Counter-Based Output Selection for Test Response Compaction

Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. One critical issue for output selection is how to implement the selection hardwar...

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Veröffentlicht in:	IEEE transactions on computer-aided design of integrated circuits and systems 2013-01, Vol.32 (1), p.152-164
Hauptverfasser:	Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Chakrabarty, K., Yu-Hua Wu
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuit faults Compaction Dictionaries Fault detection Fault diagnosis Heuristic algorithms Multiplexing output selection Radiation detectors test compression test response compaction
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