Fine grain fault tolerance - A key to high reliability for FPGAs in space

Nowadays using SRAM-based FPGAs in space missions due to their flexibility and reprogrammability is on focus. In contrary, they are effective against radiation effects and need new trends in reliability issues. This paper concerns fine grain views to mitigation problem in FPGAs. For new FPGA generat...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Niknahad, M., Sander, O., Becker, J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Clocks Fault tolerant systems Field programmable gate arrays Random access memory Redundancy Tunneling magnetoresistance
Online-Zugang:	Volltext bestellen
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