Nonlinear behavior of an UHF quartz resonator in an oscillating system
Characterization of a quartz resonator operating at 553 MHz in a closed loop oscillating system has been performed under various drive levels to characterize its nonlinear behavior. The voltage and current were measured across the resonator using differential active probes and used to calculate the...
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| creator | Moyer, H. P. Nagele, R. G. Kubena, R. L. Joyce, R. J. Kirby, D. J. Yong, Y. Brewer, P. D. Chang, D. T. |
| description | Characterization of a quartz resonator operating at 553 MHz in a closed loop oscillating system has been performed under various drive levels to characterize its nonlinear behavior. The voltage and current were measured across the resonator using differential active probes and used to calculate the magnitude of the admittance under drive. Our results show that nonlinear resonator operation widens the bandwidth of low phase noise operation. At the low frequency end of the operating range, where overall phase noise is degraded, phase noise improvement is ~ 20dB. However, the overall phase noise levels do not improve significantly over the linear case. |
| doi_str_mv | 10.1109/FCS.2012.6243670 |
| format | Conference Proceeding |
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P. ; Nagele, R. G. ; Kubena, R. L. ; Joyce, R. J. ; Kirby, D. J. ; Yong, Y. ; Brewer, P. D. ; Chang, D. T.</creator><creatorcontrib>Moyer, H. P. ; Nagele, R. G. ; Kubena, R. L. ; Joyce, R. J. ; Kirby, D. J. ; Yong, Y. ; Brewer, P. D. ; Chang, D. T.</creatorcontrib><description>Characterization of a quartz resonator operating at 553 MHz in a closed loop oscillating system has been performed under various drive levels to characterize its nonlinear behavior. The voltage and current were measured across the resonator using differential active probes and used to calculate the magnitude of the admittance under drive. Our results show that nonlinear resonator operation widens the bandwidth of low phase noise operation. At the low frequency end of the operating range, where overall phase noise is degraded, phase noise improvement is ~ 20dB. However, the overall phase noise levels do not improve significantly over the linear case.</description><identifier>ISSN: 2327-1914</identifier><identifier>ISBN: 1457718219</identifier><identifier>ISBN: 9781457718212</identifier><identifier>EISBN: 1457718200</identifier><identifier>EISBN: 9781457718199</identifier><identifier>EISBN: 9781457718205</identifier><identifier>EISBN: 1457718197</identifier><identifier>DOI: 10.1109/FCS.2012.6243670</identifier><language>eng</language><publisher>IEEE</publisher><subject>Admittance ; Admittance measurement ; DLD ; drive level dependency ; Duffing ; MEMS ; nonlinear dynamics ; Optical resonators ; oscillators ; Phase noise ; Quartz ; Resonant frequency ; resonator ; Voltage measurement</subject><ispartof>2012 IEEE International Frequency Control Symposium Proceedings, 2012, p.1-5</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6243670$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,778,782,787,788,2054,27912,54907</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6243670$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Moyer, H. 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At the low frequency end of the operating range, where overall phase noise is degraded, phase noise improvement is ~ 20dB. However, the overall phase noise levels do not improve significantly over the linear case.</description><subject>Admittance</subject><subject>Admittance measurement</subject><subject>DLD</subject><subject>drive level dependency</subject><subject>Duffing</subject><subject>MEMS</subject><subject>nonlinear dynamics</subject><subject>Optical resonators</subject><subject>oscillators</subject><subject>Phase noise</subject><subject>Quartz</subject><subject>Resonant frequency</subject><subject>resonator</subject><subject>Voltage measurement</subject><issn>2327-1914</issn><isbn>1457718219</isbn><isbn>9781457718212</isbn><isbn>1457718200</isbn><isbn>9781457718199</isbn><isbn>9781457718205</isbn><isbn>1457718197</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFkEFLxDAUhCMquK57F7zkD7TmJWnSHKVYV1j04HpeXtu3GummmlRh_fVWXHAuM8MHcxjGLkHkAMJd19VTLgXI3EitjBVH7Bx0YS2UUojj_wLuhM2kkjYDB_qMLVJ6E5NsCVDAjNUPQ-h9IIy8oVf88kPkw5Zj4M_Lmn98Yhy_eaQ0BBwn5MMvGlLr-x5HH1542qeRdhfsdIt9osXB52xd366rZbZ6vLuvblaZd2LMHArjnLZla6S1nRIIpjVloZ02RouGdIOKOqNgioZKRFO4rulItlAK3ag5u_qb9US0eY9-h3G_OVygfgBFj0y8</recordid><startdate>201205</startdate><enddate>201205</enddate><creator>Moyer, H. 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J.</creatorcontrib><creatorcontrib>Yong, Y.</creatorcontrib><creatorcontrib>Brewer, P. D.</creatorcontrib><creatorcontrib>Chang, D. T.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Moyer, H. P.</au><au>Nagele, R. G.</au><au>Kubena, R. L.</au><au>Joyce, R. J.</au><au>Kirby, D. J.</au><au>Yong, Y.</au><au>Brewer, P. D.</au><au>Chang, D. T.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Nonlinear behavior of an UHF quartz resonator in an oscillating system</atitle><btitle>2012 IEEE International Frequency Control Symposium Proceedings</btitle><stitle>FCS</stitle><date>2012-05</date><risdate>2012</risdate><spage>1</spage><epage>5</epage><pages>1-5</pages><issn>2327-1914</issn><isbn>1457718219</isbn><isbn>9781457718212</isbn><eisbn>1457718200</eisbn><eisbn>9781457718199</eisbn><eisbn>9781457718205</eisbn><eisbn>1457718197</eisbn><abstract>Characterization of a quartz resonator operating at 553 MHz in a closed loop oscillating system has been performed under various drive levels to characterize its nonlinear behavior. The voltage and current were measured across the resonator using differential active probes and used to calculate the magnitude of the admittance under drive. Our results show that nonlinear resonator operation widens the bandwidth of low phase noise operation. At the low frequency end of the operating range, where overall phase noise is degraded, phase noise improvement is ~ 20dB. However, the overall phase noise levels do not improve significantly over the linear case.</abstract><pub>IEEE</pub><doi>10.1109/FCS.2012.6243670</doi><tpages>5</tpages></addata></record> |
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| identifier | ISSN: 2327-1914 |
| ispartof | 2012 IEEE International Frequency Control Symposium Proceedings, 2012, p.1-5 |
| issn | 2327-1914 |
| language | eng |
| recordid | cdi_ieee_primary_6243670 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Admittance Admittance measurement DLD drive level dependency Duffing MEMS nonlinear dynamics Optical resonators oscillators Phase noise Quartz Resonant frequency resonator Voltage measurement |
| title | Nonlinear behavior of an UHF quartz resonator in an oscillating system |
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