Comparison of bi-stable and delay-based Physical Unclonable Functions from measurements in 65nm bulk CMOS
Physical Unclonable Functions (PUFs) are security primitives used in a number of security applications like authentication, identification, and secure key generation. PUF implementations are evaluated on their security characteristics (uniqueness, randomness, and reliability), as well as conventiona...
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| creator | Bhargava, M. Cakir, C. Ken Mai |
| description | Physical Unclonable Functions (PUFs) are security primitives used in a number of security applications like authentication, identification, and secure key generation. PUF implementations are evaluated on their security characteristics (uniqueness, randomness, and reliability), as well as conventional VLSI design metrics (area, power, and performance). We compare bi-stable based PUFs (SRAM and sense amplifiers) and delay based PUFs (arbiter and ring oscillator) using measurements from a testchip in 65nm bulk CMOS. Security metrics are measured on multiple dies and reliability measurements are based on multiple evaluations of PUF circuits across operating voltage (1.0V to 1.4V) and temperature (-20°C to 85°C). |
| doi_str_mv | 10.1109/CICC.2012.6330625 |
| format | Conference Proceeding |
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Security metrics are measured on multiple dies and reliability measurements are based on multiple evaluations of PUF circuits across operating voltage (1.0V to 1.4V) and temperature (-20°C to 85°C).</description><subject>Delay</subject><subject>Frequency measurement</subject><subject>Random access memory</subject><subject>Reliability</subject><subject>Security</subject><subject>Temperature measurement</subject><issn>0886-5930</issn><issn>2152-3630</issn><isbn>9781467315555</isbn><isbn>1467315559</isbn><isbn>1467315540</isbn><isbn>9781467315562</isbn><isbn>9781467315548</isbn><isbn>1467315567</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1kM9OAjEYxOu_REAewHjpCxT7tbTbHs1GlASDiXIm37bdWN3tku1y4O0hiqc5zOSXmSHkHvgMgNvHclmWM8FBzLSUXAt1QcYw14UEpeb8kowEKMGklvyKTG1h_j2lrsmIG6OZspLfknHO35yDtUaMSCy7dod9zF2iXU2ryPKAVRMoJk99aPDAKszB0_evQ44OG7pJrunSb2axT26IXcq07ruWtgHzvg9tSEOmMVGtUkurffNDy7f1xx25qbHJYXrWCdksnj_LV7ZavyzLpxWLoPTAilNxrLQ2WNvKWwlSgDXOgNcFOgHB2DkvEJ0R0kuhjPP6tM2BC5wXQsgJefjjxhDCdtfHFvvD9nyZPAI-21rn</recordid><startdate>201209</startdate><enddate>201209</enddate><creator>Bhargava, M.</creator><creator>Cakir, C.</creator><creator>Ken Mai</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201209</creationdate><title>Comparison of bi-stable and delay-based Physical Unclonable Functions from measurements in 65nm bulk CMOS</title><author>Bhargava, M. ; Cakir, C. ; Ken Mai</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i156t-7781ab668af9bd93132198c81d67ac21e89407aac823d3258cd6886c1ce007223</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng ; jpn</language><creationdate>2012</creationdate><topic>Delay</topic><topic>Frequency measurement</topic><topic>Random access memory</topic><topic>Reliability</topic><topic>Security</topic><topic>Temperature measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Bhargava, M.</creatorcontrib><creatorcontrib>Cakir, C.</creatorcontrib><creatorcontrib>Ken Mai</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bhargava, M.</au><au>Cakir, C.</au><au>Ken Mai</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Comparison of bi-stable and delay-based Physical Unclonable Functions from measurements in 65nm bulk CMOS</atitle><btitle>Proceedings of the IEEE 2012 Custom Integrated Circuits Conference</btitle><stitle>CICC</stitle><date>2012-09</date><risdate>2012</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>0886-5930</issn><eissn>2152-3630</eissn><isbn>9781467315555</isbn><isbn>1467315559</isbn><eisbn>1467315540</eisbn><eisbn>9781467315562</eisbn><eisbn>9781467315548</eisbn><eisbn>1467315567</eisbn><abstract>Physical Unclonable Functions (PUFs) are security primitives used in a number of security applications like authentication, identification, and secure key generation. PUF implementations are evaluated on their security characteristics (uniqueness, randomness, and reliability), as well as conventional VLSI design metrics (area, power, and performance). We compare bi-stable based PUFs (SRAM and sense amplifiers) and delay based PUFs (arbiter and ring oscillator) using measurements from a testchip in 65nm bulk CMOS. Security metrics are measured on multiple dies and reliability measurements are based on multiple evaluations of PUF circuits across operating voltage (1.0V to 1.4V) and temperature (-20°C to 85°C).</abstract><pub>IEEE</pub><doi>10.1109/CICC.2012.6330625</doi><tpages>4</tpages></addata></record> |
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| issn | 0886-5930 2152-3630 |
| language | eng ; jpn |
| recordid | cdi_ieee_primary_6330625 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Delay Frequency measurement Random access memory Reliability Security Temperature measurement |
| title | Comparison of bi-stable and delay-based Physical Unclonable Functions from measurements in 65nm bulk CMOS |
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