Enhanced angle sensitive pixels for light field imaging

Enhanced angle sensitive pixels for light field imaging

Previously demonstrated angle sensitive pixels (ASPs) have been shown to enable integrated digital light-field imaging in CMOS, but suffer from significantly reduced pixel quantum efficiency and increased sensor size. This work demonstrates ASP devices that use phase gratings and a pair of interleav...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Sivaramakrishnan, S., Wang, A., Gill, P. R., Molnar, A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
CMOS integrated circuits
Diffraction
Diffraction gratings
Gratings
Image sensors
Metals
Photodiodes
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Previously demonstrated angle sensitive pixels (ASPs) have been shown to enable integrated digital light-field imaging in CMOS, but suffer from significantly reduced pixel quantum efficiency and increased sensor size. This work demonstrates ASP devices that use phase gratings and a pair of interleaved diodes to double pixel density and improve quantum efficiency by a factor of 4.
ISSN:0163-1918
2156-017X
DOI:10.1109/IEDM.2011.6131516