Rapid Sintering Nanosilver Joint by Pulse Current for Power Electronics Packaging

Sintering of nanosilver paste has been extensively studied as a lead-free die-attach solution for bonding semiconductor chips. The bonding process typically consists of a low-temperature drying step to remove organic solvents in the paste followed by sintering at around 250°C . Normally, a soak time...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on device and materials reliability 2013-03, Vol.13 (1), p.258-265
Hauptverfasser: Mei, Yunhui, Cao, Yunjiao, Chen, Gang, Li, Xin, Lu, Guo-Quan, Chen, Xu
Format: Magazinearticle
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 265
container_issue 1
container_start_page 258
container_title IEEE transactions on device and materials reliability
container_volume 13
creator Mei, Yunhui
Cao, Yunjiao
Chen, Gang
Li, Xin
Lu, Guo-Quan
Chen, Xu
description Sintering of nanosilver paste has been extensively studied as a lead-free die-attach solution for bonding semiconductor chips. The bonding process typically consists of a low-temperature drying step to remove organic solvents in the paste followed by sintering at around 250°C . Normally, a soak time of several minutes at the sintering temperature is necessary to establish strong bond strength by the conventional heating method. In this paper, we tested the feasibility of applying pulses of alternating electrical current through the nanosilver bonding layer to achieve strong joints in less than a second, not minutes. Experiments were carried out by joining rectangular copper blocks that were either coated with a layer of electroplated silver or without. A layer of nanosilver paste was stencil printed on one block, dried at temperature below 100°C, before the other copper block was placed on. The bonding members were then inserted under an alternating-current spot-welding machine for rapid joining with current pulses. Die-shear test was used to quantify the joint strength. Investigated processing variables on the joint strength were current level, current-on time, nanosilver bondline thickness, predrying temperature and time, and copper surface finish. Scanning electron microscopy was used to characterize the joint microstructure. It is suggestive that the current sintering of nanosilver paste could be used for rapid joining of metal-to-metal connection, such as bonding copper bus bars onto power electronics modules.
doi_str_mv 10.1109/TDMR.2012.2237552
format Magazinearticle
fullrecord <record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_ieee_primary_6401180</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6401180</ieee_id><sourcerecordid>10_1109_TDMR_2012_2237552</sourcerecordid><originalsourceid>FETCH-LOGICAL-c265t-e35368b8fb4e46e1e9b46b9798382d3ffe73c25b2dd578af3f065cef39cb62313</originalsourceid><addsrcrecordid>eNo9kMtOwzAQRS0EEqXwAYiNfyDF9sSOs0SlvFSglLKObGdcGUpS2S2of0-iVqxmdHXuXRxCLjkbcc7K68Xt83wkGBcjIaCQUhyRAZdSZ0IW-XH_A8ty0PqUnKX0yRgvC6kG5G1u1qGm76HZYAzNkr6Ypk1h9YORPrVdSu2OzrarhHS8jRG7wLeRztrfDpis0G1i2wSX6My4L7PsFs7JiTcdf3G4Q_JxN1mMH7Lp6_3j-GaaOaHkJkOQoLTV3uaYK-RY2lzZsig1aFGD91iAE9KKupaFNh48U9Khh9JZJYDDkPD9rottShF9tY7h28RdxVnVO6l6J1XvpDo46TpX-05AxH9e5YxzzeAPqcFeUw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>magazinearticle</recordtype></control><display><type>magazinearticle</type><title>Rapid Sintering Nanosilver Joint by Pulse Current for Power Electronics Packaging</title><source>IEEE Electronic Library (IEL)</source><creator>Mei, Yunhui ; Cao, Yunjiao ; Chen, Gang ; Li, Xin ; Lu, Guo-Quan ; Chen, Xu</creator><creatorcontrib>Mei, Yunhui ; Cao, Yunjiao ; Chen, Gang ; Li, Xin ; Lu, Guo-Quan ; Chen, Xu</creatorcontrib><description>Sintering of nanosilver paste has been extensively studied as a lead-free die-attach solution for bonding semiconductor chips. The bonding process typically consists of a low-temperature drying step to remove organic solvents in the paste followed by sintering at around 250°C . Normally, a soak time of several minutes at the sintering temperature is necessary to establish strong bond strength by the conventional heating method. In this paper, we tested the feasibility of applying pulses of alternating electrical current through the nanosilver bonding layer to achieve strong joints in less than a second, not minutes. Experiments were carried out by joining rectangular copper blocks that were either coated with a layer of electroplated silver or without. A layer of nanosilver paste was stencil printed on one block, dried at temperature below 100°C, before the other copper block was placed on. The bonding members were then inserted under an alternating-current spot-welding machine for rapid joining with current pulses. Die-shear test was used to quantify the joint strength. Investigated processing variables on the joint strength were current level, current-on time, nanosilver bondline thickness, predrying temperature and time, and copper surface finish. Scanning electron microscopy was used to characterize the joint microstructure. It is suggestive that the current sintering of nanosilver paste could be used for rapid joining of metal-to-metal connection, such as bonding copper bus bars onto power electronics modules.