Analog fault diagnosis by inverse problem technique
A novel algorithm for detecting soft faults in linear analog circuits based on the inverse problem concept is proposed. The proposed approach utilizes optimization techniques with the aid of sensitivity analysis. The main contribution of this work is to apply the inverse problem technique to estimat...
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| creator | Ahmed, R. F. Radwan, A. G. Madian, A. H. Soliman, A. M. |
| description | A novel algorithm for detecting soft faults in linear analog circuits based on the inverse problem concept is proposed. The proposed approach utilizes optimization techniques with the aid of sensitivity analysis. The main contribution of this work is to apply the inverse problem technique to estimate the actual parameter values of the tested circuit and so, to detect and diagnose single fault in analog circuits. The validation of the algorithm is illustrated through applying it to Sallen-Key second order band pass filter and the results show that the detecting percentage efficiency was 100% and also, the maximum error percentage of estimating the parameter values is 0.7%. This technique can be applied to any other linear circuit and it also can be extended to be applied to non-linear circuits. |
| doi_str_mv | 10.1109/ICM.2011.6177361 |
| format | Conference Proceeding |
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M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ahmed, R. F.</au><au>Radwan, A. G.</au><au>Madian, A. H.</au><au>Soliman, A. M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Analog fault diagnosis by inverse problem technique</atitle><btitle>ICM 2011 Proceeding</btitle><stitle>ICM</stitle><date>2011-12</date><risdate>2011</risdate><spage>1</spage><epage>5</epage><pages>1-5</pages><issn>2159-1660</issn><isbn>9781457722073</isbn><isbn>1457722070</isbn><eisbn>1457722097</eisbn><eisbn>9781457722080</eisbn><eisbn>1457722089</eisbn><eisbn>9781457722097</eisbn><abstract>A novel algorithm for detecting soft faults in linear analog circuits based on the inverse problem concept is proposed. The proposed approach utilizes optimization techniques with the aid of sensitivity analysis. The main contribution of this work is to apply the inverse problem technique to estimate the actual parameter values of the tested circuit and so, to detect and diagnose single fault in analog circuits. The validation of the algorithm is illustrated through applying it to Sallen-Key second order band pass filter and the results show that the detecting percentage efficiency was 100% and also, the maximum error percentage of estimating the parameter values is 0.7%. This technique can be applied to any other linear circuit and it also can be extended to be applied to non-linear circuits.</abstract><pub>IEEE</pub><doi>10.1109/ICM.2011.6177361</doi><tpages>5</tpages></addata></record> |
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| subjects | Decision support systems |
| title | Analog fault diagnosis by inverse problem technique |
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