Sensitivity of identified transfer functions in transformer diagnosis

The performance of a new transformer diagnosis method is tested experimentally. The method is called model-based diagnosis because the diagnosis is based on an identified model of the component, i.e., the transfer function. A single test series is carried out in order to evaluate the sensitivity of...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Mikkelsen, S.D., Bak-Jensen, J., Bak-Jensen, B., Sorensen, J.T.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 537
container_issue
container_start_page 533
container_title
container_volume
creator Mikkelsen, S.D.
Bak-Jensen, J.
Bak-Jensen, B.
Sorensen, J.T.
description The performance of a new transformer diagnosis method is tested experimentally. The method is called model-based diagnosis because the diagnosis is based on an identified model of the component, i.e., the transfer function. A single test series is carried out in order to evaluate the sensitivity of the method in transformer diagnosis. The basic purpose of this sensitivity test series is to determine how close the identified transformer model is connected to the physical condition of the modeled transformer. Based on the results of the sensitivity test series it is concluded that the detection of failures and aging phenomena in transformers by transfer functions is dependent on detectable changes in relatively few characteristic transformer parameters, i.e., basically lumped winding capacitances, total losses and core reluctance.
doi_str_mv 10.1109/EEIC.1993.631251
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_631251</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>631251</ieee_id><sourcerecordid>631251</sourcerecordid><originalsourceid>FETCH-LOGICAL-i172t-cb09f0a3693773bc78c3f1b62cf8c88c2b2c00855224294d6cd0a5c8ff0914873</originalsourceid><addsrcrecordid>eNotj09LxDAUxAMquK57F0_9Aq3vJW3-HKVUXVjwoJ6XNE3kiZtKEoX99hZ25zIwP5hhGLtDaBDBPAzDtm_QGNFIgbzDC3YDSoMA3Sp5yVYICmvJFVyzTc5fsKgV0nRmxYY3HzMV-qNyrOZQ0eRjoUB-qkqyMQefqvAbXaE55oriOZ3TYQET2c84Z8q37CrY7-w3Z1-zj6fhvX-pd6_P2_5xVxMqXmo3gglgl2mhlBid0k4EHCV3QTutHR-5A9Bdx3nLTTtJN4HtnA4BDLZaiTW7P_WS937_k-hg03F_Oi3-AaclS48</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Sensitivity of identified transfer functions in transformer diagnosis</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Mikkelsen, S.D. ; Bak-Jensen, J. ; Bak-Jensen, B. ; Sorensen, J.T.</creator><creatorcontrib>Mikkelsen, S.D. ; Bak-Jensen, J. ; Bak-Jensen, B. ; Sorensen, J.T.</creatorcontrib><description>The performance of a new transformer diagnosis method is tested experimentally. The method is called model-based diagnosis because the diagnosis is based on an identified model of the component, i.e., the transfer function. A single test series is carried out in order to evaluate the sensitivity of the method in transformer diagnosis. The basic purpose of this sensitivity test series is to determine how close the identified transformer model is connected to the physical condition of the modeled transformer. Based on the results of the sensitivity test series it is concluded that the detection of failures and aging phenomena in transformers by transfer functions is dependent on detectable changes in relatively few characteristic transformer parameters, i.e., basically lumped winding capacitances, total losses and core reluctance.</description><identifier>ISSN: 1071-6270</identifier><identifier>ISBN: 0780308476</identifier><identifier>ISBN: 9780780308473</identifier><identifier>DOI: 10.1109/EEIC.1993.631251</identifier><language>eng</language><publisher>IEEE</publisher><subject>Aging ; Frequency ; Power engineering and energy ; Power system faults ; Power system modeling ; Power system reliability ; Reliability engineering ; Testing ; Transfer functions ; Voltage transformers</subject><ispartof>Proceedings of Electrical/Electronics Insulation Conference, 1993, p.533-537</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/631251$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/631251$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Mikkelsen, S.D.</creatorcontrib><creatorcontrib>Bak-Jensen, J.</creatorcontrib><creatorcontrib>Bak-Jensen, B.</creatorcontrib><creatorcontrib>Sorensen, J.T.</creatorcontrib><title>Sensitivity of identified transfer functions in transformer diagnosis</title><title>Proceedings of Electrical/Electronics Insulation Conference</title><addtitle>EEIC</addtitle><description>The performance of a new transformer diagnosis method is tested experimentally. The method is called model-based diagnosis because the diagnosis is based on an identified model of the component, i.e., the transfer function. A single test series is carried out in order to evaluate the sensitivity of the method in transformer diagnosis. The basic purpose of this sensitivity test series is to determine how close the identified transformer model is connected to the physical condition of the modeled transformer. Based on the results of the sensitivity test series it is concluded that the detection of failures and aging phenomena in transformers by transfer functions is dependent on detectable changes in relatively few characteristic transformer parameters, i.e., basically lumped winding capacitances, total losses and core reluctance.