</description><identifier>ISSN: 1530-4388</identifier><identifier>EISSN: 1558-2574</identifier><identifier>DOI: 10.1109/TDMR.2012.2237552</identifier><identifier>CODEN: ITDMA2</identifier><language>eng</language><publisher>IEEE</publisher><subject>Copper ; Current sintering ; Educational institutions ; Joints ; lead-free ; low-temperature sintering ; Materials ; nanosilver paste ; Power electronics ; rapid joining ; Silver ; Surface cracks</subject><ispartof>IEEE transactions on device and materials reliability, 2013-03, Vol.13 (1), p.258-265</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c265t-e35368b8fb4e46e1e9b46b9798382d3ffe73c25b2dd578af3f065cef39cb62313</citedby><cites>FETCH-LOGICAL-c265t-e35368b8fb4e46e1e9b46b9798382d3ffe73c25b2dd578af3f065cef39cb62313</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6401180$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>780,784,796,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6401180$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Mei, Yunhui</creatorcontrib><creatorcontrib>Cao, Yunjiao</creatorcontrib><creatorcontrib>Chen, Gang</creatorcontrib><creatorcontrib>Li, Xin</creatorcontrib><creatorcontrib>Lu, Guo-Quan</creatorcontrib><creatorcontrib>Chen, Xu</creatorcontrib><title>Rapid Sintering Nanosilver Joint by Pulse Current for Power Electronics Packaging</title><title>IEEE transactions on device and materials reliability</title><addtitle>TDMR</addtitle><description>Sintering of nanosilver paste has been extensively studied as a lead-free die-attach solution for bonding semiconductor chips. The bonding process typically consists of a low-temperature drying step to remove organic solvents in the paste followed by sintering at around 250°C . Normally, a soak time of several minutes at the sintering temperature is necessary to establish strong bond strength by the conventional heating method. In this paper, we tested the feasibility of applying pulses of alternating electrical current through the nanosilver bonding layer to achieve strong joints in less than a second, not minutes. Experiments were carried out by joining rectangular copper blocks that were either coated with a layer of electroplated silver or without. A layer of nanosilver paste was stencil printed on one block, dried at temperature below 100°C, before the other copper block was placed on. The bonding members were then inserted under an alternating-current spot-welding machine for rapid joining with current pulses. Die-shear test was used to quantify the joint strength. Investigated processing variables on the joint strength were current level, current-on time, nanosilver bondline thickness, predrying temperature and time, and copper surface finish. Scanning electron microscopy was used to characterize the joint microstructure. It is suggestive that the current sintering of nanosilver paste could be used for rapid joining of metal-to-metal connection, such as bonding copper bus bars onto power electronics modules.</description><subject>Copper</subject><subject>Current sintering</subject><subject>Educational institutions</subject><subject>Joints</subject><subject>lead-free</subject><subject>low-temperature sintering</subject><subject>Materials</subject><subject>nanosilver paste</subject><subject>Power electronics</subject><subject>rapid joining</subject><subject>Silver</subject><subject>Surface cracks</subject><issn>1530-4388</issn><issn>1558-2574</issn><fulltext>true</fulltext><rsrctype>magazinearticle</rsrctype><creationdate>2013</creationdate><recordtype>magazinearticle</recordtype><sourceid>RIE</sourceid><recordid>eNo9kMtOwzAQRS0EEqXwAYiNfyDF9sSOs0SlvFSglLKObGdcGUpS2S2of0-iVqxmdHXuXRxCLjkbcc7K68Xt83wkGBcjIaCQUhyRAZdSZ0IW-XH_A8ty0PqUnKX0yRgvC6kG5G1u1qGm76HZYAzNkr6Ypk1h9YORPrVdSu2OzrarhHS8jRG7wLeRztrfDpis0G1i2wSX6My4L7PsFs7JiTcdf3G4Q_JxN1mMH7Lp6_3j-GaaOaHkJkOQoLTV3uaYK-RY2lzZsig1aFGD91iAE9KKupaFNh48U9Khh9JZJYDDkPD9rottShF9tY7h28RdxVnVO6l6J1XvpDo46TpX-05AxH9e5YxzzeAPqcFeUw</recordid><startdate>20130301</startdate><enddate>20130301</enddate><creator>Mei, Yunhui</creator><creator>Cao, Yunjiao</creator><creator>Chen, Gang</creator><creator>Li, Xin</creator><creator>Lu, Guo-Quan</creator><creator>Chen, Xu</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20130301</creationdate><title>Rapid