Accurate CIGS composition measurements using surface analytical techniques

Conversion efficiency for Cu(In x , Ga 1-x )Se 2 is dependent on a number of factors including band-gap and defect structures. Material composition affects band gap and it affects the formation of defect structures. A fundamental understanding of the relationship between material composition, band g...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Mount, G., Moskito, J., Sharma, U., Strossman, G., Wang, L., Schnabel, P., Buyuklimanli, T., Putyera, K.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Accuracy Atomic measurements Copper Substrates X-ray scattering
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!