Delay-line based embedded memory access time measurement: Circuit, implementation and characterization techniques

Embedded memory access time is an important parameter that determines the performance of the memory. To accurately characterize the embedded memory access time across Process, Voltage and Temperature (PVT) variation is always a challenge. In order to get more accurate memory access time data across...

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Bibliographische Detailangaben

Hauptverfasser:	Moo Kit Lee, Wei Khoon Teng, Krishnasamy, R. K., Wei Tee Ng
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	access time measurement Built-in self-test Clocks Delay delay line Delay lines Embedded memory characterization Frequency measurement memory access time Random access memory
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