Exact Error Analysis of Dual-Hop Fixed-Gain AF Relaying over Arbitrary Nakagami-m Fading
Closed-form error analysis of dual-hop fixed-gain amplify-and-forward (AF) relaying systems for transmissions over Nakagami fading channels has, so far, been tractable only with integer fading parameters. For the general Nakagami-m fading with arbitrary m values, the exact closed-form error analysis...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 5 |
---|---|
container_issue | |
container_start_page | 1 |
container_title | |
container_volume | |
creator | Trigui, I. Affes, S. Stephenne, A. |
description | Closed-form error analysis of dual-hop fixed-gain amplify-and-forward (AF) relaying systems for transmissions over Nakagami fading channels has, so far, been tractable only with integer fading parameters. For the general Nakagami-m fading with arbitrary m values, the exact closed-form error analysis is more challenging. This paper goes toward solving this problem by deriving a unified error analysis framework that embraces several general modulation schemes. The obtained Error Probability (EP) expressions involve common functions which can be efficiently evaluated using standard numerical softwares. This work represents a significant improvement on previous contributions, not only by unifying the error probability expressions pertaining to dual-hop fixed gain relaying over integer Nakagami-m fading, but also by extending them to the general arbitrary Nakagami-m fading. Simulation results sustaining our analysis are provided, and the impacts of various parameters on the overall AF relaying system performance are investigated. |
doi_str_mv | 10.1109/VTCFall.2012.6399349 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6399349</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6399349</ieee_id><sourcerecordid>6399349</sourcerecordid><originalsourceid>FETCH-LOGICAL-i208t-ca125e6c6cc772bc0e603d1a5a227ba6c226a0fb66f49aa7806f5c2aecb1d3163</originalsourceid><addsrcrecordid>eNotkN1OAjEUhOtfIiJPoBd9geLp6W5_LgmyYEI0MWi8I2e7XVJdWNNFA2_vJnI1FzPzZTKM3UsYSwnu4X01LahpxggSx1o5pzJ3xkbOWJlpo6Q1Ds_ZAHNjBGY6v2A3J8OCu2SDngFCgbLXbNR1nwDQYw1YM2AfswP5PZ-l1CY-2VFz7GLH25o__lAjFu03L-IhVGJOcccnBX8NDR3jbsPb39AXUhn3idKRP9MXbWgbxZYXVPWBW3ZVU9OF0UmH7K2YraYLsXyZP00nSxER7F54kpgH7bX3xmDpIWhQlaScEE1J2iNqgrrUus4ckbGg69wjBV_KSkmthuzunxtDCOvvFLf9nPXpJPUHjcZXKQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Exact Error Analysis of Dual-Hop Fixed-Gain AF Relaying over Arbitrary Nakagami-m Fading</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Trigui, I. ; Affes, S. ; Stephenne, A.</creator><creatorcontrib>Trigui, I. ; Affes, S. ; Stephenne, A.</creatorcontrib><description>Closed-form error analysis of dual-hop fixed-gain amplify-and-forward (AF) relaying systems for transmissions over Nakagami fading channels has, so far, been tractable only with integer fading parameters. For the general Nakagami-m fading with arbitrary m values, the exact closed-form error analysis is more challenging. This paper goes toward solving this problem by deriving a unified error analysis framework that embraces several general modulation schemes. The obtained Error Probability (EP) expressions involve common functions which can be efficiently evaluated using standard numerical softwares. This work represents a significant improvement on previous contributions, not only by unifying the error probability expressions pertaining to dual-hop fixed gain relaying over integer Nakagami-m fading, but also by extending them to the general arbitrary Nakagami-m fading. Simulation results sustaining our analysis are provided, and the impacts of various parameters on the overall AF relaying system performance are investigated.</description><identifier>ISSN: 1090-3038</identifier><identifier>ISBN: 1467318809</identifier><identifier>ISBN: 9781467318808</identifier><identifier>EISSN: 2577-2465</identifier><identifier>EISBN: 9781467318792</identifier><identifier>EISBN: 1467318795</identifier><identifier>EISBN: 9781467318815</identifier><identifier>EISBN: 1467318817</identifier><identifier>DOI: 10.1109/VTCFall.2012.6399349</identifier><language>eng</language><publisher>IEEE</publisher><subject>Error analysis ; Error probability ; Fading ; Modulation ; Relays ; Signal to noise ratio ; Wireless communication</subject><ispartof>2012 IEEE Vehicular Technology Conference (VTC Fall), 2012, p.1-5</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6399349$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6399349$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Trigui, I.</creatorcontrib><creatorcontrib>Affes, S.</creatorcontrib><creatorcontrib>Stephenne, A.</creatorcontrib><title>Exact Error Analysis of Dual-Hop Fixed-Gain AF Relaying over Arbitrary Nakagami-m Fading</title><title>2012 IEEE Vehicular Technology Conference (VTC Fall)</title><addtitle>VTCFall</addtitle><description>Closed-form error analysis of dual-hop fixed-gain amplify-and-forward (AF) relaying systems for transmissions over Nakagami fading channels has, so far, been tractable only with integer fading parameters. For the general Nakagami-m fading with arbitrary m values, the exact closed-form error analysis is more challenging. This paper goes toward solving this problem by deriving a unified error analysis framework that embraces several general modulation schemes. The obtained Error Probability (EP) expressions involve common functions which can be efficiently evaluated using standard numerical softwares. This work represents a significant improvement on previous contributions, not only by unifying the error probability expressions pertaining to dual-hop fixed gain relaying over integer Nakagami-m fading, but also by extending them to the general arbitrary Nakagami-m fading. Simulation results sustaining our analysis are provided, and the impacts of various parameters on the overall AF relaying system performance are investigated.