Improving defect localization techniques with laser beam with specific analysis and set-up modules
This paper describes a way to improve commonly used static laser stimulation techniques. Several analysis and set-up modules are presented to enrich them. Quickly assembled, combinable and easily adaptable, they allow for example to face atypical failure analysis cases. Effectiveness of this methodo...
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| creator | Llido, R. Gomez, J. Goubier, V. Haller, G. Pouget, V. Lewis, D. |
| description | This paper describes a way to improve commonly used static laser stimulation techniques. Several analysis and set-up modules are presented to enrich them. Quickly assembled, combinable and easily adaptable, they allow for example to face atypical failure analysis cases. Effectiveness of this methodology is verified by two cases study. The proposed methodology further extends the capabilities of Laser Stimulation techniques in debug design and characterization domains. |
| doi_str_mv | 10.1109/IRPS.2012.6241903 |
| format | Conference Proceeding |
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The proposed methodology further extends the capabilities of Laser Stimulation techniques in debug design and characterization domains.</description><subject>Current measurement</subject><subject>Debug Design</subject><subject>Failure analysis</subject><subject>Heating</subject><subject>Laser applications</subject><subject>Measurement by laser beam</subject><subject>Power supplies</subject><subject>Static Laser Stimulation</subject><issn>1541-7026</issn><issn>1938-1891</issn><isbn>145771678X</isbn><isbn>9781457716782</isbn><isbn>1457716801</isbn><isbn>9781457716799</isbn><isbn>9781457716805</isbn><isbn>1457716798</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9UMtKAzEUjS-w1n6AuMkPTM3Nc7KUYrVQULQLdyWT3tjIvJxMlfr1DrR4NucFZ3EIuQE2BWD2bvH68jblDPhUcwmWiRNyBVIZAzpncEpGYEWeQW7h7L8w-fv5UCgJmWFcX5JJSp9sgMmBSzEixaJqu-Y71h90gwF9T8vGuzL-uj42Ne3Rb-v4tcNEf2K_paVL2NECXXXwqUUfQ_TU1a7cp5gGsaEJ-2zX0qrZ7EpM1-QiuDLh5Mhjspo_rGZP2fL5cTG7X2bRsj5zuZHB6sKjF9JZyQy3wUOhQYZCB1UMgUJu0QiluNICrSsYZ6id80GhGJPbw2xExHXbxcp1-_XxKvEHr7xa5w</recordid><startdate>201204</startdate><enddate>201204</enddate><creator>Llido, R.</creator><creator>Gomez, J.</creator><creator>Goubier, V.</creator><creator>Haller, G.</creator><creator>Pouget, V.</creator><creator>Lewis, D.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201204</creationdate><title>Improving defect localization techniques with laser beam with specific analysis and set-up modules</title><author>Llido, R. ; Gomez, J. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-a874f96bcec34a940729fc1b614fb6f5b0725e29e73552563e9ab020e6aacf5e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Current measurement</topic><topic>Debug Design</topic><topic>Failure analysis</topic><topic>Heating</topic><topic>Laser applications</topic><topic>Measurement by laser beam</topic><topic>Power supplies</topic><topic>Static Laser Stimulation</topic><toplevel>online_resources</toplevel><creatorcontrib>Llido, R.</creatorcontrib><creatorcontrib>Gomez, J.</creatorcontrib><creatorcontrib>Goubier, V.</creatorcontrib><creatorcontrib>Haller, G.</creatorcontrib><creatorcontrib>Pouget, V.</creatorcontrib><creatorcontrib>Lewis, D.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Llido, R.</au><au>Gomez, J.</au><au>Goubier, V.</au><au>Haller, G.</au><au>Pouget, V.</au><au>Lewis, D.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Improving defect localization techniques with laser beam with specific analysis and set-up modules</atitle><btitle>2012 IEEE International Reliability Physics Symposium (IRPS)</btitle><stitle>IRPS</stitle><date>2012-04</date><risdate>2012</risdate><spage>FA.2.1</spage><epage>FA.2.5</epage><pages>FA.2.1-FA.2.5</pages><issn>1541-7026</issn><eissn>1938-1891</eissn><isbn>145771678X</isbn><isbn>9781457716782</isbn><eisbn>1457716801</eisbn><eisbn>9781457716799</eisbn><eisbn>9781457716805</eisbn><eisbn>1457716798</eisbn><abstract>This paper describes a way to improve commonly used static laser stimulation techniques. Several analysis and set-up modules are presented to enrich them. Quickly assembled, combinable and easily adaptable, they allow for example to face atypical failure analysis cases. Effectiveness of this methodology is verified by two cases study. The proposed methodology further extends the capabilities of Laser Stimulation techniques in debug design and characterization domains.</abstract><pub>IEEE</pub><doi>10.1109/IRPS.2012.6241903</doi></addata></record> |
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| identifier | ISSN: 1541-7026 |
| ispartof | 2012 IEEE International Reliability Physics Symposium (IRPS), 2012, p.FA.2.1-FA.2.5 |
| issn | 1541-7026 1938-1891 |
| language | eng |
| recordid | cdi_ieee_primary_6241903 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Current measurement Debug Design Failure analysis Heating Laser applications Measurement by laser beam Power supplies Static Laser Stimulation |
| title | Improving defect localization techniques with laser beam with specific analysis and set-up modules |
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