Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory

Despite recent advances in structural test methods, the diagnosis of the root cause of board-level failures for functional tests remains a major challenge. A promising approach to address this problem is to carry out fault diagnosis in two phases-suspect faulty components on the board or modules wit...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on computer-aided design of integrated circuits and systems 2012-10, Vol.31 (10), p.1586-1599
Hauptverfasser:	Hongxia Fang, Chakrabarty, K., Zhiyuan Wang, Xinli Gu
Format:	Artikel
Sprache:	eng
Schlagworte:	Adaptation models Board-level Circuit faults Clocks dataflow analysis Dempster-Shafer (DS) theory diagnosis functional failure Industries Integrated circuit modeling Optimization Reliability
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!