</description><subject>Error analysis</subject><subject>Error probability</subject><subject>Fading</subject><subject>Modulation</subject><subject>Relays</subject><subject>Signal to noise ratio</subject><subject>Wireless communication</subject><issn>1090-3038</issn><issn>2577-2465</issn><isbn>1467318809</isbn><isbn>9781467318808</isbn><isbn>9781467318792</isbn><isbn>1467318795</isbn><isbn>9781467318815</isbn><isbn>1467318817</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkN1OAjEUhOtfIiJPoBd9geLp6W5_LgmyYEI0MWi8I2e7XVJdWNNFA2_vJnI1FzPzZTKM3UsYSwnu4X01LahpxggSx1o5pzJ3xkbOWJlpo6Q1Ds_ZAHNjBGY6v2A3J8OCu2SDngFCgbLXbNR1nwDQYw1YM2AfswP5PZ-l1CY-2VFz7GLH25o__lAjFu03L-IhVGJOcccnBX8NDR3jbsPb39AXUhn3idKRP9MXbWgbxZYXVPWBW3ZVU9OF0UmH7K2YraYLsXyZP00nSxER7F54kpgH7bX3xmDpIWhQlaScEE1J2iNqgrrUus4ckbGg69wjBV_KSkmthuzunxtDCOvvFLf9nPXpJPUHjcZXKQ</recordid><startdate>201209</startdate><enddate>201209</enddate><creator>Trigui, I.</creator><creator>Affes, S.</creator><creator>Stephenne, A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201209</creationdate><title>Exact Error Analysis of Dual-Hop Fixed-Gain AF Relaying over Arbitrary Nakagami-m Fading</title><author>Trigui, I. ; Affes, S. ; Stephenne, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i208t-ca125e6c6cc772bc0e603d1a5a227ba6c226a0fb66f49aa7806f5c2aecb1d3163</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Error analysis</topic><topic>Error probability</topic><topic>Fading</topic><topic>Modulation</topic><topic>Relays</topic><topic>Signal to noise ratio</topic><topic>Wireless communication</topic><toplevel>online_resources</toplevel><creatorcontrib>Trigui, I.</creatorcontrib><creatorcontrib>Affes, S.</creatorcontrib><creatorcontrib>Stephenne, A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Trigui, I.</au><au>Affes, S.</au><au>Stephenne, A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Exact Error Analysis of Dual-Hop Fixed-Gain AF Relaying over Arbitrary Nakagami-m Fading</atitle><btitle>2012 IEEE Vehicular Technology Conference (VTC Fall)</btitle><stitle>VTCFall</stitle><date>2012-09</date><risdate>2012</risdate><spage>1</spage><epage>5</epage><pages>1-5</pages><issn>1090-3038</issn><eissn>2577-2465</eissn><isbn>1467318809</isbn><isbn>9781467318808</isbn><eisbn>9781467318792</eisbn><eisbn>1467318795</eisbn><eisbn>9781467318815</eisbn><eisbn>1467318817</eisbn><abstract>Closed-form error analysis of dual-hop fixed-gain amplify-and-forward (AF) relaying systems for transmissions over Nakagami fading channels has, so far, been tractable only with integer fading parameters. For the general Nakagami-m fading with arbitrary m values, the exact closed-form error analysis is more challenging. This paper goes toward solving this problem by deriving a unified error analysis framework that embraces several general modulation schemes. The obtained Error Probability (EP) expressions involve common functions which can be efficiently evaluated using standard numerical softwares. This work represents a significant improvement on previous contributions, not only by unifying the error probability expressions pertaining to dual-hop fixed gain relaying over integer Nakagami-m fading, but also by extending them to the general arbitrary Nakagami-m fading. Simulation results sustaining our analysis are provided, and the impacts of various parameters on the overall AF relaying system performance are investigated.</abstract><pub>IEEE</pub><doi>10.1109/VTCFall.2012.6399349</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1090-3038 |
ispartof | 2012 IEEE Vehicular Technology Conference (VTC Fall), 2012, p.1-5 |
issn | 1090-3038 2577-2465 |
language | eng |
recordid | cdi_ieee_primary_6399349 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Error analysis Error probability Fading Modulation Relays Signal to noise ratio Wireless communication |
title | Exact Error Analysis of Dual-Hop Fixed-Gain AF Relaying over Arbitrary Nakagami-m Fading |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T00%3A24%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Exact%20Error%20Analysis%20of%20Dual-Hop%20Fixed-Gain%20AF%20Relaying%20over%20Arbitrary%20Nakagami-m%20Fading&rft.btitle=2012%20IEEE%20Vehicular%20Technology%20Conference%20(VTC%20Fall)&rft.au=Trigui,%20I.&rft.date=2012-09&rft.spage=1&rft.epage=5&rft.pages=1-5&rft.issn=1090-3038&rft.eissn=2577-2465&rft.isbn=1467318809&rft.isbn_list=9781467318808&rft_id=info:doi/10.1109/VTCFall.2012.6399349&rft_dat=%3Cieee_6IE%3E6399349%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781467318792&rft.eisbn_list=1467318795&rft.eisbn_list=9781467318815&rft.eisbn_list=1467318817&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6399349&rfr_iscdi=true |