On-chip delay measurement circuit

A novel On-chip delay measurement circuit is presented which is suitable for wide applications involving on-chip measurements, monitoring and process compensation. The circuit is based upon multiple characterization units consisting of ring oscillator, latches and counter. The delay unit used in rin...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Jain, A., Veggetti, A., Crippa, D., Rolandi, P.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	characterization circuit Delay delay fault Latches measurement circuit on-chip measurement Pulse measurements Radiation detectors Ring oscillators Semiconductor device measurement Transmission line measurements
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