Design and Performance Evaluation of a 200 °C Interleaved Boost Converter
Recent advances in silicon carbide (SiC) power semiconductor technology and resulting availability of SiC Schottky rectifiers and controlled devices (bipolar junction transistors, JFETs, and MOSFETs) make it possible to design and implement power converters capable of operating at 200 °C. The design...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on power electronics 2013-04, Vol.28 (4), p.1691-1699 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 1699 |
---|---|
container_issue | 4 |
container_start_page | 1691 |
container_title | IEEE transactions on power electronics |
container_volume | 28 |
creator | Kosai, Hiroyuki Scofield, James McNeal, Seana Jordan, Brett Ray, Biswajit |
description | Recent advances in silicon carbide (SiC) power semiconductor technology and resulting availability of SiC Schottky rectifiers and controlled devices (bipolar junction transistors, JFETs, and MOSFETs) make it possible to design and implement power converters capable of operating at 200 °C. The design, prototype development, operation, and testing of a 74 kHz, 2 kW, 100 V/270 V inversely coupled, interleaved, dc-dc boost converter over the 20-200 °C temperature range is presented in this paper. The advantages of coupled-inductor interleaved boost converters include increased efficiency, reduced size, reduced electromagnetic emission, faster transient response, and improved reliability. Optimization of a high temperature X-perm core-based coupled inductor architecture, in terms of ac flux balancing and dc flux cancellation is discussed. DC characterization of SiC power devices used in the design (Schottky rectifier and JFET) over the 20-200 °C temperature range is presented as well. The power stage of the converter, including the power semiconductor devices, coupled inductor, and X7R ceramic input and output filter capacitors, was placed inside a temperature controlled chamber for testing. JFET gate drive circuit, input power source, and output load were external to the environmental chamber. Converter testing and performance evaluation was accomplished over a 20-200 °C ambient temperature range. As expected, JFET conduction loss increased and converter efficiency decreased with increasing temperatures. The drop in converter efficiency was in the range of 2%-4% over the entire load (200 W to 2 kW) and temperature (20-200 °C) ranges evaluated. At 200 °C, output voltage ripple increased by ∼60% due to the rapid decline in X7R capacitance at the high-temperature extreme. The results obtained during this study suggest that the realization of 200 °C power converters is feasible through a judicious selection of power semiconductor devices, magnetic core materials, and capacitor dielectrics. As a result, high temperature, frequency, and power density converters are expected to be a reality in the near future. |
doi_str_mv | 10.1109/TPEL.2012.2208124 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_6237535</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6237535</ieee_id><sourcerecordid>2801681891</sourcerecordid><originalsourceid>FETCH-LOGICAL-c274t-3f987c2ddcc2d756437eaa4a28465e6140771a259cad034e712739e96f49020d3</originalsourceid><addsrcrecordid>eNo9kNtKw0AQhhdRsB4eQLxZ8Dp1Zo_ZS41VKwV7Ua_Dkkwkpc3W3bTgW_kMPpkpLd7MD8P3z8DH2A3CGBHc_WI-mY0FoBgLATkKdcJG6BRmgGBP2QjyXGe5c_KcXaS0BEClAUfs7YlS-9lx39V8TrEJce27ivhk51db37eh46HhngsA_vtT8GnXU1yR31HNH0NIPS9Ct6M4bK_YWeNXia6Peck-nieL4jWbvb9Mi4dZVgmr-kw2LreVqOtqGFYbJS15r7zIldFkUIG16IV2la9BKrIorHTkTKMcCKjlJbs73N3E8LWl1JfLsI3d8LJERG2cBmMGCg9UFUNKkZpyE9u1j98lQrlXVu6VlXtl5VHZ0Lk9dFoi-ueNkFZLLf8AHNplwg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1115695066</pqid></control><display><type>article</type><title>Design and Performance Evaluation of a 200 °C Interleaved Boost Converter</title><source>IEEE Electronic Library (IEL)</source><creator>Kosai, Hiroyuki ; Scofield, James ; McNeal, Seana ; Jordan, Brett ; Ray, Biswajit</creator><creatorcontrib>Kosai, Hiroyuki ; Scofield, James ; McNeal, Seana ; Jordan, Brett ; Ray, Biswajit</creatorcontrib><description>Recent