Highly Reliable and Low Power SSD Using Asymmetric Coding and Stripe Bitline-Pattern Elimination Programming

Highly reliable and low power solid-state drive (SSD) is proposed. Through the analysis based on measured error rate in the SSDs with NAND flash memories, the memory cell error shows the asymmetric characteristic in multilevel cell (MLC) NAND flash memories. The proposed asymmetric coding increases...

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Veröffentlicht in:	IEEE journal of solid-state circuits 2012-01, Vol.47 (1), p.85-96
Hauptverfasser:	Tanakamaru, S., Hung, C., Takeuchi, K.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Ash Circuit properties Computer architecture Design. Technologies. Operation analysis. Testing Digital circuits ECC Electric, optical and optoelectronic circuits Electronic circuits Electronics Encoding error correcting code Error correction codes Exact sciences and technology Integrated circuits Integrated circuits by function (including memories and processors) low-power coding Magnetic and optical mass memories Measurement uncertainty Microprocessors NAND controller NAND flash memory Reliability Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices solid-state drive SSD Storage and reproduction of information
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