheet insulations by nondestructive tests using a torsion pendulum technique. The test sample consists of a 12-inch length of the material under test, clamped between two pairs of inertia bars of different weight and inertia.</abstract><pub>American Institute of Electrical Engineers</pub><doi>10.1109/EE.1955.6439641</doi><tpages>1</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0095-9197 |
| ispartof | Electrical engineering (New York, N.Y.), 1955-11, Vol.74 (11), p.993-993 |
| issn | 0095-9197 2376-7804 |
| language | eng |
| recordid | cdi_ieee_primary_6439641 |
| source | IEEE Electronic Library (IEL) |
| subjects | Aging Bars Insulation Materials Shearing Stress Strips |
| title | Insulation aging measured by shearing modulus |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T05%3A46%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Insulation%20aging%20measured%20by%20shearing%20modulus&rft.jtitle=Electrical%20engineering%20(New%20York,%20N.Y.)&rft.au=Whitman,%20L.%20C.&rft.date=1955-11&rft.volume=74&rft.issue=11&rft.spage=993&rft.epage=993&rft.pages=993-993&rft.issn=0095-9197&rft.eissn=2376-7804&rft_id=info:doi/10.1109/EE.1955.6439641&rft_dat=%3Ccrossref_RIE%3E10_1109_EE_1955_6439641%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6439641&rfr_iscdi=true |