Development of the data acquisition system for the 32-channel electrical capacitance volume tomography
Electrical Capacitance Volume Tomography (ECVT) is one of three-dimensional image visualization method using capacitance effect. This paper describes a data acquisition system for 32-channel electrical capacitance volume tomography based on CMOS switch technology and charge-discharge system. Test re...
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| creator | Yusuf, A. Widada, W. Warsito, W. |
| description | Electrical Capacitance Volume Tomography (ECVT) is one of three-dimensional image visualization method using capacitance effect. This paper describes a data acquisition system for 32-channel electrical capacitance volume tomography based on CMOS switch technology and charge-discharge system. Test results show the data acquisition system capable to measure of a novel capacitance with 0.21 fF to 0.42 fF resolution. Data rates of this system are four frames per second for 32 channels. |
| doi_str_mv | 10.1109/TENCON.2011.6129118 |
| format | Conference Proceeding |
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This paper describes a data acquisition system for 32-channel electrical capacitance volume tomography based on CMOS switch technology and charge-discharge system. Test results show the data acquisition system capable to measure of a novel capacitance with 0.21 fF to 0.42 fF resolution. 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This paper describes a data acquisition system for 32-channel electrical capacitance volume tomography based on CMOS switch technology and charge-discharge system. Test results show the data acquisition system capable to measure of a novel capacitance with 0.21 fF to 0.42 fF resolution. Data rates of this system are four frames per second for 32 channels.</description><subject>Capacitance</subject><subject>Capacitance measurement</subject><subject>CMOS switch</subject><subject>Data acquisition</subject><subject>ECVT</subject><subject>Electrodes</subject><subject>Image reconstruction</subject><subject>Multiplexing</subject><subject>resolution</subject><subject>Tomography</subject><issn>2159-3442</issn><issn>2159-3450</issn><isbn>9781457702563</isbn><isbn>1457702568</isbn><isbn>9781457702556</isbn><isbn>145770255X</isbn><isbn>9781457702549</isbn><isbn>1457702541</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpV0MtOwzAUBFDzkqhKv6Ab_0CKrx3H8RKV8pCqdlPW1Y1zTY3yInEr5e9BUCExm1kcaRbD2BzEAkDY-91qs9xuFlIALDKQFiC_YDNrcki1MUJqnV2yiQRtE5VqcfXPMnX9Z6m8ZbNh-BDfyUSegpgw_0gnqtqupiby1vN4IF5iRI7u8xiGEEPb8GEcItXct_2PK5m4AzYNVZwqcrEPDivusEMXIjaO-KmtjjXx2Nbte4_dYbxjNx6rgWbnnrK3p9Vu-ZKst8-vy4d1EsDomJhCaVtmQipn00IjoDbC-dKDLYzMvFYFaTBYSGtKiejQeCgytDZ3ZU6FmrL5724gon3Xhxr7cX9-TX0BgdledQ</recordid><startdate>201111</startdate><enddate>201111</enddate><creator>Yusuf, A.</creator><creator>Widada, W.</creator><creator>Warsito, W.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201111</creationdate><title>Development of the data acquisition system for the 32-channel electrical capacitance volume tomography</title><author>Yusuf, A. ; Widada, W. ; Warsito, W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-7b359d6023c94b5a1a570cfdf19b726f53be517ab297d2aaca7f1b6a998cd8eb3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Capacitance</topic><topic>Capacitance measurement</topic><topic>CMOS switch</topic><topic>Data acquisition</topic><topic>ECVT</topic><topic>Electrodes</topic><topic>Image reconstruction</topic><topic>Multiplexing</topic><topic>resolution</topic><topic>Tomography</topic><toplevel>online_resources</toplevel><creatorcontrib>Yusuf, A.</creatorcontrib><creatorcontrib>Widada, W.</creatorcontrib><creatorcontrib>Warsito, W.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yusuf, A.</au><au>Widada, W.</au><au>Warsito, W.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Development of the data acquisition system for the 32-channel electrical capacitance volume tomography</atitle><btitle>TENCON 2011 - 2011 IEEE Region 10 Conference</btitle><stitle>TENCON</stitle><date>2011-11</date><risdate>2011</risdate><spage>326</spage><epage>329</epage><pages>326-329</pages><issn>2159-3442</issn><eissn>2159-3450</eissn><isbn>9781457702563</isbn><isbn>1457702568</isbn><eisbn>9781457702556</eisbn><eisbn>145770255X</eisbn><eisbn>9781457702549</eisbn><eisbn>1457702541</eisbn><abstract>Electrical Capacitance Volume Tomography (ECVT) is one of three-dimensional image visualization method using capacitance effect. This paper describes a data acquisition system for 32-channel electrical capacitance volume tomography based on CMOS switch technology and charge-discharge system. Test results show the data acquisition system capable to measure of a novel capacitance with 0.21 fF to 0.42 fF resolution. Data rates of this system are four frames per second for 32 channels.</abstract><pub>IEEE</pub><doi>10.1109/TENCON.2011.6129118</doi><tpages>4</tpages></addata></record> |
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| subjects | Capacitance Capacitance measurement CMOS switch Data acquisition ECVT Electrodes Image reconstruction Multiplexing resolution Tomography |
| title | Development of the data acquisition system for the 32-channel electrical capacitance volume tomography |
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