Design and implementation of a new symmetric Built-in Redundancy analyzer

With the advance of VLSI technology and growth of embedded memory density, a corresponding increase in the number of defects has resulted in yield and quality degradation. Built-in Self-Repair (BISR) solves this problem by replacing faulty cells with healthy redundant cells. Built-in Redundancy anal...

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Bibliographische Detailangaben

Hauptverfasser:	Habiby, P., Asli, R. N.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Algorithm design and analysis built-in redundancy analyzer built-in self repair Circuit faults embedded memory Maintenance engineering Memory management Redundancy System-on-a-chip Very large scale integration
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