</description><subject>Aging</subject><subject>Frequency</subject><subject>Power engineering and energy</subject><subject>Power system faults</subject><subject>Power system modeling</subject><subject>Power system reliability</subject><subject>Reliability engineering</subject><subject>Testing</subject><subject>Transfer functions</subject><subject>Voltage transformers</subject><issn>1071-6270</issn><isbn>0780308476</isbn><isbn>9780780308473</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1993</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj09LxDAUxAMquK57F0_9Aq3vJW3-HKVUXVjwoJ6XNE3kiZtKEoX99hZ25zIwP5hhGLtDaBDBPAzDtm_QGNFIgbzDC3YDSoMA3Sp5yVYICmvJFVyzTc5fsKgV0nRmxYY3HzMV-qNyrOZQ0eRjoUB-qkqyMQefqvAbXaE55oriOZ3TYQET2c84Z8q37CrY7-w3Z1-zj6fhvX-pd6_P2_5xVxMqXmo3gglgl2mhlBid0k4EHCV3QTutHR-5A9Bdx3nLTTtJN4HtnA4BDLZaiTW7P_WS937_k-hg03F_Oi3-AaclS48</recordid><startdate>1993</startdate><enddate>1993</enddate><creator>Mikkelsen, S.D.</creator><creator>Bak-Jensen, J.</creator><creator>Bak-Jensen, B.</creator><creator>Sorensen, J.T.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1993</creationdate><title>Sensitivity of identified transfer functions in transformer diagnosis</title><author>Mikkelsen, S.D. ; Bak-Jensen, J. ; Bak-Jensen, B. ; Sorensen, J.T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-cb09f0a3693773bc78c3f1b62cf8c88c2b2c00855224294d6cd0a5c8ff0914873</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Aging</topic><topic>Frequency</topic><topic>Power engineering and energy</topic><topic>Power system faults</topic><topic>Power system modeling</topic><topic>Power system reliability</topic><topic>Reliability engineering</topic><topic>Testing</topic><topic>Transfer functions</topic><topic>Voltage transformers</topic><toplevel>online_resources</toplevel><creatorcontrib>Mikkelsen, S.D.</creatorcontrib><creatorcontrib>Bak-Jensen, J.</creatorcontrib><creatorcontrib>Bak-Jensen, B.</creatorcontrib><creatorcontrib>Sorensen, J.T.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mikkelsen, S.D.</au><au>Bak-Jensen, J.</au><au>Bak-Jensen, B.</au><au>Sorensen, J.T.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Sensitivity of identified transfer functions in transformer diagnosis</atitle><btitle>Proceedings of Electrical/Electronics Insulation Conference</btitle><stitle>EEIC</stitle><date>1993</date><risdate>1993</risdate><spage>533</spage><epage>537</epage><pages>533-537</pages><issn>1071-6270</issn><isbn>0780308476</isbn><isbn>9780780308473</isbn><abstract>The performance of a new transformer diagnosis method is tested experimentally. The method is called model-based diagnosis because the diagnosis is based on an identified model of the component, i.e., the transfer function. A single test series is carried out in order to evaluate the sensitivity of the method in transformer diagnosis. The basic purpose of this sensitivity test series is to determine how close the identified transformer model is connected to the physical condition of the modeled transformer. Based on the results of the sensitivity test series it is concluded that the detection of failures and aging phenomena in transformers by transfer functions is dependent on detectable changes in relatively few characteristic transformer parameters, i.e., basically lumped winding capacitances, total losses and core reluctance.</abstract><pub>IEEE</pub><doi>10.1109/EEIC.1993.631251</doi><tpages>5</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1071-6270
ispartof Proceedings of Electrical/Electronics Insulation Conference, 1993, p.533-537
issn 1071-6270
language eng
recordid cdi_ieee_primary_631251
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Aging
Frequency
Power engineering and energy
Power system faults
Power system modeling
Power system reliability
Reliability engineering
Testing
Transfer functions
Voltage transformers
title Sensitivity of identified transfer functions in transformer diagnosis
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T04%3A53%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Sensitivity%20of%20identified%20transfer%20functions%20in%20transformer%20diagnosis&rft.btitle=Proceedings%20of%20Electrical/Electronics%20Insulation%20Conference&rft.au=Mikkelsen,%20S.D.&rft.date=1993&rft.spage=533&rft.epage=537&rft.pages=533-537&rft.issn=1071-6270&rft.isbn=0780308476&rft.isbn_list=9780780308473&rft_id=info:doi/10.1109/EEIC.1993.631251&rft_dat=%3Cieee_6IE%3E631251%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=631251&rfr_iscdi=true