CARMEN-2: In flight observation of non destructive single event phenomena on memories

CARMEN-2: In flight observation of non destructive single event phenomena on memories

This paper presents non destructive SEE data collected in flight on commercial SRAMs, SSRAMs and SDRAMs by MEX module. Detected events are SEU, MCU, SEFI as well as weakened cell. MEX (Module Experience) is a part of CARMEN2 instrument, launched the 22th of June 2008 aboard JASON2 satellite (1335km,...

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Hauptverfasser: Samaras, A., Bezerra, F., Lorfevre, E., Ecoffet, R.
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Sprache:eng
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CARMEN2
Cyclotrons
Instruments
MCU
memory sensitive
Protons
SDRAM
SEE
SEFI
SEU
Single event upset
weakened cell
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Bezerra, F.
Lorfevre, E.
Ecoffet, R.
description This paper presents non destructive SEE data collected in flight on commercial SRAMs, SSRAMs and SDRAMs by MEX module. Detected events are SEU, MCU, SEFI as well as weakened cell. MEX (Module Experience) is a part of CARMEN2 instrument, launched the 22th of June 2008 aboard JASON2 satellite (1335km, 66°). This scientific instrument is dedicated to the study of space radiation effects on electronic devices.
doi_str_mv 10.1109/RADECS.2011.6131314
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subjects CARMEN2
Cyclotrons
Instruments
MCU
memory sensitive
Protons
SDRAM
SEE
SEFI
SEU
Single event upset
weakened cell
title CARMEN-2: In flight observation of non destructive single event phenomena on memories
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