Quick characterization method of current-matching-status for large area (1.1∗1.3m) high efficiency a-Si/uc-Si tandem solar module
In this work, we have proposed a universal and easy characterization methodology to quickly clarify Current Matching status of large area (1.3*1.1 m) a-Si/ uc-Si tandem-junction photovoltaic modules, which accounts on the analysis of the evolution trends of Isc, Rsh, and FF values. While moving matc...
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creator | Chuang Kai-Hsiang Chih-Hsiung Lin Kun-Chih Lin Chin-Yao Tsai |
description | In this work, we have proposed a universal and easy characterization methodology to quickly clarify Current Matching status of large area (1.3*1.1 m) a-Si/ uc-Si tandem-junction photovoltaic modules, which accounts on the analysis of the evolution trends of Isc, Rsh, and FF values. While moving matching status from bottom-limit status across the matching point toward top-limit status, Isc will increase and finally saturate and FF will reach the local minimal value around the current-matching point. Furthermore, the increase of Rsh is, the first time, proposed as an indicative parameter for judging current matching status. Different experiments are provided to testify this methodology and theoretical explanation is given. With Auria's patented Moon Technology, the extremely high Rsh value (>;10 4 Ω) is obtained, which further improves the applicability of this methodology as an effective monitoring tool in mass production. |
doi_str_mv | 10.1109/PVSC.2011.6186403 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6186403</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6186403</ieee_id><sourcerecordid>6186403</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-794e3e14036df557121b29726a5560897d3fb52838b9fbd27037ce0ece5609703</originalsourceid><addsrcrecordid>eNpVkE1OwzAQhY0ACVR6AMTGS1gk9cSJHS9RxZ9UCVArtpXjjBtDkyDHWZQtG27A_TgJluiGWbzR06cZ6T1CzoGlAEzNnl6W8zRjAKmAUuSMH5CpkiXkWZ4rJXJ1-M8LfkROGQiWlFzCCZkOwyuLIxmP7JR8Po_OvFHTaK9NQO8-dHB9R1sMTV_T3lIzeo9dSFodTOO6TTIEHcaB2t7TrfYbpNqjppeQws_XN6S8vaKN2zQUrXXGYWd2VCdLNxtNVBp0V2NLhz7e0ravxy2ekWOrtwNO93tCVrc3q_l9sni8e5hfLxKnWEikypEjxMSitkUhIYMqUzITuigEK5Wsua2KrORlpWxVZzGhNMjQYMQqugm5-HvrEHH97l2r_W69b5H_ApRKY8k</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Quick characterization method of current-matching-status for large area (1.1∗1.3m) high efficiency a-Si/uc-Si tandem solar module</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Chuang Kai-Hsiang ; Chih-Hsiung Lin ; Kun-Chih Lin ; Chin-Yao Tsai</creator><creatorcontrib>Chuang Kai-Hsiang ; Chih-Hsiung Lin ; Kun-Chih Lin ; Chin-Yao Tsai</creatorcontrib><description>In this work, we have proposed a universal and easy characterization methodology to quickly clarify Current Matching status of large area (1.3*1.1 m) a-Si/ uc-Si tandem-junction photovoltaic modules, which accounts on the analysis of the evolution trends of Isc, Rsh, and FF values. While moving matching status from bottom-limit status across the matching point toward top-limit status, Isc will increase and finally saturate and FF will reach the local minimal value around the current-matching point. Furthermore, the increase of Rsh is, the first time, proposed as an indicative parameter for judging current matching status. Different experiments are provided to testify this methodology and theoretical explanation is given. With Auria's patented Moon Technology, the extremely high Rsh value (>;10 4 Ω) is obtained, which further improves the applicability of this methodology as an effective monitoring tool in mass production.</description><identifier>ISSN: 0160-8371</identifier><identifier>ISBN: 9781424499663</identifier><identifier>ISBN: 1424499666</identifier><identifier>EISBN: 9781424499649</identifier><identifier>EISBN: 142449964X</identifier><identifier>EISBN: 9781424499656</identifier><identifier>EISBN: 1424499658</identifier><identifier>DOI: 10.1109/PVSC.2011.6186403</identifier><language>eng</language><publisher>IEEE</publisher><subject>Encapsulation ; Photovoltaic cells ; Photovoltaic systems ; Resistance ; Silicon</subject><ispartof>2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.002247-002250</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6186403$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,778,782,787,788,2054,27912,54907</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6186403$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chuang Kai-Hsiang</creatorcontrib><creatorcontrib>Chih-Hsiung Lin</creatorcontrib><creatorcontrib>Kun-Chih Lin</creatorcontrib><creatorcontrib>Chin-Yao Tsai</creatorcontrib><title>Quick characterization method of current-matching-status for large area (1.1∗1.3m) high efficiency a-Si/uc-Si tandem solar module</title><title>2011 37th IEEE Photovoltaic Specialists Conference</title><addtitle>PVSC</addtitle><description>In this work, we have proposed a universal and easy characterization methodology to quickly clarify Current Matching status of large area (1.3*1.1 m) a-Si/ uc-Si tandem-junction photovoltaic modules, which accounts on the analysis of the evolution trends of Isc, Rsh, and FF values. While moving matching status from bottom-limit status across the matching point toward top-limit status, Isc will increase and finally saturate and FF will reach the local minimal value around the current-matching point. Furthermore, the increase of Rsh is, the first time, proposed as an indicative parameter for judging current matching status. Different experiments are provided to testify this methodology and theoretical explanation is given. With Auria's patented Moon Technology, the extremely high Rsh value (>;10 4 Ω) is obtained, which further improves the applicability of this methodology as an effective monitoring tool in mass production.