CST simulation of magnetic field for PCB fault investigation
This paper proposes a feasibility study of using Magnetic field property in detecting defects on printed circuit board (PCB) conductors. Simple microstrip transmission lines have been proposed and modeled as a non-defective line and defective lines in Computer Simulation Technology (CST) Microwave S...
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creator | Socheatra, S. Ali, N. B. Z. Khir, M. H. Md |
description | This paper proposes a feasibility study of using Magnetic field property in detecting defects on printed circuit board (PCB) conductors. Simple microstrip transmission lines have been proposed and modeled as a non-defective line and defective lines in Computer Simulation Technology (CST) Microwave Studio in the purpose to observe the characteristic of magnetic field intensity (H) at 3 mm above the conduction lines. Types of defects that have been brought to study are stuck-at-faults and stuck-open fault. CST simulation has shown that the non-defective line induces a typically constant H field along the conduction line; however the defective lines produce high standing waves of H field at the points of defect. These results provide a very crucial knowledge in using magnetic field to diagnose and locate the defect detection on PCB. |
doi_str_mv | 10.1109/ICIAS.2012.6306228 |
format | Conference Proceeding |
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B. Z. ; Khir, M. H. Md</creator><creatorcontrib>Socheatra, S. ; Ali, N. B. Z. ; Khir, M. H. Md</creatorcontrib><description>This paper proposes a feasibility study of using Magnetic field property in detecting defects on printed circuit board (PCB) conductors. Simple microstrip transmission lines have been proposed and modeled as a non-defective line and defective lines in Computer Simulation Technology (CST) Microwave Studio in the purpose to observe the characteristic of magnetic field intensity (H) at 3 mm above the conduction lines. Types of defects that have been brought to study are stuck-at-faults and stuck-open fault. CST simulation has shown that the non-defective line induces a typically constant H field along the conduction line; however the defective lines produce high standing waves of H field at the points of defect. These results provide a very crucial knowledge in using magnetic field to diagnose and locate the defect detection on PCB.</description><identifier>ISBN: 1457719681</identifier><identifier>ISBN: 9781457719684</identifier><identifier>EISBN: 9781457719660</identifier><identifier>EISBN: 1457719673</identifier><identifier>EISBN: 1457719665</identifier><identifier>EISBN: 9781457719677</identifier><identifier>DOI: 10.1109/ICIAS.2012.6306228</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit faults ; Conductors ; Integrated circuit modeling ; Magnetic fields ; Microstrip ; Microwave circuits ; Testing</subject><ispartof>2012 4th International Conference on Intelligent and Advanced Systems (ICIAS2012), 2012, Vol.1, p.407-411</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6306228$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6306228$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Socheatra, S.</creatorcontrib><creatorcontrib>Ali, N. 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These results provide a very crucial knowledge in using magnetic field to diagnose and locate the defect detection on PCB.</description><subject>Circuit faults</subject><subject>Conductors</subject><subject>Integrated circuit modeling</subject><subject>Magnetic fields</subject><subject>Microstrip</subject><subject>Microwave circuits</subject><subject>Testing</subject><isbn>1457719681</isbn><isbn>9781457719684</isbn><isbn>9781457719660</isbn><isbn>1457719673</isbn><isbn>1457719665</isbn><isbn>9781457719677</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1j9tKxDAURSMiqGN_QF_yA63npOlpAr6MwUthQGH6PqT1ZIj0Im1H8O8VHffLZsFmwRbiGiFDBHtbuWq9zRSgyigHUsqciMSWBnVRlmiJ4FRc_oPBc5HM8zv8xKDRaC7EndvWco79ofNLHAc5Btn7_cBLbGWI3L3JME7y1d3L4A_dIuPwyfMS97_rK3EWfDdzcuyVqB8favecbl6eKrfepNHCkraWoTCUE2EDORQtqkYxGQ5YWGsIbcmtUoQmBLLaW9LsuYHAQZegfL4SN3_ayMy7jyn2fvraHf_m39leR-g</recordid><startdate>201206</startdate><enddate>201206</enddate><creator>Socheatra, S.</creator><creator>Ali, N. B. Z.</creator><creator>Khir, M. H. Md</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201206</creationdate><title>CST simulation of magnetic field for PCB fault investigation</title><author>Socheatra, S. ; Ali, N. B. Z. ; Khir, M. H. Md</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-c9e05863661b0305c12b2e68ef159986197ec22618ff694a964eaeb0fef4702a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Circuit faults</topic><topic>Conductors</topic><topic>Integrated circuit modeling</topic><topic>Magnetic fields</topic><topic>Microstrip</topic><topic>Microwave circuits</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Socheatra, S.</creatorcontrib><creatorcontrib>Ali, N. B. Z.</creatorcontrib><creatorcontrib>Khir, M. H. Md</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Socheatra, S.</au><au>Ali, N. B. Z.</au><au>Khir, M. H. Md</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>CST simulation of magnetic field for PCB fault investigation</atitle><btitle>2012 4th International Conference on Intelligent and Advanced Systems (ICIAS2012)</btitle><stitle>ICIAS</stitle><date>2012-06</date><risdate>2012</risdate><volume>1</volume><spage>407</spage><epage>411</epage><pages>407-411</pages><isbn>1457719681</isbn><isbn>9781457719684</isbn><eisbn>9781457719660</eisbn><eisbn>1457719673</eisbn><eisbn>1457719665</eisbn><eisbn>9781457719677</eisbn><abstract>This paper proposes a feasibility study of using Magnetic field property in detecting defects on printed circuit board (PCB) conductors. Simple microstrip transmission lines have been proposed and modeled as a non-defective line and defective lines in Computer Simulation Technology (CST) Microwave Studio in the purpose to observe the characteristic of magnetic field intensity (H) at 3 mm above the conduction lines. Types of defects that have been brought to study are stuck-at-faults and stuck-open fault. CST simulation has shown that the non-defective line induces a typically constant H field along the conduction line; however the defective lines produce high standing waves of H field at the points of defect. These results provide a very crucial knowledge in using magnetic field to diagnose and locate the defect detection on PCB.</abstract><pub>IEEE</pub><doi>10.1109/ICIAS.2012.6306228</doi><tpages>5</tpages></addata></record> |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Circuit faults Conductors Integrated circuit modeling Magnetic fields Microstrip Microwave circuits Testing |
title | CST simulation of magnetic field for PCB fault investigation |
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