Sintering Nanosilver Joint by Pulse Current for Power Electronics Packaging</title><author>Mei, Yunhui ; Cao, Yunjiao ; Chen, Gang ; Li, Xin ; Lu, Guo-Quan ; Chen, Xu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c265t-e35368b8fb4e46e1e9b46b9798382d3ffe73c25b2dd578af3f065cef39cb62313</frbrgroupid><rsrctype>magazinearticle</rsrctype><prefilter>magazinearticle</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Copper</topic><topic>Current sintering</topic><topic>Educational institutions</topic><topic>Joints</topic><topic>lead-free</topic><topic>low-temperature sintering</topic><topic>Materials</topic><topic>nanosilver paste</topic><topic>Power electronics</topic><topic>rapid joining</topic><topic>Silver</topic><topic>Surface cracks</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mei, Yunhui</creatorcontrib><creatorcontrib>Cao, Yunjiao</creatorcontrib><creatorcontrib>Chen, Gang</creatorcontrib><creatorcontrib>Li, Xin</creatorcontrib><creatorcontrib>Lu, Guo-Quan</creatorcontrib><creatorcontrib>Chen, Xu</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE transactions on device and materials reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mei, Yunhui</au><au>Cao, Yunjiao</au><au>Chen, Gang</au><au>Li, Xin</au><au>Lu, Guo-Quan</au><au>Chen, Xu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Rapid Sintering Nanosilver Joint by Pulse Current for Power Electronics Packaging</atitle><jtitle>IEEE transactions on device and materials reliability</jtitle><stitle>TDMR</stitle><date>2013-03-01</date><risdate>2013</risdate><volume>13</volume><issue>1</issue><spage>258</spage><epage>265</epage><pages>258-265</pages><issn>1530-4388</issn><eissn>1558-2574</eissn><coden>ITDMA2</coden><abstract>Sintering of nanosilver paste has been extensively studied as a lead-free die-attach solution for bonding semiconductor chips. The bonding process typically consists of a low-temperature drying step to remove organic solvents in the paste followed by sintering at around 250°C . Normally, a soak time of several minutes at the sintering temperature is necessary to establish strong bond strength by the conventional heating method. In this paper, we tested the feasibility of applying pulses of alternating electrical current through the nanosilver bonding layer to achieve strong joints in less than a second, not minutes. Experiments were carried out by joining rectangular copper blocks that were either coated with a layer of electroplated silver or without. A layer of nanosilver paste was stencil printed on one block, dried at temperature below 100°C, before the other copper block was placed on. The bonding members were then inserted under an alternating-current spot-welding machine for rapid joining with current pulses. Die-shear test was used to quantify the joint strength. Investigated processing variables on the joint strength were current level, current-on time, nanosilver bondline thickness, predrying temperature and time, and copper surface finish. Scanning electron microscopy was used to characterize the joint microstructure. It is suggestive that the current sintering of nanosilver paste could be used for rapid joining of metal-to-metal connection, such as bonding copper bus bars onto power electronics modules.</abstract><pub>IEEE</pub><doi>10.1109/TDMR.2012.2237552</doi><tpages>8</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1530-4388
ispartof IEEE transactions on device and materials reliability, 2013-03, Vol.13 (1), p.258-265
issn 1530-4388
1558-2574
language eng
recordid cdi_ieee_primary_6401180
source IEEE Electronic Library (IEL)
subjects Copper
Current sintering
Educational institutions
Joints
lead-free
low-temperature sintering
Materials
nanosilver paste
Power electronics
rapid joining
Silver
Surface cracks
title Rapid Sintering Nanosilver Joint by Pulse Current for Power Electronics Packaging
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T16%3A31%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Rapid%20Sintering%20Nanosilver%20Joint%20by%20Pulse%20Current%20for%20Power%20Electronics%20Packaging&rft.jtitle=IEEE%20transactions%20on%20device%20and%20materials%20reliability&rft.au=Mei,%20Yunhui&rft.date=2013-03-01&rft.volume=13&rft.issue=1&rft.spage=258&rft.epage=265&rft.pages=258-265&rft.issn=1530-4388&rft.eissn=1558-2574&rft.coden=ITDMA2&rft_id=info:doi/10.1109/TDMR.2012.2237552&rft_dat=%3Ccrossref_RIE%3E10_1109_TDMR_2012_2237552%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6401180&rfr_iscdi=true