Photoemission study of CdTe surfaces after low-energy ion treatments
We present a study of low-energy ion surface cleaning treatments and their impact on the surface electronic structure of an air-exposed CdTe thin film treated with CdCl 2 . In order to determine the electronic structure using surface-sensitive photoemission, surfaces need to be free of contaminants....
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| creator | Hanks, D. Weir, M. Horsley, K. Hofmann, T. Weinhardt, L. Bar, M. Barricklow, K. Kobyakov, P. Sampath, W. Heske, C. |
| description | We present a study of low-energy ion surface cleaning treatments and their impact on the surface electronic structure of an air-exposed CdTe thin film treated with CdCl 2 . In order to determine the electronic structure using surface-sensitive photoemission, surfaces need to be free of contaminants. This is achieved by subsequent low-energy ion treatment steps, carefully monitoring the chemical and electronic surface structure. We present data on the valence band maximum (VBM), and core-level binding energies, that suggest that neither preferential sputtering occurs nor metallic states are formed using our cleaning procedure. For a clean CdTe surface, the VBM is determined to be (0.8 ± 0.1) eV below the Fermi energy. |
| doi_str_mv | 10.1109/PVSC.2012.6317643 |
| format | Conference Proceeding |
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In order to determine the electronic structure using surface-sensitive photoemission, surfaces need to be free of contaminants. This is achieved by subsequent low-energy ion treatment steps, carefully monitoring the chemical and electronic surface structure. We present data on the valence band maximum (VBM), and core-level binding energies, that suggest that neither preferential sputtering occurs nor metallic states are formed using our cleaning procedure. For a clean CdTe surface, the VBM is determined to be (0.8 ± 0.1) eV below the Fermi energy.</description><identifier>ISSN: 0160-8371</identifier><identifier>ISBN: 1467300640</identifier><identifier>ISBN: 9781467300643</identifier><identifier>EISBN: 9781467300667</identifier><identifier>EISBN: 1467300667</identifier><identifier>EISBN: 1467300659</identifier><identifier>EISBN: 9781467300650</identifier><identifier>DOI: 10.1109/PVSC.2012.6317643</identifier><language>eng</language><publisher>IEEE</publisher><subject>Argon ; cadmium telluride ; Chemicals ; photoemission ; Spectroscopy ; surface band alignment ; Surface cleaning ; Surface contamination ; surface treatment</subject><ispartof>2012 38th IEEE Photovoltaic Specialists Conference, 2012, p.000396-000399</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6317643$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6317643$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Hanks, D.</creatorcontrib><creatorcontrib>Weir, M.</creatorcontrib><creatorcontrib>Horsley, K.</creatorcontrib><creatorcontrib>Hofmann, T.</creatorcontrib><creatorcontrib>Weinhardt, L.</creatorcontrib><creatorcontrib>Bar, M.</creatorcontrib><creatorcontrib>Barricklow, K.</creatorcontrib><creatorcontrib>Kobyakov, P.</creatorcontrib><creatorcontrib>Sampath, W.</creatorcontrib><creatorcontrib>Heske, C.</creatorcontrib><title>Photoemission study of CdTe surfaces after low-energy ion treatments</title><title>2012 38th IEEE Photovoltaic Specialists Conference</title><addtitle>PVSC</addtitle><description>We present a study of low-energy ion surface cleaning treatments and their impact on the surface electronic structure of an air-exposed CdTe thin film treated with CdCl 2 . In order to determine the electronic structure using surface-sensitive photoemission, surfaces need to be free of contaminants. This is achieved by subsequent low-energy ion treatment steps, carefully monitoring the chemical and electronic surface structure. We present data on the valence band maximum (VBM), and core-level binding energies, that suggest that neither preferential sputtering occurs nor metallic states are formed using our cleaning procedure. For a clean CdTe surface, the VBM is determined to be (0.8 ± 0.1) eV below the Fermi energy.