Apparatus for 2d electron energy analysis in high-power beams
The presented analyzer of electron beam characteristics Soffron60 was designed for operation with GESA electron-beam material-treatment facilities, and can be used at machines with similar characteristics (~60 kV, ~100 A, ~100 μs, 0.1 T). The apparatus allows to determine spectra of two electron ene...
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| creator | Arkhipov, A. Mishin, M. Mueller, G. Sominski, G. |
| description | The presented analyzer of electron beam characteristics Soffron60 was designed for operation with GESA electron-beam material-treatment facilities, and can be used at machines with similar characteristics (~60 kV, ~100 A, ~100 μs, 0.1 T). The apparatus allows to determine spectra of two electron energy components with resolution in space and time. Axial energy distributions are measured with electric cut-off method. Transverse component of energy is determined from the effect of additionally introduced magnetic field on the cut-off curves. The developed set-up was tested with 60 keV, 1-10 A/cm 2 , 100 μs electron beam from a thermionic cathode. Analyzer performance was found to comply with digital simulation results and design parameters. |
| format | Conference Proceeding |
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The apparatus allows to determine spectra of two electron energy components with resolution in space and time. Axial energy distributions are measured with electric cut-off method. Transverse component of energy is determined from the effect of additionally introduced magnetic field on the cut-off curves. The developed set-up was tested with 60 keV, 1-10 A/cm 2 , 100 μs electron beam from a thermionic cathode. 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The apparatus allows to determine spectra of two electron energy components with resolution in space and time. Axial energy distributions are measured with electric cut-off method. Transverse component of energy is determined from the effect of additionally introduced magnetic field on the cut-off curves. The developed set-up was tested with 60 keV, 1-10 A/cm 2 , 100 μs electron beam from a thermionic cathode. Analyzer performance was found to comply with digital simulation results and design parameters.</description><subject>Cathodes</subject><subject>Electric potential</subject><subject>Testing</subject><isbn>5879110885</isbn><isbn>9785879110883</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotzLtqwzAUAFBBKbRN8wVd9AOGqytZjyFDCH1BoEv2cC3dJAqObSSX4r_v0E5nO3fiqfUuKAXetw9iXesVAFSwTnt8FJvtNFGh-bvK01gkJsk9x7mMg-SBy3mRNFC_1FxlHuQlny_NNP5wkR3TrT6L-xP1ldf_rsTh7fWw-2j2X--fu-2-yQHmxhFr47rkAQyx12A7H5laHU1A7wyyTmiiDhQTh8gYEzqnnEUwEJTTK_Hy12ZmPk4l36gsR4sIVnn9C3p9QFU</recordid><startdate>200407</startdate><enddate>200407</enddate><creator>Arkhipov, A.</creator><creator>Mishin, M.</creator><creator>Mueller, G.</creator><creator>Sominski, G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200407</creationdate><title>Apparatus for 2d electron energy analysis in high-power beams</title><author>Arkhipov, A. ; Mishin, M. ; Mueller, G. ; Sominski, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-7ae347bd8004ae8306b8cea53c4928742e3d24c39acde9ce2cd27717620409173</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Cathodes</topic><topic>Electric potential</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Arkhipov, A.</creatorcontrib><creatorcontrib>Mishin, M.</creatorcontrib><creatorcontrib>Mueller, G.</creatorcontrib><creatorcontrib>Sominski, G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Arkhipov, A.</au><au>Mishin, M.</au><au>Mueller, G.</au><au>Sominski, G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Apparatus for 2d electron energy analysis in high-power beams</atitle><btitle>2004 International Conference on High-Power Particle Beams (BEAMS 2004)</btitle><stitle>BEAMS</stitle><date>2004-07</date><risdate>2004</risdate><spage>601</spage><epage>604</epage><pages>601-604</pages><isbn>5879110885</isbn><isbn>9785879110883</isbn><abstract>The presented analyzer of electron beam characteristics Soffron60 was designed for operation with GESA electron-beam material-treatment facilities, and can be used at machines with similar characteristics (~60 kV, ~100 A, ~100 μs, 0.1 T). The apparatus allows to determine spectra of two electron energy components with resolution in space and time. Axial energy distributions are measured with electric cut-off method. Transverse component of energy is determined from the effect of additionally introduced magnetic field on the cut-off curves. The developed set-up was tested with 60 keV, 1-10 A/cm 2 , 100 μs electron beam from a thermionic cathode. Analyzer performance was found to comply with digital simulation results and design parameters.</abstract><pub>IEEE</pub><tpages>4</tpages></addata></record> |
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| ispartof | 2004 International Conference on High-Power Particle Beams (BEAMS 2004), 2004, p.601-604 |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Cathodes Electric potential Testing |
| title | Apparatus for 2d electron energy analysis in high-power beams |
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