Advantages and disadvantages of the free-space arch method used for investigation of shielding materials at low gigahertz frequencies

In this paper, we present detailed description, advantages and disadvantages of the well-known free-space measurement technique which uses illumination of a material under test (MUT) under different angles of incidence. This technique is considered with applying to shielding materials investigation...

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description In this paper, we present detailed description, advantages and disadvantages of the well-known free-space measurement technique which uses illumination of a material under test (MUT) under different angles of incidence. This technique is considered with applying to shielding materials investigation at 1-10 GHz. It has been shown how to extract own MUT's electrical and magnetic parameters (complex relative permittivity and complex relative permeability) from a set of reflection coefficients measured at different angles of incidence, frequencies and electromagnetic (EM) wave polarizations using numerical methods. Shielding effectiveness (SE) than can be calculated easily using these parameters. Also experimental results obtained for special metalized materials measured at 2-2.5 GHz have been presented and analyzed with the use of elaborated model.
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fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6078629</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6078629</ieee_id><sourcerecordid>6078629</sourcerecordid><originalsourceid>FETCH-LOGICAL-i105t-8ad993770d9a8aa96f0eb78af15b0a981d42d2d76c8f71d89798640a49b363363</originalsourceid><addsrcrecordid>eNpFjM1KAzEUhSMq2NY-gZu8wMDNZCY_y1L8g4IbXZfbyc1MpJ2pSVrRve_tlArCgQOH73wXbAq2roSolLSXbCqqWmuhwcorNillWRcga3XD5im9A4AAq6yECftZuCP2GVtKHHvHXUj4vwye5464j0RF2mNDHGPT8R3lbnD8kMhxP0Qe-iOlHFrMYehPp9QF2rrQt3yHmWLA7WjPfDt88nbEOor5-2T9OFDfBEq37NqPDM3_esbeHu5fl0_F6uXxeblYFUFAnQuDzlqpNTiLBtEqD7TRBr2oN4DWCFeVrnRaNcZr4YzV1qgKsLIbqeSYGbs7ewMRrfcx7DB-rRVoo0orfwHhpmAH</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Advantages and disadvantages of the free-space arch method used for investigation of shielding materials at low gigahertz frequencies</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Dvurechenskaya, N. ; Zielinski, R. J.</creator><creatorcontrib>Dvurechenskaya, N. ; Zielinski, R. J.</creatorcontrib><description>In this paper, we present detailed description, advantages and disadvantages of the well-known free-space measurement technique which uses illumination of a material under test (MUT) under different angles of incidence. This technique is considered with applying to shielding materials investigation at 1-10 GHz. It has been shown how to extract own MUT's electrical and magnetic parameters (complex relative permittivity and complex relative permeability) from a set of reflection coefficients measured at different angles of incidence, frequencies and electromagnetic (EM) wave polarizations using numerical methods. Shielding effectiveness (SE) than can be calculated easily using these parameters. Also experimental results obtained for special metalized materials measured at 2-2.5 GHz have been presented and analyzed with the use of elaborated model.</description><identifier>ISSN: 2325-0356</identifier><identifier>ISBN: 1457717093</identifier><identifier>ISBN: 9781457717093</identifier><identifier>EISBN: 0954114639</identifier><identifier>EISBN: 9780954114633</identifier><language>eng</language><publisher>IEEE</publisher><subject>Antenna measurements ; arch method ; complex permeability ; complex permittivity ; Electromagnetic compatibility ; fabrics ; free-space measurements ; Frequency measurement ; inhomogeneous material ; Materials ; metalized material ; nonwoven material ; Permittivity ; Permittivity measurement ; Reflection ; reflection coefficient ; shielding effectiveness (SE) ; shielding material</subject><ispartof>10th International Symposium on Electromagnetic Compatibility, 2011, p.790-795</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6078629$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6078629$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Dvurechenskaya, N.</creatorcontrib><creatorcontrib>Zielinski, R. J.</creatorcontrib><title>Advantages and disadvantages of the free-space arch method used for investigation of shielding materials at low gigahertz frequencies</title><title>10th International Symposium on Electromagnetic Compatibility</title><addtitle>EMCEurope</addtitle><description>In this paper, we present detailed description, advantages and disadvantages of the well-known free-space measurement technique which uses illumination of a material under test (MUT) under different angles of incidence. This technique is considered with applying to shielding materials investigation at 1-10 GHz. It has been shown how to extract own MUT's electrical and magnetic parameters (complex relative permittivity and complex relative permeability) from a set of reflection coefficients measured at different angles of incidence, frequencies and electromagnetic (EM) wave polarizations using numerical methods. Shielding effectiveness (SE) than can be calculated easily using these parameters. Also experimental results obtained for special metalized materials measured at 2-2.5 GHz have been presented and analyzed with the use of elaborated model.