Application of avalanche transistors to circuits with a long mean time to failure

This paper intends to give circuit designers a survey of the performance limits of transistors in the avalanche region and show their practical use in reliable long-lived devices. The most important problems encountered when designing special circuits are discussed in detail. In particular, the cond...

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Veröffentlicht in:	IEEE transactions on instrumentation and measurement 1976-06, Vol.IM-25 (2), p.152-160
1. Verfasser:	Herden, W. B.
Format:	Artikel
Sprache:	eng
Schlagworte:	Delay Electric breakdown Integrated circuit reliability Resistance Switching circuits Transistors
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