Parametric DC and noise measurements in a unified test & characterization software tool framework
Testing and characterization are fundamental tasks in any semiconductor manufacturing or circuit development activity. These activities call for flexible, yet efficient tools that allow for automated execution. This paper describes the development of an independent Testing Development Environment (T...
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| creator | Rodriguez, Jose A. Jimenez, Manuel Morales, William Fan-Chi Hou Millan, Lucianne Palomera, Rogelio |
| description | Testing and characterization are fundamental tasks in any semiconductor manufacturing or circuit development activity. These activities call for flexible, yet efficient tools that allow for automated execution. This paper describes the development of an independent Testing Development Environment (TDE) as a platform for designing testing and characterization procedures for use in a production line setting. The proposed platform supports DC, parametric, and noise measurement capabilities in a modular, designer customizable library of testing functions. The platform structure, customization protocols, and I/O formats are discussed, along with the process of populating its function library with procedures for evaluating passive and active devices with diverse requirements and formats. Over four dozen testing procedures have been added to the tool. User-level interactions are used to illustrate the easiness of use and flexibility of this platform. |
| doi_str_mv | 10.1109/LATW.2012.6261239 |
| format | Conference Proceeding |
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| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 2373-0862 |
| ispartof | 2012 13th Latin American Test Workshop (LATW), 2012, p.1-6 |
| issn | 2373-0862 |
| language | eng |
| recordid | cdi_ieee_primary_6261239 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Atmospheric measurements Current measurement Device Characterization Libraries Parametric Analysis Particle measurements Performance evaluation Semiconductor device measurement Test Automation Voltage measurement |
| title | Parametric DC and noise measurements in a unified test & characterization software tool framework |
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