Waveguide detection of radiation from a random sheet of nanowires
Contactless high-frequency information about nanowires is obtained by placing patterned sheets of oriented wires on a dielectric insert that partially fills a rectangular waveguide. Exact expressions for the fields within the guide are derived by treating the nanowire sheet within the partially-fill...
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creator | Crowne, F. J. Birdwell, G. O'Regan, T. |
description | Contactless high-frequency information about nanowires is obtained by placing patterned sheets of oriented wires on a dielectric insert that partially fills a rectangular waveguide. Exact expressions for the fields within the guide are derived by treating the nanowire sheet within the partially-filled guide as an impedance boundary condition at the air-dielectric interface. Because the partially filled guide mixes TM and TE modes of an empty rectangular guide in a specific way, the S-parameters of a segment of such a guide are sensitive to the presence of the coated air-dielectric interface, whose surface impedance can be de-embedded from the measurements. Effects of disorder in wire orientation and location on the surface can be included in the surface impedance description and the de-embedding procedure. |
doi_str_mv | 10.1109/ISDRS.2011.6135333 |
format | Conference Proceeding |
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J.</creatorcontrib><creatorcontrib>Birdwell, G.</creatorcontrib><creatorcontrib>O'Regan, T.</creatorcontrib><title>Waveguide detection of radiation from a random sheet of nanowires</title><title>2011 International Semiconductor Device Research Symposium (ISDRS)</title><addtitle>ISDRS</addtitle><description>Contactless high-frequency information about nanowires is obtained by placing patterned sheets of oriented wires on a dielectric insert that partially fills a rectangular waveguide. Exact expressions for the fields within the guide are derived by treating the nanowire sheet within the partially-filled guide as an impedance boundary condition at the air-dielectric interface. Because the partially filled guide mixes TM and TE modes of an empty rectangular guide in a specific way, the S-parameters of a segment of such a guide are sensitive to the presence of the coated air-dielectric interface, whose surface impedance can be de-embedded from the measurements. Effects of disorder in wire orientation and location on the surface can be included in the surface impedance description and the de-embedding procedure.</description><subject>Impedance</subject><subject>Nanowires</subject><subject>Surface impedance</subject><subject>Surface treatment</subject><subject>Surface waves</subject><subject>Waveguide components</subject><subject>Wires</subject><isbn>9781457717550</isbn><isbn>1457717557</isbn><isbn>9781457717543</isbn><isbn>1457717549</isbn><isbn>1457717565</isbn><isbn>9781457717567</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVT8tKw0AUHRFBafMDuskPJN6ZO4_MstRHCwWhLbgst5k7OmITSaLi3xu1G8_mPDgcOEJcSiilBH-93NysN6UCKUsr0SDiici8q6Q2zklnNJ7-8wbORdb3LzDCWu8sXojZI33w03sKnAceuB5S2-RtzDsKiX5N7NpDTmPQhFH0z8zDT6Ghpv1MHfdTcRbptefsyBOxvbvdzhfF6uF-OZ-tiuRhKCof6z1pMKYircA5VMEEHZFsqCXsjQbvfGCL45PKemLFpMBwJOtRaZyIq7_ZxMy7ty4dqPvaHX_jN8xLSvc</recordid><startdate>201112</startdate><enddate>201112</enddate><creator>Crowne, F. 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J.</creatorcontrib><creatorcontrib>Birdwell, G.</creatorcontrib><creatorcontrib>O'Regan, T.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Crowne, F. J.</au><au>Birdwell, G.</au><au>O'Regan, T.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Waveguide detection of radiation from a random sheet of nanowires</atitle><btitle>2011 International Semiconductor Device Research Symposium (ISDRS)</btitle><stitle>ISDRS</stitle><date>2011-12</date><risdate>2011</risdate><spage>1</spage><epage>1</epage><pages>1-1</pages><isbn>9781457717550</isbn><isbn>1457717557</isbn><eisbn>9781457717543</eisbn><eisbn>1457717549</eisbn><eisbn>1457717565</eisbn><eisbn>9781457717567</eisbn><abstract>Contactless high-frequency information about nanowires is obtained by placing patterned sheets of oriented wires on a dielectric insert that partially fills a rectangular waveguide. Exact expressions for the fields within the guide are derived by treating the nanowire sheet within the partially-filled guide as an impedance boundary condition at the air-dielectric interface. Because the partially filled guide mixes TM and TE modes of an empty rectangular guide in a specific way, the S-parameters of a segment of such a guide are sensitive to the presence of the coated air-dielectric interface, whose surface impedance can be de-embedded from the measurements. Effects of disorder in wire orientation and location on the surface can be included in the surface impedance description and the de-embedding procedure.</abstract><pub>IEEE</pub><doi>10.1109/ISDRS.2011.6135333</doi><tpages>1</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Impedance Nanowires Surface impedance Surface treatment Surface waves Waveguide components Wires |
title | Waveguide detection of radiation from a random sheet of nanowires |
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