</description><subject>Encapsulation</subject><subject>Photovoltaic cells</subject><subject>Photovoltaic systems</subject><subject>Resistance</subject><subject>Silicon</subject><issn>0160-8371</issn><isbn>9781424499663</isbn><isbn>1424499666</isbn><isbn>9781424499649</isbn><isbn>142449964X</isbn><isbn>9781424499656</isbn><isbn>1424499658</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVkE1OwzAQhY0ACVR6AMTGS1gk9cSJHS9RxZ9UCVArtpXjjBtDkyDHWZQtG27A_TgJluiGWbzR06cZ6T1CzoGlAEzNnl6W8zRjAKmAUuSMH5CpkiXkWZ4rJXJ1-M8LfkROGQiWlFzCCZkOwyuLIxmP7JR8Po_OvFHTaK9NQO8-dHB9R1sMTV_T3lIzeo9dSFodTOO6TTIEHcaB2t7TrfYbpNqjppeQws_XN6S8vaKN2zQUrXXGYWd2VCdLNxtNVBp0V2NLhz7e0ravxy2ekWOrtwNO93tCVrc3q_l9sni8e5hfLxKnWEikypEjxMSitkUhIYMqUzITuigEK5Wsua2KrORlpWxVZzGhNMjQYMQqugm5-HvrEHH97l2r_W69b5H_ApRKY8k</recordid><startdate>201106</startdate><enddate>201106</enddate><creator>Chuang Kai-Hsiang</creator><creator>Chih-Hsiung Lin</creator><creator>Kun-Chih Lin</creator><creator>Chin-Yao Tsai</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201106</creationdate><title>Quick characterization method of current-matching-status for large area (1.1∗1.3m) high efficiency a-Si/uc-Si tandem solar module</title><author>Chuang Kai-Hsiang ; Chih-Hsiung Lin ; Kun-Chih Lin ; Chin-Yao Tsai</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-794e3e14036df557121b29726a5560897d3fb52838b9fbd27037ce0ece5609703</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Encapsulation</topic><topic>Photovoltaic cells</topic><topic>Photovoltaic systems</topic><topic>Resistance</topic><topic>Silicon</topic><toplevel>online_resources</toplevel><creatorcontrib>Chuang Kai-Hsiang</creatorcontrib><creatorcontrib>Chih-Hsiung Lin</creatorcontrib><creatorcontrib>Kun-Chih Lin</creatorcontrib><creatorcontrib>Chin-Yao Tsai</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chuang Kai-Hsiang</au><au>Chih-Hsiung Lin</au><au>Kun-Chih Lin</au><au>Chin-Yao Tsai</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Quick characterization method of current-matching-status for large area (1.1∗1.3m) high efficiency a-Si/uc-Si tandem solar module</atitle><btitle>2011 37th IEEE Photovoltaic Specialists Conference</btitle><stitle>PVSC</stitle><date>2011-06</date><risdate>2011</risdate><spage>002247</spage><epage>002250</epage><pages>002247-002250</pages><issn>0160-8371</issn><isbn>9781424499663</isbn><isbn>1424499666</isbn><eisbn>9781424499649</eisbn><eisbn>142449964X</eisbn><eisbn>9781424499656</eisbn><eisbn>1424499658</eisbn><abstract>In this work, we have proposed a universal and easy characterization methodology to quickly clarify Current Matching status of large area (1.3*1.1 m) a-Si/ uc-Si tandem-junction photovoltaic modules, which accounts on the analysis of the evolution trends of Isc, Rsh, and FF values. While moving matching status from bottom-limit status across the matching point toward top-limit status, Isc will increase and finally saturate and FF will reach the local minimal value around the current-matching point. Furthermore, the increase of Rsh is, the first time, proposed as an indicative parameter for judging current matching status. Different experiments are provided to testify this methodology and theoretical explanation is given. With Auria's patented Moon Technology, the extremely high Rsh value (>;10 4 Ω) is obtained, which further improves the applicability of this methodology as an effective monitoring tool in mass production.</abstract><pub>IEEE</pub><doi>10.1109/PVSC.2011.6186403</doi><tpages>4</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Encapsulation Photovoltaic cells Photovoltaic systems Resistance Silicon |
title | Quick characterization method of current-matching-status for large area (1.1∗1.3m) high efficiency a-Si/uc-Si tandem solar module |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T21%3A09%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Quick%20characterization%20method%20of%20current-matching-status%20for%20large%20area%20(1.1%E2%88%971.3m)%20high%20efficiency%20a-Si/uc-Si%20tandem%20solar%20module&rft.btitle=2011%2037th%20IEEE%20Photovoltaic%20Specialists%20Conference&rft.au=Chuang%20Kai-Hsiang&rft.date=2011-06&rft.spage=002247&rft.epage=002250&rft.pages=002247-002250&rft.issn=0160-8371&rft.isbn=9781424499663&rft.isbn_list=1424499666&rft_id=info:doi/10.1109/PVSC.2011.6186403&rft_dat=%3Cieee_6IE%3E6186403%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424499649&rft.eisbn_list=142449964X&rft.eisbn_list=9781424499656&rft.eisbn_list=1424499658&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6186403&rfr_iscdi=true |