Validation of nano-CMOS Predictive Technology Model tool on NanoHUB.org
Predictive Technology Model (PTM) files estimate the behavior of sub-micron transistors. They are generated by scaling down from larger known technology nodes. Since PTM's can be used in conjunction with CAD programs, circuit designers are able to characterize nano-CMOS circuits even before the...
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| creator | Rodriguez, A. Huq, H. F. |
| description | Predictive Technology Model (PTM) files estimate the behavior of sub-micron transistors. They are generated by scaling down from larger known technology nodes. Since PTM's can be used in conjunction with CAD programs, circuit designers are able to characterize nano-CMOS circuits even before the technology is available for manufacturing. To facilitate the extraction of PTM's, online tools such as the Nano-CMOS tool on NanoHUB.org are available free to the public. This tool allows a user to automatically generate a model card by adjusting 10 parameters. Modifying the temperature parameter gives a new look into how sub-micron transistors will behave at high temperature. |
| doi_str_mv | 10.1109/NANO.2011.6144424 |
| format | Conference Proceeding |
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F.</creator><creatorcontrib>Rodriguez, A. ; Huq, H. F.</creatorcontrib><description>Predictive Technology Model (PTM) files estimate the behavior of sub-micron transistors. They are generated by scaling down from larger known technology nodes. Since PTM's can be used in conjunction with CAD programs, circuit designers are able to characterize nano-CMOS circuits even before the technology is available for manufacturing. To facilitate the extraction of PTM's, online tools such as the Nano-CMOS tool on NanoHUB.org are available free to the public. This tool allows a user to automatically generate a model card by adjusting 10 parameters. 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F.</creatorcontrib><title>Validation of nano-CMOS Predictive Technology Model tool on NanoHUB.org</title><title>2011 11th IEEE International Conference on Nanotechnology</title><addtitle>NANO</addtitle><description>Predictive Technology Model (PTM) files estimate the behavior of sub-micron transistors. They are generated by scaling down from larger known technology nodes. Since PTM's can be used in conjunction with CAD programs, circuit designers are able to characterize nano-CMOS circuits even before the technology is available for manufacturing. To facilitate the extraction of PTM's, online tools such as the Nano-CMOS tool on NanoHUB.org are available free to the public. This tool allows a user to automatically generate a model card by adjusting 10 parameters. Modifying the temperature parameter gives a new look into how sub-micron transistors will behave at high temperature.</description><subject>CMOS</subject><subject>CMOS integrated circuits</subject><subject>Integrated circuit modeling</subject><subject>predictive modeling</subject><subject>Propagation delay</subject><subject>Semiconductor device modeling</subject><subject>SPICE</subject><subject>temperature</subject><subject>Temperature dependence</subject><subject>Transistors</subject><issn>1944-9399</issn><issn>1944-9380</issn><isbn>9781457715143</isbn><isbn>1457715147</isbn><isbn>9781457715167</isbn><isbn>1457715163</isbn><isbn>1457715155</isbn><isbn>9781457715150</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVUNtKw0AUXLUFS80HiC_7A4l7spdkH2vQVmgTwehr2eylrsSsJEHo3xuxCJ6Xw5k5MwyD0DWQBIDI23JVVklKABIBjLGUnaFIZjkwnmXAQWTnaAGSsVjSnFz84xid_XFSztHsx-YSRcPwTqYRQjICC7R-Va03avShw8HhTnUhLnbVM37qrfF69F8W11a_daENhyPeBWNbPIbQ4klQTt-bl7sk9IcrNHeqHWx02ktUP9zXxSbeVuvHYrWNvSRjbB3LLSUsN2mjOFE6dwS0dtPpUulIOgXOnQZOBE2h4azRE-isaaRonOF0iW5-bb21dv_Z-w_VH_encug3rEZRsg</recordid><startdate>201108</startdate><enddate>201108</enddate><creator>Rodriguez, A.</creator><creator>Huq, H. F.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201108</creationdate><title>Validation of nano-CMOS Predictive Technology Model tool on NanoHUB.org</title><author>Rodriguez, A. ; Huq, H. F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-ef48e3048d2ba50ac8f01ccfd2bf29f021948fc1506321b54bcf02fedb96bfd53</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>CMOS</topic><topic>CMOS integrated circuits</topic><topic>Integrated circuit modeling</topic><topic>predictive modeling</topic><topic>Propagation delay</topic><topic>Semiconductor device modeling</topic><topic>SPICE</topic><topic>temperature</topic><topic>Temperature dependence</topic><topic>Transistors</topic><toplevel>online_resources</toplevel><creatorcontrib>Rodriguez, A.</creatorcontrib><creatorcontrib>Huq, H. F.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rodriguez, A.</au><au>Huq, H. F.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Validation of nano-CMOS Predictive Technology Model tool on NanoHUB.org</atitle><btitle>2011 11th IEEE International Conference on Nanotechnology</btitle><stitle>NANO</stitle><date>2011-08</date><risdate>2011</risdate><spage>469</spage><epage>472</epage><pages>469-472</pages><issn>1944-9399</issn><eissn>1944-9380</eissn><isbn>9781457715143</isbn><isbn>1457715147</isbn><eisbn>9781457715167</eisbn><eisbn>1457715163</eisbn><eisbn>1457715155</eisbn><eisbn>9781457715150</eisbn><abstract>Predictive Technology Model (PTM) files estimate the behavior of sub-micron transistors. They are generated by scaling down from larger known technology nodes. Since PTM's can be used in conjunction with CAD programs, circuit designers are able to characterize nano-CMOS circuits even before the technology is available for manufacturing. To facilitate the extraction of PTM's, online tools such as the Nano-CMOS tool on NanoHUB.org are available free to the public. This tool allows a user to automatically generate a model card by adjusting 10 parameters. Modifying the temperature parameter gives a new look into how sub-micron transistors will behave at high temperature.</abstract><pub>IEEE</pub><doi>10.1109/NANO.2011.6144424</doi><tpages>4</tpages></addata></record> |
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| identifier | ISSN: 1944-9399 |
| ispartof | 2011 11th IEEE International Conference on Nanotechnology, 2011, p.469-472 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | CMOS CMOS integrated circuits Integrated circuit modeling predictive modeling Propagation delay Semiconductor device modeling SPICE temperature Temperature dependence Transistors |
| title | Validation of nano-CMOS Predictive Technology Model tool on NanoHUB.org |
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