</description><subject>Argon</subject><subject>cadmium telluride</subject><subject>Chemicals</subject><subject>photoemission</subject><subject>Spectroscopy</subject><subject>surface band alignment</subject><subject>Surface cleaning</subject><subject>Surface contamination</subject><subject>surface treatment</subject><issn>0160-8371</issn><isbn>1467300640</isbn><isbn>9781467300643</isbn><isbn>9781467300667</isbn><isbn>1467300667</isbn><isbn>1467300659</isbn><isbn>9781467300650</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1kFFLwzAUhSMquM39APElf6D13qRNmkepToWBA4uvI1lutLK20mRI_72K8-lw4OPAdxi7QsgRwdxsXl_qXACKXEnUqpAnbGl0hYXSEkApfcrm_6WAMzYDVJBVUuMFm8f4ASBAKpyxu837kAbq2hjboecxHfzEh8Br3xCPhzHYHUVuQ6KR74evjHoa3yb-y6aRbOqoT_GSnQe7j7Q85oI1q_umfszWzw9P9e06aw2kTFrnnSmUgp2hKiBaFdA7QcIaIbUw5MvSEWJFrpDCV-TJ_aiVUDjtA8kFu_6bbYlo-zm2nR2n7fEA-Q226U3x</recordid><startdate>201206</startdate><enddate>201206</enddate><creator>Hanks, D.</creator><creator>Weir, M.</creator><creator>Horsley, K.</creator><creator>Hofmann, T.</creator><creator>Weinhardt, L.</creator><creator>Bar, M.</creator><creator>Barricklow, K.</creator><creator>Kobyakov, P.</creator><creator>Sampath, W.</creator><creator>Heske, C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201206</creationdate><title>Photoemission study of CdTe surfaces after low-energy ion treatments</title><author>Hanks, D. ; Weir, M. ; Horsley, K. ; Hofmann, T. ; Weinhardt, L. ; Bar, M. ; Barricklow, K. ; Kobyakov, P. ; Sampath, W. ; Heske, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-3abdb94660c9e8f11a6f1db2e2a923729ed55be118eb432d8edeb643504b7dfe3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Argon</topic><topic>cadmium telluride</topic><topic>Chemicals</topic><topic>photoemission</topic><topic>Spectroscopy</topic><topic>surface band alignment</topic><topic>Surface cleaning</topic><topic>Surface contamination</topic><topic>surface treatment</topic><toplevel>online_resources</toplevel><creatorcontrib>Hanks, D.</creatorcontrib><creatorcontrib>Weir, M.</creatorcontrib><creatorcontrib>Horsley, K.</creatorcontrib><creatorcontrib>Hofmann, T.</creatorcontrib><creatorcontrib>Weinhardt, L.</creatorcontrib><creatorcontrib>Bar, M.</creatorcontrib><creatorcontrib>Barricklow, K.</creatorcontrib><creatorcontrib>Kobyakov, P.</creatorcontrib><creatorcontrib>Sampath, W.</creatorcontrib><creatorcontrib>Heske, C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hanks, D.</au><au>Weir, M.</au><au>Horsley, K.</au><au>Hofmann, T.</au><au>Weinhardt, L.</au><au>Bar, M.</au><au>Barricklow, K.</au><au>Kobyakov, P.</au><au>Sampath, W.</au><au>Heske, C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Photoemission study of CdTe surfaces after low-energy ion treatments</atitle><btitle>2012 38th IEEE Photovoltaic Specialists Conference</btitle><stitle>PVSC</stitle><date>2012-06</date><risdate>2012</risdate><spage>000396</spage><epage>000399</epage><pages>000396-000399</pages><issn>0160-8371</issn><isbn>1467300640</isbn><isbn>9781467300643</isbn><eisbn>9781467300667</eisbn><eisbn>1467300667</eisbn><eisbn>1467300659</eisbn><eisbn>9781467300650</eisbn><abstract>We present a study of low-energy ion surface cleaning treatments and their impact on the surface electronic structure of an air-exposed CdTe thin film treated with CdCl 2 . In order to determine the electronic structure using surface-sensitive photoemission, surfaces need to be free of contaminants. This is achieved by subsequent low-energy ion treatment steps, carefully monitoring the chemical and electronic surface structure. We present data on the valence band maximum (VBM), and core-level binding energies, that suggest that neither preferential sputtering occurs nor metallic states are formed using our cleaning procedure. For a clean CdTe surface, the VBM is determined to be (0.8 ± 0.1) eV below the Fermi energy.</abstract><pub>IEEE</pub><doi>10.1109/PVSC.2012.6317643</doi><tpages>4</tpages></addata></record> |
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| identifier | ISSN: 0160-8371 |
| ispartof | 2012 38th IEEE Photovoltaic Specialists Conference, 2012, p.000396-000399 |
| issn | 0160-8371 |
| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Argon cadmium telluride Chemicals photoemission Spectroscopy surface band alignment Surface cleaning Surface contamination surface treatment |
| title | Photoemission study of CdTe surfaces after low-energy ion treatments |
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