A predictive bottom-up hierarchical approach to digital system reliability

This work has introduced a new electrical aging assessment framework for digital systems, based upon strong physics-based foundations and an adequate bottom-up approach which enables propagating accurate reliability knowledge at system level. This work opens new ways to optimize high level digital s...

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Hauptverfasser:	Huard, V., Pion, E., Cacho, F., Croain, D., Robert, V., Delater, R., Mergault, P., Engels, S., Flatresse, P., Amador, N. R., Anghel, L.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	aging assessment framework composite model Degradation derate margin Engineering Sciences gate models HCI Human computer interaction Integrated circuit reliability Logic gates Mathematical model Micro and nanotechnologies Microelectronics NBTI operating lifetests reaction-diffusion model reliability signal probability system-on-chip Timing
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Beschreibung
Zusammenfassung:	This work has introduced a new electrical aging assessment framework for digital systems, based upon strong physics-based foundations and an adequate bottom-up approach which enables propagating accurate reliability knowledge at system level. This work opens new ways to optimize high level digital systems with respect to aging with great accuracy.
ISSN:	1541-7026 1938-1891
DOI:	10.1109/IRPS.2012.6241830