Evaluating performance of manycore processors with various granularities considering yield and lifetime reliability
Performance is one of the most important targets in MPSoC design, and it is affected by a lot of factors, such as area, yield, application, and lifetime. Based on the performance, yield and lifetime reliability modeling and analysis of MPSoC, this work proposes a metric directing how to choose the g...
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| creator | Yueming Yang Zewen Shi Jianming Yu Liulin Zhong Xiaoyang Zeng Zhiyi Yu |
| description | Performance is one of the most important targets in MPSoC design, and it is affected by a lot of factors, such as area, yield, application, and lifetime. Based on the performance, yield and lifetime reliability modeling and analysis of MPSoC, this work proposes a metric directing how to choose the granularity of MPSoC at high level design in order to obtain high performance when yield and lifetime reliability are considered. The results show that, with the given area (300mm 2 ) and certain applications, the optimal performance is obtained at 3×3 mesh, and optimal design becomes 4×4 mesh when yield is considered, and it will prefer 5×5 mesh or 6×6 mesh when lifetime reliability is further considered. |
| doi_str_mv | 10.1109/ISCAS.2012.6271868 |
| format | Conference Proceeding |
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Based on the performance, yield and lifetime reliability modeling and analysis of MPSoC, this work proposes a metric directing how to choose the granularity of MPSoC at high level design in order to obtain high performance when yield and lifetime reliability are considered. The results show that, with the given area (300mm 2 ) and certain applications, the optimal performance is obtained at 3×3 mesh, and optimal design becomes 4×4 mesh when yield is considered, and it will prefer 5×5 mesh or 6×6 mesh when lifetime reliability is further considered.</abstract><pub>IEEE</pub><doi>10.1109/ISCAS.2012.6271868</doi><tpages>4</tpages></addata></record> |
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| identifier | ISSN: 0271-4302 |
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| issn | 0271-4302 2158-1525 |
| language | eng |
| recordid | cdi_ieee_primary_6271868 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Integrated circuit reliability Measurement Program processors Redundancy Reliability engineering Tiles |
| title | Evaluating performance of manycore processors with various granularities considering yield and lifetime reliability |
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