</description><subject>Antenna measurements</subject><subject>arch method</subject><subject>complex permeability</subject><subject>complex permittivity</subject><subject>Electromagnetic compatibility</subject><subject>fabrics</subject><subject>free-space measurements</subject><subject>Frequency measurement</subject><subject>inhomogeneous material</subject><subject>Materials</subject><subject>metalized material</subject><subject>nonwoven material</subject><subject>Permittivity</subject><subject>Permittivity measurement</subject><subject>Reflection</subject><subject>reflection coefficient</subject><subject>shielding effectiveness (SE)</subject><subject>shielding material</subject><issn>2325-0356</issn><isbn>1457717093</isbn><isbn>9781457717093</isbn><isbn>0954114639</isbn><isbn>9780954114633</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFjM1KAzEUhSMq2NY-gZu8wMDNZCY_y1L8g4IbXZfbyc1MpJ2pSVrRve_tlArCgQOH73wXbAq2roSolLSXbCqqWmuhwcorNillWRcga3XD5im9A4AAq6yECftZuCP2GVtKHHvHXUj4vwye5464j0RF2mNDHGPT8R3lbnD8kMhxP0Qe-iOlHFrMYehPp9QF2rrQt3yHmWLA7WjPfDt88nbEOor5-2T9OFDfBEq37NqPDM3_esbeHu5fl0_F6uXxeblYFUFAnQuDzlqpNTiLBtEqD7TRBr2oN4DWCFeVrnRaNcZr4YzV1qgKsLIbqeSYGbs7ewMRrfcx7DB-rRVoo0orfwHhpmAH</recordid><startdate>201109</startdate><enddate>201109</enddate><creator>Dvurechenskaya, N.</creator><creator>Zielinski, R. J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201109</creationdate><title>Advantages and disadvantages of the free-space arch method used for investigation of shielding materials at low gigahertz frequencies</title><author>Dvurechenskaya, N. ; Zielinski, R. J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i105t-8ad993770d9a8aa96f0eb78af15b0a981d42d2d76c8f71d89798640a49b363363</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Antenna measurements</topic><topic>arch method</topic><topic>complex permeability</topic><topic>complex permittivity</topic><topic>Electromagnetic compatibility</topic><topic>fabrics</topic><topic>free-space measurements</topic><topic>Frequency measurement</topic><topic>inhomogeneous material</topic><topic>Materials</topic><topic>metalized material</topic><topic>nonwoven material</topic><topic>Permittivity</topic><topic>Permittivity measurement</topic><topic>Reflection</topic><topic>reflection coefficient</topic><topic>shielding effectiveness (SE)</topic><topic>shielding material</topic><toplevel>online_resources</toplevel><creatorcontrib>Dvurechenskaya, N.</creatorcontrib><creatorcontrib>Zielinski, R. J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dvurechenskaya, N.</au><au>Zielinski, R. J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Advantages and disadvantages of the free-space arch method used for investigation of shielding materials at low gigahertz frequencies</atitle><btitle>10th International Symposium on Electromagnetic Compatibility</btitle><stitle>EMCEurope</stitle><date>2011-09</date><risdate>2011</risdate><spage>790</spage><epage>795</epage><pages>790-795</pages><issn>2325-0356</issn><isbn>1457717093</isbn><isbn>9781457717093</isbn><eisbn>0954114639</eisbn><eisbn>9780954114633</eisbn><abstract>In this paper, we present detailed description, advantages and disadvantages of the well-known free-space measurement technique which uses illumination of a material under test (MUT) under different angles of incidence. This technique is considered with applying to shielding materials investigation at 1-10 GHz. It has been shown how to extract own MUT's electrical and magnetic parameters (complex relative permittivity and complex relative permeability) from a set of reflection coefficients measured at different angles of incidence, frequencies and electromagnetic (EM) wave polarizations using numerical methods. Shielding effectiveness (SE) than can be calculated easily using these parameters. Also experimental results obtained for special metalized materials measured at 2-2.5 GHz have been presented and analyzed with the use of elaborated model.</abstract><pub>IEEE</pub><tpages>6</tpages></addata></record>
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subjects Antenna measurements
arch method
complex permeability
complex permittivity
Electromagnetic compatibility
fabrics
free-space measurements
Frequency measurement
inhomogeneous material
Materials
metalized material
nonwoven material
Permittivity
Permittivity measurement
Reflection
reflection coefficient
shielding effectiveness (SE)
shielding material
title Advantages and disadvantages of the free-space arch method used for investigation of shielding materials at low gigahertz frequencies
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T05%3A05%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Advantages%20and%20disadvantages%20of%20the%20free-space%20arch%20method%20used%20for%20investigation%20of%20shielding%20materials%20at%20low%20gigahertz%20frequencies&rft.btitle=10th%20International%20Symposium%20on%20Electromagnetic%20Compatibility&rft.au=Dvurechenskaya,%20N.&rft.date=2011-09&rft.spage=790&rft.epage=795&rft.pages=790-795&rft.issn=2325-0356&rft.isbn=1457717093&rft.isbn_list=9781457717093&rft_id=info:doi/&rft_dat=%3Cieee_6IE%3E6078629%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=0954114639&rft.eisbn_list=9780954114633&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6078629&rfr_iscdi=true