Robust Thin-Film Wire-Grid THz Polarizer Fabricated Via a Low-Cost Approach
A robust thin-film wire-grid terahertz (THz) polarizer was fabricated via a low-cost, mass-producible manufacturing approach. This polarizer is built on a very thin silica layer structurally supported by a silicon substrate. In addition, the metal grating is protected by a polymer thin film, which e...
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| Veröffentlicht in: | IEEE photonics technology letters 2013-01, Vol.25 (1), p.81-84 |
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| container_title | IEEE photonics technology letters |
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| creator | Zhe Huang Hongkyu Park Parrott, E. P. J. Hau Ping Chan Pickwell-MacPherson, E. |
| description | A robust thin-film wire-grid terahertz (THz) polarizer was fabricated via a low-cost, mass-producible manufacturing approach. This polarizer is built on a very thin silica layer structurally supported by a silicon substrate. In addition, the metal grating is protected by a polymer thin film, which eliminates the multireflection effect and enhances the robustness of the polarizer for easy packaging. The polarizer can be easily mounted onto a Newport rotation holder for immediate use. A THz time-domain spectrometer is used to characterize its performance, and an excellent agreement is found between the FDTD-simulated results and the experimental results. The polarizer offered 20-40 dB and 0.8 dB of extinction ratio and transmission loss over a frequency range of 0.2-2.0 THz, respectively. |
| doi_str_mv | 10.1109/LPT.2012.2228184 |
| format | Article |
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The polarizer offered 20-40 dB and 0.8 dB of extinction ratio and transmission loss over a frequency range of 0.2-2.0 THz, respectively.</description><subject>Gratings</subject><subject>Metals</subject><subject>optical polarization</subject><subject>Polymers</subject><subject>Robustness</subject><subject>Silicon</subject><subject>submilimeter wave devices</subject><subject>Substrates</subject><subject>thin film</subject><subject>Time domain analysis</subject><issn>1041-1135</issn><issn>1941-0174</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kEFLwzAYhoMoOKd3wUv-QGa-JG2T4xhuEwsOqXosSfOFRTY70oq4X7-ODU_ve3if9_AQcg98AsDNY7mqJoKDmAghNGh1QUZgFDAOhbocOh86gMyuyU3XfXEOKpNqRF7eWvfT9bRax282j5st_YwJ2SJFT6vlnq7ajU1xj4nOrUuxsT16-hEttbRsf9msHdjpbpda26xvyVWwmw7vzjkm7_OnarZk5evieTYtWSOF6ZmTPs-k9arItLcotQ25xiIYIbUywThEr_PgfO5E4ZGjVzqgLxy3qnG5kWPCT79NarsuYah3KW5t-quB10cZ9SCjPsqozzIG5OGERET8n-cyKwQYeQB8xFs3</recordid><startdate>20130101</startdate><enddate>20130101</enddate><creator>Zhe Huang</creator><creator>Hongkyu Park</creator><creator>Parrott, E. 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J.</creatorcontrib><creatorcontrib>Hau Ping Chan</creatorcontrib><creatorcontrib>Pickwell-MacPherson, E.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE photonics technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zhe Huang</au><au>Hongkyu Park</au><au>Parrott, E. P. 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A THz time-domain spectrometer is used to characterize its performance, and an excellent agreement is found between the FDTD-simulated results and the experimental results. The polarizer offered 20-40 dB and 0.8 dB of extinction ratio and transmission loss over a frequency range of 0.2-2.0 THz, respectively.</abstract><pub>IEEE</pub><doi>10.1109/LPT.2012.2228184</doi><tpages>4</tpages></addata></record> |
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| ispartof | IEEE photonics technology letters, 2013-01, Vol.25 (1), p.81-84 |
| issn | 1041-1135 1941-0174 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Gratings Metals optical polarization Polymers Robustness Silicon submilimeter wave devices Substrates thin film Time domain analysis |
| title | Robust Thin-Film Wire-Grid THz Polarizer Fabricated Via a Low-Cost Approach |
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