advances in silicon carbide (SiC) power semiconductor technology and resulting availability of SiC Schottky rectifiers and controlled devices (bipolar junction transistors, JFETs, and MOSFETs) make it possible to design and implement power converters capable of operating at 200 °C. The design, prototype development, operation, and testing of a 74 kHz, 2 kW, 100 V/270 V inversely coupled, interleaved, dc-dc boost converter over the 20-200 °C temperature range is presented in this paper. The advantages of coupled-inductor interleaved boost converters include increased efficiency, reduced size, reduced electromagnetic emission, faster transient response, and improved reliability. Optimization of a high temperature X-perm core-based coupled inductor architecture, in terms of ac flux balancing and dc flux cancellation is discussed. DC characterization of SiC power devices used in the design (Schottky rectifier and JFET) over the 20-200 °C temperature range is presented as well. The power stage of the converter, including the power semiconductor devices, coupled inductor, and X7R ceramic input and output filter capacitors, was placed inside a temperature controlled chamber for testing. JFET gate drive circuit, input power source, and output load were external to the environmental chamber. Converter testing and performance evaluation was accomplished over a 20-200 °C ambient temperature range. As expected, JFET conduction loss increased and converter efficiency decreased with increasing temperatures. The drop in converter efficiency was in the range of 2%-4% over the entire load (200 W to 2 kW) and temperature (20-200 °C) ranges evaluated. At 200 °C, output voltage ripple increased by ∼60% due to the rapid decline in X7R capacitance at the high-temperature extreme. The results obtained during this study suggest that the realization of 200 °C power converters is feasible through a judicious selection of power semiconductor devices, magnetic core materials, and capacitor dielectrics. As a result, high temperature, frequency, and power density converters are expected to be a reality in the near future.</description><identifier>ISSN: 0885-8993</identifier><identifier>EISSN: 1941-0107</identifier><identifier>DOI: 10.1109/TPEL.2012.2208124</identifier><identifier>CODEN: ITPEE8</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Coupled inductor ; dc/dc converter ; Electromagnetics ; High temperature ; Inductors ; interleaved boost converter (IBC) ; JFETs ; Magnetic cores ; Optimization ; Performance evaluation ; Power supply ; Schottky diodes ; Silicon carbide ; silicon carbide (SiC) ; Temperature measurement ; Transistors ; Windings</subject><ispartof>IEEE transactions on power electronics, 2013-04, Vol.28 (4), p.1691-1699</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Apr 2013</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c274t-3f987c2ddcc2d756437eaa4a28465e6140771a259cad034e712739e96f49020d3</citedby><cites>FETCH-LOGICAL-c274t-3f987c2ddcc2d756437eaa4a28465e6140771a259cad034e712739e96f49020d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6237535$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6237535$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kosai, Hiroyuki</creatorcontrib><creatorcontrib>Scofield, James</creatorcontrib><creatorcontrib>McNeal, Seana</creatorcontrib><creatorcontrib>Jordan, Brett</creatorcontrib><creatorcontrib>Ray, Biswajit</creatorcontrib><title>Design and Performance Evaluation of a 200 °C Interleaved Boost Converter</title><title>IEEE transactions on power electronics</title><addtitle>TPEL</addtitle><description>Recent advances in silicon carbide (SiC) power semiconductor technology and resulting availability of SiC Schottky rectifiers and controlled devices (bipolar junction transistors, JFETs, and MOSFETs) make it possible to design and implement power converters capable of operating at 200 °C. The design, prototype development, operation, and testing of a 74 kHz, 2 kW, 100 V/270 V inversely coupled, interleaved, dc-dc boost converter over the 20-200 °C temperature range is presented in this paper. The advantages of coupled-inductor