A case study of process-variation effect to SoC analog circuits

Recent submicron process technology scaling leads the urgency to build an efficient methodology of characterizing and modeling the process variation effect, for example, the threshold voltage, V t . This is one of the key process parameters that must be extensively modeled and validated for accurate...

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Bibliographische Detailangaben

Hauptverfasser:	Latif, Mohd Azman Abdul, Ali, Noohul Basheer Zain, Hussin, Fawnizu Azmadi
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Aging Analog Analytical models Circuit Reliability diff-amp Integrated circuit reliability Negative Bias Temperature Instability (NBTI) Reliability engineering System-on-a-chip Threshold voltage
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