Power loss measurement based on transient temperature rise
A calorimetric method for the determination of losses by means of transient temperature rise is applied to a basic switching cell. The method generally offers a very short measuring time in combination with high accuracy. However, an appropriate characterization of the set-up is crucial which usuall...
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| creator | Kuebrich, D. Goettle, J. Duerbaum, T. |
| description | A calorimetric method for the determination of losses by means of transient temperature rise is applied to a basic switching cell. The method generally offers a very short measuring time in combination with high accuracy. However, an appropriate characterization of the set-up is crucial which usually implies a large effort. Hence, a simplified thermal model is introduced which minimizes this effort while still obtaining a high accuracy. In addition an elaborate but easy to use calibration and determination procedure is proposed. The result is a power loss measurement method based on calorimetry with a degree of accuracy which could be hardly reached by an electrical measurement. In comparison to common calorimetric methods the measurement time can be dramatically reduced. The method is used to verify predicted losses of a PFC boost converter. |
| doi_str_mv | 10.1109/APEC.2012.6166065 |
| format | Conference Proceeding |
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The method generally offers a very short measuring time in combination with high accuracy. However, an appropriate characterization of the set-up is crucial which usually implies a large effort. Hence, a simplified thermal model is introduced which minimizes this effort while still obtaining a high accuracy. In addition an elaborate but easy to use calibration and determination procedure is proposed. The result is a power loss measurement method based on calorimetry with a degree of accuracy which could be hardly reached by an electrical measurement. In comparison to common calorimetric methods the measurement time can be dramatically reduced. 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The method generally offers a very short measuring time in combination with high accuracy. However, an appropriate characterization of the set-up is crucial which usually implies a large effort. Hence, a simplified thermal model is introduced which minimizes this effort while still obtaining a high accuracy. In addition an elaborate but easy to use calibration and determination procedure is proposed. The result is a power loss measurement method based on calorimetry with a degree of accuracy which could be hardly reached by an electrical measurement. In comparison to common calorimetric methods the measurement time can be dramatically reduced. The method is used to verify predicted losses of a PFC boost converter.</description><subject>Calibration</subject><subject>Heating</subject><subject>Loss measurement</subject><subject>Power measurement</subject><subject>Semiconductor device measurement</subject><subject>Switches</subject><subject>Temperature measurement</subject><issn>1048-2334</issn><issn>2470-6647</issn><isbn>9781457712159</isbn><isbn>1457712156</isbn><isbn>1457712164</isbn><isbn>9781457712142</isbn><isbn>9781457712166</isbn><isbn>1457712148</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1kEtLw0AUhccXmNb-AHGTP5B47zzuJO5KqQ8o2IWuy0zmBiJNUmYi4r-3Yl2dw_kOZ3GEuEUoEaG-X27Xq1ICypKQCMiciRlqYy1KJH0uMqktFETaXohFbat_ZupLkSHoqpBK6WsxS-kDQCqLlImH7fjFMd-PKeU9u_QZuedhyr1LHPJxyKfohtT9RhP3B45uOlby2CW-EVet2ydenHQu3h_Xb6vnYvP69LJabooOrZkKJhUq00DldYOBjHehZbZe-hpsIE0BsEHtPYB2UnqPrKFVTrFxDR_dXNz97XbMvDvErnfxe3f6QP0AridMoQ</recordid><startdate>201202</startdate><enddate>201202</enddate><creator>Kuebrich, D.</creator><creator>Goettle, J.</creator><creator>Duerbaum, T.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201202</creationdate><title>Power loss measurement based on transient temperature rise</title><author>Kuebrich, D. ; Goettle, J. ; Duerbaum, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-e63d85c08b4c1d65badfee7b2b907d646d01c14bb004a22bb1e40f3a3e5ace0f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Calibration</topic><topic>Heating</topic><topic>Loss measurement</topic><topic>Power measurement</topic><topic>Semiconductor device measurement</topic><topic>Switches</topic><topic>Temperature measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Kuebrich, D.</creatorcontrib><creatorcontrib>Goettle, J.</creatorcontrib><creatorcontrib>Duerbaum, T.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kuebrich, D.</au><au>Goettle, J.</au><au>Duerbaum, T.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Power loss measurement based on transient temperature rise</atitle><btitle>2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC)</btitle><stitle>APEC</stitle><date>2012-02</date><risdate>2012</risdate><spage>1797</spage><epage>1801</epage><pages>1797-1801</pages><issn>1048-2334</issn><eissn>2470-6647</eissn><isbn>9781457712159</isbn><isbn>1457712156</isbn><eisbn>1457712164</eisbn><eisbn>9781457712142</eisbn><eisbn>9781457712166</eisbn><eisbn>1457712148</eisbn><abstract>A calorimetric method for the determination of losses by means of transient temperature rise is applied to a basic switching cell. The method generally offers a very short measuring time in combination with high accuracy. However, an appropriate characterization of the set-up is crucial which usually implies a large effort. Hence, a simplified thermal model is introduced which minimizes this effort while still obtaining a high accuracy. In addition an elaborate but easy to use calibration and determination procedure is proposed. The result is a power loss measurement method based on calorimetry with a degree of accuracy which could be hardly reached by an electrical measurement. In comparison to common calorimetric methods the measurement time can be dramatically reduced. The method is used to verify predicted losses of a PFC boost converter.</abstract><pub>IEEE</pub><doi>10.1109/APEC.2012.6166065</doi><tpages>5</tpages></addata></record> |
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| ispartof | 2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC), 2012, p.1797-1801 |
| issn | 1048-2334 2470-6647 |
| language | eng |
| recordid | cdi_ieee_primary_6166065 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Calibration Heating Loss measurement Power measurement Semiconductor device measurement Switches Temperature measurement |
| title | Power loss measurement based on transient temperature rise |
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