interleaved boost converters include increased efficiency, reduced size, reduced electromagnetic emission, faster transient response, and improved reliability. Optimization of a high temperature X-perm core-based coupled inductor architecture, in terms of ac flux balancing and dc flux cancellation is discussed. DC characterization of SiC power devices used in the design (Schottky rectifier and JFET) over the 20-200 °C temperature range is presented as well. The power stage of the converter, including the power semiconductor devices, coupled inductor, and X7R ceramic input and output filter capacitors, was placed inside a temperature controlled chamber for testing. JFET gate drive circuit, input power source, and output load were external to the environmental chamber. Converter testing and performance evaluation was accomplished over a 20-200 °C ambient temperature range. As expected, JFET conduction loss increased and converter efficiency decreased with increasing temperatures. The drop in converter efficiency was in the range of 2%-4% over the entire load (200 W to 2 kW) and temperature (20-200 °C) ranges evaluated. At 200 °C, output voltage ripple increased by ∼60% due to the rapid decline in X7R capacitance at the high-temperature extreme. The results obtained during this study suggest that the realization of 200 °C power converters is feasible through a judicious selection of power semiconductor devices, magnetic core materials, and capacitor dielectrics. As a result, high temperature, frequency, and power density converters are expected to be a reality in the near future.</description><subject>Coupled inductor</subject><subject>dc/dc converter</subject><subject>Electromagnetics</subject><subject>High temperature</subject><subject>Inductors</subject><subject>interleaved boost converter (IBC)</subject><subject>JFETs</subject><subject>Magnetic cores</subject><subject>Optimization</subject><subject>Performance evaluation</subject><subject>Power supply</subject><subject>Schottky diodes</subject><subject>Silicon carbide</subject><subject>silicon carbide (SiC)</subject><subject>Temperature measurement</subject><subject>Transistors</subject><subject>Windings</subject><issn>0885-8993</issn><issn>1941-0107</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kNtKw0AQhhdRsB4eQLxZ8Dp1Zo_ZS41VKwV7Ua_Dkkwkpc3W3bTgW_kMPpkpLd7MD8P3z8DH2A3CGBHc_WI-mY0FoBgLATkKdcJG6BRmgGBP2QjyXGe5c_KcXaS0BEClAUfs7YlS-9lx39V8TrEJce27ivhk51db37eh46HhngsA_vtT8GnXU1yR31HNH0NIPS9Ct6M4bK_YWeNXia6Peck-nieL4jWbvb9Mi4dZVgmr-kw2LreVqOtqGFYbJS15r7zIldFkUIG16IV2la9BKrIorHTkTKMcCKjlJbs73N3E8LWl1JfLsI3d8LJERG2cBmMGCg9UFUNKkZpyE9u1j98lQrlXVu6VlXtl5VHZ0Lk9dFoi-ueNkFZLLf8AHNplwg</recordid><startdate>201304</startdate><enddate>201304</enddate><creator>Kosai, Hiroyuki</creator><creator>Scofield, James</creator><creator>McNeal, Seana</creator><creator>Jordan, Brett</creator><creator>Ray, Biswajit</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope></search><sort><creationdate>201304</creationdate><title>Design and Performance Evaluation of a 200 °C Interleaved Boost Converter</title><author>Kosai, Hiroyuki ; Scofield, James ; McNeal, Seana ; Jordan, Brett ; Ray, Biswajit</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c274t-3f987c2ddcc2d756437eaa4a28465e6140771a259cad034e712739e96f49020d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Coupled inductor</topic><topic>dc/dc converter</topic><topic>Electromagnetics</topic><topic>High temperature</topic><topic>Inductors</topic><topic>interleaved boost converter (IBC)</topic><topic>JFETs</topic><topic>Magnetic cores</topic><topic>Optimization</topic><topic>Performance evaluation</topic><topic>Power supply</topic><topic>Schottky diodes</topic><topic>Silicon carbide</topic><topic>silicon carbide (SiC)</topic><topic>Temperature measurement</topic><topic>Transistors</topic><topic>Windings</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kosai, Hiroyuki</creatorcontrib><creatorcontrib>Scofield, James</creatorcontrib><creatorcontrib>McNeal, Seana</creatorcontrib><creatorcontrib>Jordan, Brett</creatorcontrib><creatorcontrib>Ray, Biswajit</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on power electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kosai, Hiroyuki</au><au>Scofield, James</au><au>McNeal, Seana</au><au>Jordan, Brett</au><au>Ray, Biswajit</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Design and Performance Evaluation of a 200 °C Interleaved Boost Converter</atitle><jtitle>IEEE transactions on power electronics</jtitle><stitle>TPEL</stitle><date>2013-04</date><risdate>2013</risdate><volume>28</volume><issue>4</issue><spage>1691</spage><epage>1699</epage><pages>1691-1699</pages><issn>0885-8993</issn><eissn>1941-0107</eissn><coden>ITPEE8</coden><abstract>Recent advances in silicon carbide (SiC) power semiconductor technology and resulting availability of SiC Schottky rectifiers and controlled devices (bipolar junction transistors, JFETs, and MOSFETs) make it possible to design and implement power converters capable of operating at 200 °C. The design, prototype development, operation, and testing of a 74 kHz, 2 kW, 100 V/270 V inversely coupled, interleaved, dc-dc boost converter over the 20-200 °C temperature range is presented in this paper. The advantages of coupled-inductor interleaved boost converters include increased efficiency, reduced size, reduced electromagnetic emission, faster transient response, and improved reliability. Optimization of a high temperature X-perm core-based coupled inductor architecture, in terms of ac flux balancing and dc flux cancellation is discussed. DC characterization of SiC power devices used in the design (Schottky rectifier and JFET) over the 20-200 °C temperature range is presented as well. The power stage of the converter, including the power semiconductor devices, coupled inductor, and X7R ceramic input and output filter capacitors, was placed inside a temperature controlled chamber for testing. JFET gate drive circuit, input power source, and output load were external to the environmental chamber. Converter testing and performance evaluation was accomplished over a 20-200 °C ambient temperature range. As expected, JFET conduction loss increased and converter efficiency decreased with increasing temperatures. The drop in converter efficiency was in the range of 2%-4% over the entire load (200 W to 2 kW) and temperature (20-200 °C) ranges evaluated. At 200 °C, output voltage ripple increased by ∼60% due to the rapid decline in X7R capacitance at the high-temperature extreme. The results obtained during this study suggest that the realization of 200 °C power converters is feasible through a judicious selection of power semiconductor devices, magnetic core materials, and capacitor dielectrics. As a result, high temperature, frequency, and power density converters are expected to be a reality in the near future.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TPEL.2012.2208124</doi><tpages>9</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0885-8993 |
ispartof | IEEE transactions on power electronics, 2013-04, Vol.28 (4), p.1691-1699 |
issn | 0885-8993 1941-0107 |
language | eng |
recordid | cdi_ieee_primary_6237535 |
source | IEEE Electronic Library (IEL) |
subjects | Coupled inductor dc/dc converter Electromagnetics High temperature Inductors interleaved boost converter (IBC) JFETs Magnetic cores Optimization Performance evaluation Power supply Schottky diodes Silicon carbide silicon carbide (SiC) Temperature measurement Transistors Windings |
title | Design and Performance Evaluation of a 200 °C Interleaved Boost Converter |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T04%3A11%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Design%20and%20Performance%20Evaluation%20of%20a%20200%20%C2%B0C%20Interleaved%20Boost%20Converter&rft.jtitle=IEEE%20transactions%20on%20power%20electronics&rft.au=Kosai,%20Hiroyuki&rft.date=2013-04&rft.volume=28&rft.issue=4&rft.spage=1691&rft.epage=1699&rft.pages=1691-1699&rft.issn=0885-8993&rft.eissn=1941-0107&rft.coden=ITPEE8&rft_id=info:doi/10.1109/TPEL.2012.2208124&rft_dat=%3Cproquest_RIE%3E2801681891%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1115695066&rft_id=info:pmid/&rft_ieee_id=6237535&rfr_iscdi=true |